GB/T 12636-1990 in English
VALIDStripline test method for complex permittivity of microwave dielectric substrates
- Issued on:1990-01-02
- Implemented on:1991-10-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$146.00
《GB/T 12636-1990微波介质基片复介电常数带状线测试方法》由339-1(工业和信息化部(电子))归口,主管部门为工业和信息化部(电子)。
本标准规定了微波介质基片复介电常数的带状线测试方法。本标准适用于测试各种基片(如塑料、复合材料、陶瓷、硅酸盐和其他单晶体材料等)在微波频率下的复介电常数。
Scope
This standard specifies the stripline test method for the complex dielectric constant of microwave dielectric substrates. This standard is suitable for testing the complex dielectric constant of various substrates (such as plastics, composite materials, ceramics, silicate and other single crystal materials, etc.) at microwave frequencies. Test frequency range: f=1~20GHz Test dielectric constant range: ε’=2~25 Test loss tangent range: tanδe=5×10-4~1×10-2

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