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technical guideline technical requirements standard technical framework vsc-hvdc transmission converter introduction analysis guideline voltage level ≤500kv tear test method sintered iron single gate plate
DL/T 2633-2023 in English

DL/T 2633-2023 in English

VALID

Technical guideline for DC capacitors of VSC-HVDC transmission converter

  • Issued on:2023-10-11
  • Implemented on:2024-04-11
  • File Format:PDF
  • Delivery:Via email within 5 business days
Price(USD): $300.00
$291.00


Introduction

Analysis of standard technical framework

This guideline proposes technical requirements for the entire life cycle of DC capacitors used in flexible DC converters. The core contents include:

Technical dimension IEC standard Differences in this guideline
Voltage level ≤500kV Extended to ±800kV
Test items Conventional electrical test Added 5 special tests including resonant frequency measurement
Environmental adaptability Standard industrial environment Specify parameter limits under abnormal use conditions

Detailed explanation of key test requirements

The capacitance and tanδ measurements specified in Clause 5.4 must be performed under the following conditions:

  • Test frequency: at least 3 frequency points in the range of 100Hz-1kHz
  • Temperature control: 25℃±2℃ constant temperature environment
  • Accuracy requirements: capacitance value error ≤±1%, tanδ≤0.002

Engineering application case

In a ±500kV flexible DC project, the capacitance and tanδ measurements specified in Clause 5.8 of this guideline were adopted. class=instrument>Impact discharge test method successfully detects the internal insulation defects of capacitor components and avoids breakdown accidents after operation.


Technology evolution background

As VSC-HVDC technology develops towards higher voltage levels, traditional AC capacitor technology cannot meet the following requirements:

  1. Dielectric polarization caused by DC components
  2. Harmonic heating effects caused by high-frequency switching
  3. New requirements for volume-to-power ratio in compact design

Implementation recommendations

Manufacturers are advised to focus on:

  • The destructive test process specified in Appendix C should be a mandatory option for R&D verification
  • The enclosure connection impedance required by Clause 7.2 should be ≤0.1mΩ
  • The environmental test items specified in Clause 5.13 should be checked regularly during operation and maintenance

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