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Database: 365,228(8 Aug 2026)
long-term luminous flux maintenance rate radiant flux maintenance projection introductioncore test standards packages long-term led package products continuous test points fixed assets prestressed high strength concrete pipe magnetic card door locks
GB/T 41423-2022 in English

GB/T 41423-2022 in English

VALID

LED packages—Long-term luminous and radiant flux maintenance projection

  • Issued on:2022-04-15
  • Implemented on:2022-11-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $160.00
$156.00
Standard No: GB/T 41423-2022
Document status: VALID
Title in English: LED packages—Long-term luminous and radiant flux maintenance projection
Title in Chinese: LED封装 长期光通量和辐射通量维持率的推算
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2022-04-15
Implemented on: 2022-11-01
ICS Classification: 29.140.99-Other standards related to lamps
Professional Classification: GB-National Standard
Related Keywords: long-term luminous flux maintenance rate
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《GB/T 41423-2022LED封装 长期光通量和辐射通量维持率的推算》由TC224(全国照明电器标准化技术委员会)归口,TC224SC1(全国照明电器标准化技术委员会电光源及其附件分会)执行,主管部门为中国轻工业联合会。


Introduction

Core test standards and technical specifications


This standard refers to the ANSI/IEC standard system and establishes a complete test framework for the long-term luminous flux maintenance rate of LED package products:

The test equipment must meet the LM-80 accuracy requirements for integrating spheres, constant current sources and temperature control systems

Measurement parametersIES LM-80 specificationThis standard adds requirements
Test intervalRecommended not to exceed 1000hMandatory ≤1000h
Baseline durationMinimum 6000hRecommended 8000h+

Choice and application of degradation model

Provide two degradation model evaluation paths:

  • Exponential fitting function (EFF): Applicable to conventional degradation mode, requiring α>0
  • Boundary function (BF): Enabled when fitting occurs when α≤0
Model characteristicsEFFBF
Applicable scenariosNormal decay rateAbnormal decay curve
Data requirements>6000h data3 continuous test points support

Temperature interpolation accuracy control

Acceleration mechanism based on Arrhenius equation

When using a thermal resistance tester to obtain the shell temperature, the activation energy needs to be in the effective range of 0.1eV~1.0eV, and the recommended formula is:
ΔT = (ΔEa)/(k·ln(t1/t2))

Note: This model should be disabled when temperature rise causes a change in the decay mode

Key points for interpreting the research report

  1. Package identification information must include the device substrate material
  2. Failure type code must be recorded for abnormal samples
  3. Correction factor must be indicated for median life calculation

Sample only — not a preview of GB/T 41423-2022
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