GB/T 13150-2005 in English
VALIDSemiconductor devices discrete devices blank detail specification for bi-directional triode thyristors (triacs), ambient and case-rated, for currents greater than 100A
- Issued on:2005-03-23
- Implemented on:2005-10-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$117.00
| Standard No: | GB/T 13150-2005 |
| Document status: | VALID |
| Title in English: | Semiconductor devices discrete devices blank detail specification for bi-directional triode thyristors (triacs), ambient and case-rated, for currents greater than 100A |
| Title in Chinese: | 半导体器件 分立器件 电流大于100A、环境和管壳额定的双向三级晶闸管空白详细规范 |
| Language: | English |
| File Format: | Electronic (PDF) |
| Delivery: | Via email within 1~3 business days |
| Issued on: | 2005-03-23 |
| Implemented on: | 2005-10-01 |
| Superseding: |
GB/T 13150-1991 Blank detail specification for bidirectional triode thyristors, ambient or case-rated, above 100A
|
| ICS Classification: | 31.080.20-Thyristors |
| Chinese Classification: | K46-Power semiconductor device and parts |
| Professional Classification: | GB-National Standard |
| Related Keywords: | blank detail specification
semiconductor devices detail specification semiconductor device components blank detail specifications |
| Related Topics: | GBT13150
GB/T 13150-1991 GB/T 13150-2005 |
《GB/T 13150-2005半导体器件 分立器件 电流大于 100A、环境和管壳额定的双向三极晶闸管空白详细规范》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）
Scope
The International Electrotechnical Commission Electronic Component Quality Assessment System (IECQ) follows the statutes of the International Electrotechnical Commission and works under the authorization of the International Electrotechnical Commission. The purpose of the assessment system is to define the quality assessment procedure in such a way that electronic components released by one Member State as complying with the requirements of the applicable norms are also acceptable in all other Member States without further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and should be used together with the following national standards. ——GB/T 4589.1-1989 General Specification for Semiconductor Device Components and Integrated Circuits ——GB/T 12560-1999 Sub-Specification for Semiconductor Device Components
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