GB/T 35445-2017 in English
VALIDSilk―Electronic test method for defects and evenness of raw silk
- Issued on:2017-12-29
- Implemented on:2018-07-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
Price(USD):
$250.00
$243.00
$243.00
《GB/T 35445-2017丝 生丝疵点、条干电子检测试验方法》由TC401(全国丝绸标准化技术委员会)归口,主管部门为中国纺织工业联合会。
Introduction
This standard outlines the procedures for testing defects and unevenness in raw silk using electronic testing methods. It provides detailed guidelines on the equipment required, the testing process, and the evaluation criteria. The standard ensures consistency in the measurement and analysis of silk quality by establishing standardized operational protocols. It covers the preparation of samples, the calibration of testing instruments, and the interpretation of test results. The methodology described is designed to enhance the accuracy and reliability of defect detection in silk fibers. The standard also specifies the conditions under which tests should be conducted to ensure reproducibility and comparability of results across different testing facilities.
*** Please note: This description may not be accurate, please refer to the official documentation.
Sample only — not a preview of GB/T 35445-2017

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