SN/T 2004.4-2006 in English

VALID

Determination of Lead|| Cadmium|| Chromiun and Mercury in electrical and electronic equipment. Part 4: Inductively coupled plasma atomic emission spectrometric method

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Standard No:	SN/T 2004.4-2006
Document status:	VALID
Title in English:	Determination of Lead\|\| Cadmium\|\| Chromiun and Mercury in electrical and electronic equipment. Part 4: Inductively coupled plasma atomic emission spectrometric method
Title in Chinese:	电子电气产品中铅、镉、铬、汞的测定第4部分：电感耦合等离子体原子发射光谱法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Professional Classification:	SN-Import&Export Inspection
Related Keywords:	plasma atomic emission plasma atomic emission spectrometry electronic equipment lead\|\| cadmium\|\| chromiun electronic components
Related Topics:	inductive coupling atomic emission atomic emission spectrometry sn/t 1748-2006 inductive coupling thermal emission electrons sn/t1852-2006 Inductively Coupled Plasma sn/t1829-2006 sn/t 2004.4-2006 Atomic Gasizer sn/t 1720-2006 sn/t 1808-2006 sn/t 1696-2006 sn/t1748-2006 Atomic gas mercury SN/T 1851-2006 plasma in english thermal emission electron field emission electron Determination of Specified Substances in Electrical and Electronic Products - Part 8 sn 2004.4-2006 Atomic Volume of Lead and Cadmium sn/t2001.1-2006 plasma atom Inductively Coupled Plasma Atomic Emission Detection Coupled inductor Inductive coupling+ lead ore inductively coupled plasma Plasma Primary Emission Spectrometry Inductive coupling standard Atomic Emission Spectroscopy and Inductively Coupled Plasma Emission Spectroscopy Lead and cadmium separation Inductively coupled plasma atomic emission spectrometry for the determination of sn/t2004.4 Inductively Coupled Plasma-Atomic Emission Spectrometry Chromium ion in water plasma atomic emission spectrometry How many electron volts are energetic electrons in the plasma Title 7 Atomic Emissions Chromium ion spectrum Generating Atomic Emission Spectra bulk atomic emission spectrometry Cadmium single atom Coupled inductor bulk atom atom+body Inductively Coupled Plasma Atomic Emission Spectroscopy Operation sn/t1784-2006 gas atom atom gas Mercury Emission Spectroscopy Cold Atom Inductive coupling, etc. Electrophoretic separation of cadmium coupled plasma Cadmium ion detection Atoms emit light Cadmium ion detection Atomic PbHg Electronics Electronics Cadmium ion spectrophotometer method Inductively Coupled Plasma-Atomic Emission Spectrometry Inductively Coupled Plasma Atoms Emit Light Cadmium ion spectrophotometry gas atom atom gas How Atomic Emission Spectroscopy is Produced Inductively Coupled Plasma Atoms sn/t2004.7-2006 Cadmium ion detection method Atomic Spectroscopy Products Cadmium ion detection spectral chromium ion Cadmium ion analyzer electrons in x-ray atoms Inductively Coupled Plasma-Atomic Emission Spectrometry Gas Atomic Spectroscopy Argon plasma spectroscopy Cadmium Email Cadmium ion analyzer sn/t2003.5-2006 "Atomic Emission Spectroscopy" lead cadmium chromium multiphoton ionization Inductively Coupled Plasma Mass Spectrometry for Lead in Water mercury ion method Inductively Coupled Plasma Lead Alloy Ferromanganese Inductively Coupled Plasma Atomic Emission Spectroscopy sn t 1748-2006 lead atom electron Plasma - Atoms emit light plasma atomic light Plasma electronics atomic emission? Cadmium ion spectrophotometry Inductively Coupled Plasma Atomic Emission Lead in electrical and electronic products Mercury emission spectrum Electronic and electrical products Electrical and Electronic Products (EMC) SN/T 1763.1-2006 Model ICAP-6300 Coupled Plasma Atom How to produce an emission spectrum from a molecule Centrifugal force test of electronic products sn/t 1798-2006 sn/t 1743-2006

Scope

This part specifies the inductively coupled plasma atomic emission spectrometry (ICP-AES) determination of lead (Pb), cadmium (Cd), chromium ( Cr) and mercury (Hg) methods. This section applies to the determination of lead (Pb), cadmium (Cd), chromium (Cr) and mercury (Hg) in polymers (except polytetrafluoroethylene), metal materials, and electronic components in electronic and electrical products. The limits are shown in Table 1.

More samples: DL/T 368-2010 JGJ 94-2008 JC/T 2453-2018

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