time-of-flight mass spectrometer ion trap mass spectrometry
time-of-flight mass spectrometer ion trap mass spectrometry, Total:22 items.
The international standard classification for "time-of-flight mass spectrometer ion trap mass spectrometry" includes: Chemical analysis , Chemical reagents , Laboratory medicine .
The Chinese standard classification for "time-of-flight mass spectrometer ion trap mass spectrometry" includes: Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Medical laboratory equipment .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- GB/T 37849-2019 Method of performance testing for liquid chromatography tandem time of flight mass spectrometry
国家药监局
- YY/T 1740.2-2021 Clinical mass spectrometer—Part 2:Matrix-assisted laser desorption ionization-time of flight mass spectrometer
National Metrological Technical Specifications of the People's Republic of China
- JJF 1528-2015 Calibration Specification for Time-of-Flight Mass Spectrometers
International Organization for Standardization (ISO)
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
GSO
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
British Standards Institution (BSI)
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
- 20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
SCC
- 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
American Society for Testing and Materials (ASTM)
- ASTM E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy
Japanese Industrial Standards Committee (JISC)
- JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
- JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ion trap mass spectrometry,ion trap MS,ion trap mass spectrometry mass spectrometry,Ion trap mass spectrometry + ion,Linear Ion Trap Mass Spectrometry,Ion Trap Mass Spec+,Linear Ion Trap Mass Spectrometry,Ion trap mass spectrometry (,ion trap mass spectrometry,Ion trap mass spec + peak,miniature ion trap mass spectrometry,ion trap MS,mass spec ion trap,Ion trap mass spectrometer,Mass Spec + Ion Trap,Ion Trap and Mass Spectrometry,ion trap in mass spectrometer,mass spec ion trap,single ion trap mass spectrometry
