YD/T 702-2018 in English

VALID

Test methods of PIN-FET optical receive assembly

Issued on:2018-12-21
Implemented on:2019-04-01
File Format:PDF
Delivery:Via email within 5 business days

Price(USD)： $310.00
$301.00

Standard No:	YD/T 702-2018
Document status:	VALID
Title in English:	Test methods of PIN-FET optical receive assembly
Title in Chinese:	PIN-FET光接收组件测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	2018-12-21
Implemented on:	2019-04-01
Superseding:	YD/T 702-1993 Test Method for Optical Receiver Units
Professional Classification:	YD-Telecommunication
Related Keywords:	optical receive assembly introductionthis standard optical receiving components test methods data analysis methods optical
Related Topics:	Component acceptance iec fetch between-group test within-group pin fetch FET circuit yd/t3436.2-2018 component library method Photovoltaic module ground resistance test method yd/t 5184-2018 gb/t 702-2018

本标准规定了PIN-FET光接收组件的术语和定义、测试方法和可靠性试验。
本标准适用于PIN-FET组件光电参数的测试。

Introduction

This standard provides a detailed methodology for the testing of PIN-FET optical receiving components. It outlines the procedures, equipment requirements, and performance criteria necessary to ensure consistent and reliable evaluation of these components. The document specifies the conditions under which tests should be conducted, including environmental factors and operational parameters. It also defines the measurement techniques and data analysis methods to be used during the testing process. The standard aims to establish a uniform approach for assessing the characteristics and functionality of PIN-FET optical receiving components, facilitating quality control and product development within the industry.

*** Please note: This description may not be accurate, please refer to the official documentation.

More samples: GB 50021-2001(2009) NB/T 47013.2-2015 GB 18306-2015

Sample only — not a preview of YD/T 702-2018

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