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Reflectivity tester wavelength adjustment

Reflectivity tester wavelength adjustment, Total:33 items.

The international standard classification for "Reflectivity tester wavelength adjustment" includes: .

The Chinese standard classification for "Reflectivity tester wavelength adjustment" includes: Technical Management .


Professional Standard - Post and Telecommunication

  • YD/T 504-1991 Technical conditions for short-wave long optical time domain reflectoscopes

Professional Standard - Electron

  • SJ 379-1973 Measurement of frequency drift of reflex klystrons
  • SJ 377-1973 Measurement of frequency drift coefficient of reflex klystrons
  • SJ 382-1973 Measurement of frequency resettability of reflex klystrons
  • SJ 373-1973 Measurement of frequency pulling of reflex klystrons
  • SJ 380-1973 Measurement of frequency stability of reflex klystrons
  • SJ 372-1973 Measurement of electronic tuning slope of reflex klystrons
  • SJ 367-1973 Measurement of output power of reflex klystrons
  • SJ 381-1973 Measurement of frequency temperature coefficient of reflex klystrons
  • SJ 369-1973 Measurement of oscillation frequency of reflex klystrons
  • SJ 368-1973 Measurement of power ripple ratio of reflex klystrons

Military Standard of the People's Republic of China-General Armament Department

  • GJB 2038A-2011 The measurement methods for reflectivity of radar absorbing material
  • GJB 2038-1994 Radar absorbing material reflectivity test method
  • GJB 5023.1-2003 Test methods for reflectivity and emissivity of materials and coatings Part 1: Reflectivity

Group Standards of the People's Republic of China

National Metrological Technical Specifications of the People's Republic of China

Taiwan Provincial Standard of the People's Republic of China

  • CNS 11224-1991 Evaluation Characteristics of Pulse Echo Ultrasonic Testing System

German Institute for Standardization

  • DIN EN 62431:2009-07 Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods (IEC 62431:2008); German version EN 62431:2008
  • DIN EN 62129-2:2012-03 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters (IEC 62129-2:2011); German version EN 62129-2:2011

SCC

  • CEI EN 62431:2010 Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
  • DANSK DS/EN 62431:2009 Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
  • BS DD IEC/PAS 62431:2005 Measurement methods for reflectivity of electromagnetic wave absorbers in millimetre wave frequency
  • DANSK DS/EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
  • CEI EN 62129-2:2012 Calibration of wavelength/optical frequency measurement insturments Part 2: Michelson interferometer single wavelength meters

GSO

  • BH GSO IEC 62431:2016 Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
  • OS GSO IEC 62129-2:2014 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
  • GSO IEC 62431:2013 Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods

ES-UNE

  • UNE-EN 62431:2008 Measurement methods for reflectivity of electromagnetic wave absorbers in millimetre wave frequency (Endorsed by AENOR in March of 2009.)
  • UNE-EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters (Endorsed by AENOR in October of 2011.)

Association Francaise de Normalisation

IEC - International Electrotechnical Commission

  • PAS 62431-2005 Measurement methods for reflectivity of electromagnetic wave absorbers in millimetre wave frequency (Edition 1.0)

CENELEC - European Committee for Electrotechnical Standardization

  • EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters

Danish Standards Foundation

  • DS/EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters