Transmission electron microscopy method

Transmission electron microscopy method, Total:56 items.

The international standard classification for "Transmission electron microscopy method" includes: Physicochemical methods of analysis , Laboratory medicine , Other standards related to analytical chemistry , Optical equipment , Chemical analysis , Textiles in general , Tobacco, tobacco products and related equipment .

The Chinese standard classification for "Transmission electron microscopy method" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Medical optical instrument and endoscope , Magnifier and microscope , Basic standards and general methods , Tobacco curing in general .

Professional Standard - Education

JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 011-1996 General rules for transmission electron microscopy

Professional Standard - Machinery

JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
T/HZQT 0004-2024 Test method for identification of textile fiber-Paraffin liquid/nitric acid-Microscopic observation method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope(TEM)

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

Shanghai Provincial Standard of the People's Republic of China

DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy

Professional Standard - Commodity Inspection

SN/T 2731-2010 Identification of asbestos in nonmetal minerals—X-radial diffraction instrument-microscope observation method

Professional Standard - Textile

FZ/T 01057.3-1999 Test method for identification of textile fibres -- Microscopy

工业和信息化部

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope
GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy

国家烟草专卖局

YC/T 409-2018 Determination of special-purpose fibers in cigarette paper-Microscopy analysis method

International Organization for Standardization (ISO)

ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

British Standards Institution (BSI)

24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance

GSO

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope

Military Standards (MIL-STD)

DOD A-A-54386-1991 MICROSCOPE, OPTICAL (BINOCULAR, BRIGHTFIELD)

SE-SIS

SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

Korean Agency for Technology and Standards (KATS)

KS D 0205-2002 Steel－Micrographic determination of the ferritic or austenitic grain size
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D 8544-2021 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method

BE-NBN

NBN G 51-001-1990 Textiles - Evaluation of maturity of cotton fibres - Microscopic method

Japanese Industrial Standards Committee (JISC)

JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method

KR-KS

KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

American Society for Testing and Materials (ASTM)

ASTM D7658-17 Standard Test Method for Direct Microscopy of Fungal Structures from Tape

Others: Method for sample preparation of fine ceramics and ceramic powders for scanning electron microscopy,General Principles of Transmission Electron Microscopy,High-resolution transmission electron microscopy detection method for the basic structure of one-dimensional nanomaterials,General Rules for Sample Preparation Methods for Transmission Electron Microscopy,Calibration method for transmission electron microscope magnification,Transmission Electron Microscopy Test Method,Transmission Electron Microscopy Sample Preparation Method