GB/T 4930-2008 in English

SUPERSEDED

Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)

Issued on:2008-04-11
Implemented on:2008-10-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $180.00
$175.00

Standard No:	GB/T 4930-2008
Document status:	SUPERSEDED
Superseded by:	GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
Superseded on:	2021-12-01
Title in English:	Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
Title in Chinese:	微束分析电子探针分析标准样品技术条件导则
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2008-04-11
Implemented on:	2008-10-01
Superseding:	GB/T 4930-1993 General specification of electron probe microanalysis STANDARD specimen
ICS Classification:	71.040.30-Chemical reagents
Chinese Classification:	N53-Electrochemical, thermochemistry and optical profile type analyzer
Professional Classification:	GB-National Standard
Related Keywords:	electron probe analysis electron probe microanalysis microbeam analysis microscopic analysis certified reference materials
Related Topics:	analysis Electroanalysis Electron probe multiple analysis techniques Electron Probe Standard Samples Electron Probe Standard Samples Standard analysis electron probe microbeam Electron probe Technical Test Analysis Electroanalysis Microanalysis bundle microprobe technology microbeam analysis Electron Probe Analysis Analysis of technical standards Electron Probe Technical Parameters Analysis of technical components Electron Probe Analysis sample technology semi-microanalysis Polymer analysis polymer analysis and Sample Composition Analysis Standard sample analysis Analytical Sample Requirements Sample preparation for electron probe analysis Polymer analysis Electron probe sample standard sample technique Electron Probe Sample Preparation Electron Probe Sample Preparation Electron Probe Sample Preparation Electron Probe Sample Preparation Electron Probe Sample Preparation Sample Preparation for Electron Probe Instruments Electron Probe Sample Preparation Electron Probe Analyzer Sample Preparation Electron Probe Sample Preparation dual beam analysis Electron Probe Sample Preparation Analytical standard General technical conditions for electronic probe analysis standard samples Analytical standard Probe Sampling System conductivity of the sample sampling probe sampling probe Electron probe preparation sample Reanalysis of analyzed samples Collimation needle Chromatography samples Sample condition Sample Composition Analysis gb analysis Sample Technology Microwave sample preparation probe Air ten analysis conditional analysis Probe sample Electron Spectroscopy and Electron Probes strip analysis software gb analysis Electron probe sample preparation atomic standard sample Analysis of technical indicators many technical analysis sexual condition analysis Analysis+ Sample Analysis Conditions electronic analysis Analytical probe conditional analysis Analytical sample preparation technology Analytical Sample Requirements Analyzing Sample Components Microbeam Analysis Standard Samples Sample condition Electron probe sample Sample Analysis Technique Sample reanalysis and reanalysis Condition not analyzed cluster probe Microanalysis software photoelectron, ray, analysis, sample What do electron probes analyze Electron Probe Probe Preparation Microbeam analysis standard material Electron Probe Sample Gold Sample analysis by electron spectroscopy Electron Probe Probe Preparation Sample preparation for polymer analysis conditional analysis microbeam Sample during analysis coating-like probe Sample preparation for electron probes Sample Analysis Technique Standard gas sample analysis Standard Technical Analysis Electron Probe Spectroscopy Electron probe sample preparation Analytical sample preparation Fluorescence analysis technique Differential Hot Pressure Analysis Probe products analysis- Technical Test Analysis Technical Analysis and Fundamental Analysis Food Technology Analysis microprobe Analyze Probe Parameters Benchmarking Probe analysis Water ten analysis probe sample rod During sample analysis During sample analysis Analytical Conditions for Kelvin Probes Standard sample analysis / analysis Probe Sample Booklet Technical parameters of electronic probe Techniques for Analyzing Secondary Electrons differential analysis technique Sample reanalysis and reanalysis GBT4930 GB/T 4930-1993 GB/T 4930-2008 GB/T 4930-2021 Specifications for electronic standard watt-hour meters Sample requirements for electronic probes Electron probe sample discharge Electron probe sample preparation requirements Petroleum Technical Standard Analysis Shelf life of conductivity standard samples Standard sample analysis accuracy Particle size analysis standard sample Progress in standardization of microbeam analysis Microbeam analysis technology standardization Technical Standard Analysis Analytical Methods of Electronic Tongue Technology standard group analysis techniques Standard Specification for Conditions of Use of Analytical Balances

《GB/T 4930-2008微束分析电子探针分析标准样品技术条件导则》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准化管理委员会。
本标准给出了用于电子探针分析的单相标样，并规定了标样仅应用在平整抛光表面的显微分析中。本标准不包括有机物和生物标样。本标准等同采用ＩＳＯ１４５９５：２００３《微束分析　电子探针分析　标准样品技术条件导则》（英文版）。本标准代替ＧＢ／Ｔ４９３０―１９９３《电子探针分析标准样品通用技术条件》，因为国际上的发展原标准在技术上已不适用。
本标准对ＧＢ／Ｔ４９３０―１９９３进行了全面修改：
―――标题：将ＧＢ／Ｔ４９３０―１９９３原标题“电子探针分析标准样品通用技术条件”改为“微束分析电子探针分析　标准样品技术条件导则”；
―――所有技术条文的项目、内容、结构顺序都作了变动，运用的技术方法更先进，更合理；
―――标样材料不均匀性检测及其数据统计处理改用美国国家标准技术研究院（ＮＩＳＴ）和英国国家物理实验室（ＮＰＬ）共同研制的检测和统计方法；
―――将标样分级的概念引入本标准，使制作和应用标样的领域扩大，更合理，更全面。

Scope

This standard gives a single-phase standard sample for electron probe analysis, and specifies that the standard sample should only be used in microscopic analysis of flat and polished surfaces. This standard does not include organic matter and biological standards.

More samples: QC/T 942-2021 GB 50021-2001(2009) NB/T 47013.2-2015

Sample only — not a preview of GB/T 4930-2008

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