SJ/T 11211-1999 in English
VALIDMeasurement of quartz crystal unit parameters Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
- Issued on:1999-08-26
- Implemented on:1999-12-01
- File Format:PDF
- Delivery:Via email within 5 business days
$621.00
| Standard No: | SJ/T 11211-1999 |
| Document status: | VALID |
| Title in English: | Measurement of quartz crystal unit parameters Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| Title in Chinese: | 石英晶体元件参数的测量 第5部分:采用自动网络分析技术和误差校正确定等效电参数的方法 |
| Language: | English |
| File Format: | Electronic (PDF) |
| Delivery: | Via email within 5 business days |
| Issued on: | 1999-08-26 |
| Implemented on: | 1999-12-01 |
| Chinese Classification: | L21-Quartz crystal and piezoelectric element |
| Professional Classification: | SJ-Electronics |
| Related Keywords: | quartz crystal unit parameters
equivalent electrical parameters quartz crystal resonators electrical parameters automatic network analyzer techniques |
| Related Topics: | extrinsic parameter correction
Calibration parameters Correction + error + sj/t11209-1999 Automatic integration parameters sj t 11213-1999 sj1999 AXIO vert 5 technical parameters Analysis of applied experimental errors in conductivity measurement |
本标准规定了采用线性等效电路确定石英晶体谐振器的最佳表达方法。该表达方法以采用自动误差校正的矢量网络分析测量的电参数为基础。本标准确定等效电参数的方法以测量串联谐附近的器件导抗为基础。本标准未直接涉及表征与一个串联的负载电容共同工作的器件参数这一进一步的问题,尽管我们承认某些应用要求这种参数。同样的测量仪器和基本相同的测量类型的为完整表征测试负载电容夹具以及负载电容夹具和晶体元件的串联组合的参数提供了手段。
Scope
This standard specifies the best expression method for determining quartz crystal resonators using linear equivalent circuits. This representation is based on electrical parameters measured by a vector network analyzer with automatic error correction. The method for determining equivalent electrical parameters in this standard is based on measuring the device impedance near series resonance. This standard does not directly address the further issue of characterizing the parameters of a device operating with a series load capacitance. Although we acknowledge that some applications require this parameter. The same measuring instrument and essentially the same type of measurement provide the means for complete characterization of the parameters of the test load capacitance fixture and the series combination of the load capacitance fixture and the crystal element.

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