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flip oscillation

flip oscillation, Total:152 items.

The international standard classification for "flip oscillation" includes: Equipment for processing of minerals , Machines and equipment for leather and fur production , Environmental testing , Construction equipment .

The Chinese standard classification for "flip oscillation" includes: Medical laboratory equipment , Leather processing machinery , Basic laboratory equipment , Office supplies and office implements , Technical management , Technical management , Electromagnetic Measurement , Architectural engineering construction machinery .


Professional Standard - Energy

Taiwan Provincial Standard of the People's Republic of China

  • CNS 12254-1988 Quartz Crystal Units for Oscillators (for 200-1000 kHz)
  • CNS 12253-1988 Quartz Crystal Units For Oscillators (For 1 MHz -- 125 MHz)

Professional Standard - Nuclear Industry

Professional Standard - Electricity

  • DL/T 2606-2023 Test method for oscillation characteristics of direct current transfer switches on site

Professional Standard - Medicine

Group Standards of the People's Republic of China

Professional Standard - Light Industry

Military Standard of the People's Republic of China-General Armament Department

  • GJB 3160-1998 General specifications for gyromagnetic oscillators
  • GJB 3480-1998 Low-speed wind tunnel test method for aircraft model rotation and oscillation motion
  • GJB 3480A-2021 Low-speed wind tunnel test method for aircraft model rotation and oscillation motion
  • GJB 1648-1993 General specifications for crystal oscillators
  • GJB 1648-2-2011 Genenral specification for crystal oscillators
  • GJB 1648A-2011 Genenral specification for crystal oscillators

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 32710.13-2016 Safety requirements for environmental testing and conditioning equipment-Part 13:Shakers,shaking water baths and shaking incubators

Professional Standard - Education

Professional Standard - Electron

  • SJ/Z 9155.2-1987 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • SJ/T 10104-1991 Level oscillators for Type YX5071
  • SJ 2942-1988 Methods of measurement for level oscillators
  • SJ 1852-1981 Terms for quartz crystal controlled oscillators

工业和信息化部

工业和信息化部/国家能源局

未注明发布机构

  • DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
  • DIN EN ISO 3219-2:2021E Rheology Part 2: General principles of rotational and oscillatory rheometry

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Post and Telecommunication

Professional Standard - Construction Industry

Xinjiang Provincial Standard of the People's Republic of China

National Metrological Technical Specifications of the People's Republic of China

German Institute for Standardization

  • DIN EN ISO 1797:2017-09 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017); German version EN ISO 1797:2017
  • DIN 4235-1:1978 Compacting of Concrete by Vibrating; Vibrators and Vibration Mechanics
  • DIN 4235-5:1978 Compacting of Concrete by Vibrating; Compacting by Surface Vibrators
  • DIN EN ISO 3219-2:2021-08 Rheology - Part 2: General principles of rotational and oscillatory rheometry (ISO 3219-2:2021); German version EN ISO 3219-2:2021
  • DIN 4235-4:1978 Compacting of Concrete by Vibrating; Compacting of In-situ by Formwork Vibrators
  • DIN EN ISO 3219-1:2021-08 Rheology - Part 1: Vocabulary and symbols for rotational and oscillatory rheometry (ISO 3219-1:2021); German and English version EN ISO 3219-1:2021

Japanese Industrial Standards Committee (JISC)

ES-UNE

  • UNE-EN ISO 1797:2017 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017) (Endorsed by Asociación Española de Normalización in July of 2017.)
  • UNE-EN ISO 3219-2:2022 Rheology - Part 2: General principles of rotational and oscillatory rheometry (ISO 3219-2:2021)
  • UNE-EN ISO 3219-1:2022 Rheology - Part 1: Vocabulary and symbols for rotational and oscillatory rheometry (ISO 3219-1:2021)

Association Francaise de Normalisation

  • NF EN ISO 1797:2017 Médecine bucco-dentaire - Queues pour instruments rotatifs et oscillants
  • NF EN ISO 3219-2:2021 Rheology - Part 2: general principles of rotary and oscillatory rheometry
  • NF T51-211-2*NF EN ISO 3219-2:2021 Rheology - Part 2 : general principles of rotational and oscillatory rheometry
  • NF EN ISO 3219-1:2021 Rheology - Part 1: vocabulary and symbols for rotary and oscillatory rheometry
  • NF EN 60679-6:2011 Quality assured crystal driven oscillators - Part 6: Phase jitter measurement method for crystal oscillators and SAW oscillators - Application guidelines
  • NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • NF T51-211-1*NF EN ISO 3219-1:2021 Rheology - Part 1 : vocabulary and symbols for rotational and oscillatory rheometry

SCC

  • VDI 2125-1987 Plane joint transmission; Most efficient conversion of a shear-oscillation motion into a rotary-oscillation motion
  • VDI 2060-2014 Characteristics and detection of nonlinear oscillatory systems — free, forced and self-excited oscillations
  • NS-EN ISO 1797:2017 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017)
  • DANSK DS/EN ISO 1797:2017 Dentistry – Shanks for rotary and oscillating instruments (ISO 1797:2017)
  • BS DD 225:1995 Determination of anti-wear properties of hydraulic fluids using the oscillating pin on rotating disc method
  • DIN EN ISO 1797 E:2016 Draft Document - Dentistry - Shanks for rotary and oscillating instruments (ISO/DIS 1797.2:2016); German and English version prEN ISO 1797:2016
  • MIL MIL-O-14850-1969 OSCILLATOR, HIGH VOLTAGE, 10549785
  • DANSK DS/ISO 3219-2:2021 Rheology – Part 2: General principles of rotational and oscillatory rheometry
  • MIL MIL-PRF-55310/34-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310/33B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310/33-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • BS 2271-3:1965 Specification for quartz oscillator crystal units-Guide to the use of quartz oscillator crystals
  • MIL MIL-PRF-55310/33D-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • DANSK DS/ISO 3219-1:2021 Rheology – Part 1: Vocabulary and symbols for rotational and oscillatory rheometry
  • BS DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality-Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
  • IEC 60122-2:1962 Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
  • MIL MIL-PRF-55310/33C-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-O-52374E-2013 Oscillator: High Voltage General Specification for
  • MIL MIL-PRF-55310/21F-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/41-2018 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 125 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/16K-2017 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/15G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • CEI EN 60679-6:2015 Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DANSK DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • MIL MIL-PRF-55310/38B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/20F-2012 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 40.0 KHz through 60.0 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/30E-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/12H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/30D-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/16J-2008 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/9J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 400 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/13H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/26D-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 10kHz Through 65 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/29C-2011 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.2 MHz Through 85 MHz, Hermetic Seal, Square Wave, HCMOS
  • MIL MIL-PRF-55310/21G-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/34B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/11G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/13J-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS

Defense Logistics Agency

National Aeronautics and Space Administration (NASA)

  • NASA NACA-TR-787-1944 A theoretical investigation of the rolling oscillations of an airplane with ailerons free
  • NASA NACA-TN-3554-1956 A preliminary investigation of the effects of frequency and amplitude on the rolling derivatives of an unswept-wing model oscillating in roll

U.S. Military Regulations and Norms

British Standards Institution (BSI)

  • BS EN ISO 3219-1:2021 Rheology - Vocabulary and symbols for rotational and oscillatory rheometry
  • BS EN ISO 3219-2:2021 Rheology. General principles of rotational and oscillatory rheometry
  • BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines

Electronic Components, Assemblies and Materials Association

VDI - Verein Deutscher Ingenieure

TR-TSE

Military Standards (MIL-STD)

United States Navy

AENOR

Korean Agency for Technology and Standards (KATS)

European Committee for Standardization (CEN)

  • EN ISO 3219-2:2021 Rheology - Part 2: General principles of rotational and oscillatory rheometry (ISO 3219-2:2021)
  • EN ISO 3219-1:2021 Rheology - Part 1: Vocabulary and symbols for rotational and oscillatory rheometry (ISO 3219-1:2021)

International Electrotechnical Commission (IEC)

  • IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
  • IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

International Organization for Standardization (ISO)

  • ISO 3219-2:2021 Rheology - Part 2: General principles of rotational and oscillatory rheometry
  • ISO 3219-1:2021 Rheology - Part 1: Vocabulary and symbols for rotational and oscillatory rheometry
  • ISO 787-20:1975 General methods of test for pigments — Part 20: Comparison of ease of dispersion (Oscillatory shaking method)

Danish Standards Foundation

  • DS/ISO 3219-2:2021 Rheology – Part 2: General principles of rotational and oscillatory rheometry
  • DS/ISO 3219-1:2021 Rheology – Part 1: Vocabulary and symbols for rotational and oscillatory rheometry
  • DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

CO-ICONTEC

KR-KS

  • KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines

IT-UNI

GSO

  • GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • BH GSO IEC 60679-6:2016 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • OS GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • BH GSO IEC 60679-2:2016 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • OS GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

American National Standards Institute (ANSI)

IEC - International Electrotechnical Commission

  • PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)