Specific surface analyzer calibration

Specific surface analyzer calibration, Total:160 items.

The international standard classification for "Specific surface analyzer calibration" includes: Optics and optical measurements , Electricity. Magnetism. Electrical and magnetic measurements , Linear and angular measurements , Chemical analysis , Reactor engineering , Radiation protection , Workplace atmospheres , Laboratory medicine .

The Chinese standard classification for "Specific surface analyzer calibration" includes: Length Measurement , Chemical Measurement , Optical Measurement , Radio Measurement , Acoustic Measurement , Basic standards and general methods , Radiation protection instrument , Production environment safety and health facilities , Medical laboratory equipment .

Professional Standard - Chemical Industry

HG/T 6138-2023 Specific surface area and pore size analyzer

Group Standards of the People's Republic of China

T/CSTM 00900-2023 Calibration specification for food heavy metal analyzer
T/ZSA 110-2022 Specific surface area and pore size analyzer
T/HBJLXH 009-2023 Surface Vibration Compactor Calibration Method

未注明发布机构

DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

National Metrological Technical Specifications of the People's Republic of China

JJF 1142-2006 Calibration Specification for Building Acoustic
JJF(建材) 162-2019 Calibration specification for glass surface stress detector
JJF 2069-2023 Calibration Specification for Thermomechanical Analyzers
JJF 1817-2020 Calibration Specification for Nucleic Acids Analyzers
JJF 1321-2011 Calibration Specification for Elemental Analyzers
JJF 2040-2023 Calibration Specification for Power Analyzers
JJF 1105-2003 Calibration Specification for Contact (Stylus) Instruments of Surface Roughness Measurement by the Profile Method
JJF 1820-2020 Calibration Specification for Milk Quantitative Composition Anelyzers
JJF 1237-2017 Calibration Specification for SDH/PDH Transmission Analyzers
JJF 1383-2012 Calibration Specification for Portable Blood Clucose Meters
JJF 1099-2003 Calibration Specification of Roughness Comparison Specimens
JJF 1936-2021 Calibration Specification for UV Analyzers
JJF 1988-2022 Calibration Specification for Communication Signal Analyzers
JJF 1460-2014 Calibration specification for noise coefficient tester
JJF 2036-2023 Calibration Specification for Dry Biochemistry Analyzers
JJF 1078-2002 Calibration Specificaiton for Optical Comparators for Angle Measurement
JJF(机械) 046-2009 Calibration specification for magnetic analyzer
JJF 1495-2014 Calibration Specification for Vector Network Analyzers
JJF 1913-2021 Calibration Specification for Laser Interferometric Comparators
JJF 1821-2020 Calibrat ion Specification of Temperature Calibration Devices for Polymerase Chain Reaction Analyzers
JJF 1304-2011 Calibration Specification for Gauge Block Comparators
JJF 1128-2004 Calibration Specification for Vector Signal Analyzers
JJF 1720-2018 Calibration Specification for Automatic Chemistry Analyzers
JJF 1526-2015 Calibration Specification for Petroleum Products Colorimeters ＆ Filters
JJF 2078-2023 Calibration Specification for Real-time Spectrum Analyzers
JJF 1099-2018 Calibration Specification for Roughness Comparison Specimens
JJF 1710-2018 Calibration Specification for Frequency Response Analyzers
JJF 1211-2008 Calibration Specification for Static Light Scattering Particle Size Analyzers
JJF 2054-2023 Calibration Specification for Multifunctional Blood Gas Analyzers
JJF 1494-2014 Calibration Specification for Network Cable Analyzers
JJF 1529-2015 Calibration Specification for Bacterial Endotoxin Analyzers
JJF 1567-2016 Calibration Specification for Phosphate Analyzers
JJF 1945-2021 Calibration Specification for Blood Coagulation Analyzers
JJF 1838-2020 Calibration Specification for The Genetic Analyzers
JJF 1129-2005 Calibration Specification of Urine Analyzers
JJF 1285-2011 Calibration Specification for Surface Resistance Tester
JJF 1237-2010 Calibration Specification for SDH/PDH Transmission Analyzer
JJF 1559-2016 Calibration Specification of Variable Frequency Electric Quantity Analyzer
JJF 1395-2013 Calibration Specification for Audio Analyzer
JJF(纺织)065-2013 Calibration Specification for Fiber Diameter Analyzer
JJF 1123-2004 Calibration Specification for Base circle pitch comparator
JJF 1472-2014 Calibration Specification for Process Calibrators
JJF(建材) 161-2019 Calibration specification for negative pressure sieve analyzer
JJF 1396-2013 Calibration Specification for Spectrum Analyzer
JJF(纺织)097-2021 Calibration Specification for Fiber Specific Resistance Meters
JJF 1205-2008 Calibration Specification for Harmonious and Flicker Analysis System
JJF 1288-2011 Calibration Specification for Multi-Channels Sound Analyzers
JJF 1326-2011 Calibration Specification for Mass Comparators
JJF 2116-2024 Calibration Specification for Specific Protein Analyzers
JJF 1845-2020 Calibration Specification for Discontinuous Interference Analyzers
JJF 1860-2020 Calibration Specification for Defibrillator Analyzers
JJF 1105-2018 Calibration Specification for Contact(Stylus)Instruments of Surface Roughness Measurement by Profile Method
JJF 1539-2015 Calibration Specification for Silicate Analyzers
JJF 2057-2023 Calibration Specification for C-reactive Protein Analyzers
JJF(纺织) 065-2013 Calibration Specification for Fiber Diameter Analyzer
JJF(电子) 30701-2006 Specification for calibration of SDH digit transmission analyzer
JJF(纺织) 097-2021 Calibration Specification for Fiber Specific Resistance Meters

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
GB/T 8997-1988 Calibration for alpha,beta surface contamination meters and monitors
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 8997-2008 Calibration for alpha beta and alpha/beta surface contamination meters and monitors

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 37397-2019 Ozone calibrators and analyzers
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

Military Standard of the People's Republic of China-General Armament Department

GJB 8082-2013 Calibration regulation for defibrillator analyzers

Professional Standard - Medicine

YY/T 1549-2024 Calibrator for biochemical analyzer
YY/T 0701-2008 Calibrator for hematology analyzer

国家药监局

YY/T 0701-2021 Calibrator for hematology analyzer

Hebei Provincial Standard of the People's Republic of China

DB13/T 5865-2023 Wafer surface particle size inspection instrument calibration method

Professional Standard - Petroleum

SY 6809-2010 Calibration Methods for Rock Carbonate Analyzers
SY/T 6809-2010 Calibration Method for Carbonate Analyser of Rock

Association Francaise de Normalisation

NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-845:2006 Calibration of optical spectrum analyzers.
NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis

International Organization for Standardization (ISO)

ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

GSO

OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
BH GSO IEC 62089:2016 Nuclear instrumentation - Calibration and usage of alpha/beta gas proportional counters
GSO IEC 62089:2014 Nuclear instrumentation - Calibration and usage of alpha/beta gas proportional counters
OS GSO IEC 62089:2014 Nuclear instrumentation - Calibration and usage of alpha/beta gas proportional counters
BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales

Korean Agency for Technology and Standards (KATS)

KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS A 4039-1982 Scintillation the calibration of surface contamination monitors
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 17974-2021 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 17974-2011(2016) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS I 2219-2020 General rules for calibration method of gas analyzer
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS I 2219-2015 General rules for calibration method of gas analyzer

European Committee for Standardization (CEN)

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers

KR-KS

KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale

SCC

BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
CEI EN 62129:2006 Calibration of optical spectrum analyzers
BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
DIN IEC 62089:2003 Nuclear instrumentation - Calibration and usage of alpha/beta gas proportional counters (IEC 62089:2001)

British Standards Institution (BSI)

BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 3567:2011 Vacuum gauges. Calibration by direct comparison with a reference gauge
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers

Danish Standards Foundation

DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers

Japanese Industrial Standards Committee (JISC)

JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis

BSI

BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

Standard Association of Australia （SAA）

ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 5861:2024 Surface chemical analysis - X-ray photoelectron spectroscopy - Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

German Institute for Standardization

DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

International Electrotechnical Commission (IEC)

IEC 62129:2006 Calibration of optical spectrum analyzers

Defense Logistics Agency

DLA A-A-50767-1983 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 3-2006 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 2-2001 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 1-1995 ANALYZER, SURFACE FINISH

American Society for Testing and Materials (ASTM)

ASTM D7013/D7013M-15 Standard Guide for Calibration Facility Setup for Nuclear Surface Gauges
ASTM D4178-82(2012) Standard Practice for Calibrating Moisture Analyzers
ASTM D4178-82(2017) Standard Practice for Calibrating Moisture Analyzers
ASTM D8537-23 Standard Guide for Analysis of Calibration Data for Nuclear Instruments
ASTM D4178-23 Standard Practice for Calibrating Moisture Analyzers
ASTM E1582-93 Standard Practice for Calibration of Temperature Scale for Thermogravimetry

European Committee for Electrotechnical Standardization（CENELEC）

EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)

Lithuanian Standards Office

LST EN 62129-2006/AC-2007 Calibration of optical spectrum analyzers (IEC 62129:2006)
LST EN 62129-2006 Calibration of optical spectrum analyzers (IEC 62129:2006)

US-FCR

FCR COE RPMAS 46880-1978 CALIBRATION OF FLUE STACK ANALYZERS MARCH 1978

CZ-CSN

CSN 99 4179-1990 Grain testers. Methods of verification and calibrating

IEC - International Electrotechnical Commission

PAS 62129-2004 Calibration of optical spectrum analyzers (Edition 1.0;: 2006)