Concentrator icp5000 instrument parameters
Concentrator icp5000 instrument parameters, Total:246 items.
The international standard classification for "Concentrator icp5000 instrument parameters" includes: Optical measuring instruments , Chemical analysis of metals , Lathes , Optical equipment , Chemical analysis , Exploratory and extraction equipment , Geology. Meteorology. Hydrology .
The Chinese standard classification for "Concentrator icp5000 instrument parameters" includes: Optical metrological instrument , Optical instrument in general , Lathe , Electron optics and other physical optics instrument , Basic standards and general methods , Petroleum drilling & production equipment and instrument , Oceanographic instrumentation .
Professional Standard - Machinery
- JB/T 8231-1999 The basic parameters of the plane-gratings spectrographs
- JB/T 10574-2013 Optical Length Measuring Instruments - Basic Parameters
- JB/T 6176-1992 Basic Parameter of Photographic Plate Cassette and Cassette Frame for Spectrograph
- JB/T 10574-2006 Optical length measuring instruments -- Basic parameters
- JB/T 9330-1999 The basic parameter for diaphragm plate of optical instrument
- JB/T 4136.1-1999 Meter Lathe Parameters
- JB/T 9346-1999 Basic parameters for spectrophotometer
- JB/T 6266-1992 Optical Comparator for Angle Measurement - Basic Parameter
- JB/T 6859-1993 Basic parameters of gas lasers
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 7257-1987 Measurement methods of parameter for helium neon laser
- GB/T 10050-2009 Optics and optical instruments—Reference wavelengths
- GB/T 16492-1996 Optics and optical instruments-Environmental requirements-General information, definitions, climatic zones and their parameters
- GB/T 3720-1988 Optical length measuring instruments--Basic parameters
- GB/T 10050-1988 Optics and optical instruments; Reference wavelengths
Professional Standard - Military and Civilian Products
- WJ 2118-1993 Military Laser Parameter Series
- WJ 2098-1992 Pulse laser range finder parameter series
Military Standard of the People's Republic of China-General Armament Department
- GJB 8361-2015 Parameter testing method of military laser power energy testing instrument
- GJB 894-1990 Military laser radiation parameter testing
- GJB 2740-1996 Pulse laser rangefinder parameter series
未注明发布机构
- DIN EN 61290-1-1 E:2013-10 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
- JIS C 6122-1-1:2024 Optical amplifiers-Test methods-Part 1-1: Power and gain parameters-Optical spectrum analyzer method
- DIN EN 61291 Beiblatt 1:1999 Fibre optics - Parameters of amplifier components
未注明发布机构
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- JIS C 6122-1-1:2024 Optical amplifiers-Test methods-Part 1-1: Power and gain parameters-Optical spectrum analyzer method
- DIN EN 61291 Beiblatt 1:1999 Fibre optics - Parameters of amplifier components
- DIN EN 61290-1-1 E:2013-10 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DIN EN IEC 61290-1-1:2022 Test methods for fiber optic amplifiers – Part 1 1: Optical performance and gain parameters – Optical spectrum analyzer method
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 6241-2008 Test method of dynamic parameters of laser beam-riding guidance instrument
Professional Standard - Petroleum
- SY/T 5377-2013 Specification for Drilling Fluid Testing Instruments
- SY 5377-2013 Technical conditions of drilling fluid parameter testing equipment
Group Standards of the People's Republic of China
- T/ZJDJ 005-2022 Digital display electric parameter measuring instrument
能源部
- SY/T 5097-1991 Drilling multi-parameter instrument
Professional Standard - Ocean
- HY/T 126-2009 Multiparameter water quality monitor
National Metrological Technical Specifications of the People's Republic of China
- JJF(建材) 164-2020 Calibration specification for on-site photothermal parameter measuring instrument for architectural glass
Professional Standard - Electron
- SJ 20762-1999 Measurement methods for parameters of gas lasers
CZ-CSN
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
- CSN 25 2300-1972 Classification of instruments and devices or measurement of the geometrical arameters of surface finish
British Standards Institution (BSI)
- BS EN 61290-2-3:1998 Optical fibre amplifiers - Basic specification - Test methods for optical power parameters - Optical power meter
- BS EN 61290-5-1:2006 Optical amplifiers - Test methods - Reflectance parameters - Optical spectrum analyzer method
- BS EN ISO 7944:1998(1999) Optics and optical instruments — Reference wavelengths
- BS EN IEC 61290-1-1:2020 Optical amplifiers. Test methods - Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-3-1:2003(2004) Optical amplifiers — Test methods — Part 3 - 1 : Noise figure parameters — Optical spectrum analyzer method
- 23/30464593 DC BS EN ISO 7944. Optics and optical instruments. Reference wavelengths
- BS ISO 10109-1:1994 Optics and optical instruments - Environmental requirements - General information, definitions, climatic zones and their parameters
- BS EN 61290-10-2:2008 Optical amplifiers – Test methods — Part 10-2: Multichannel parameters – Pulse method using a gated optical spectrum analyzer
- BS ISO 10109-1:1995 Optics and optical instruments - Environmental requirements - General information, definitions, climatic zones and their parameters
- BS EN 61290-10-2:2009 Optical amplifiers. Test methods. Multichannel parameters. Pulse method using a gated optical spectrum analyzer
- BS EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1:Noise figure parameters - Optical spectrum analyzer method
- BS EN 61290-3-1:2004 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters. Optical spectrum analyzer method
- PD IEC/TR 61292-1:2022 Optical amplifiers. Parameters of optical fibre amplifier components
- BS ISO 10109-1:2006 Optics and photonics - Environmental requirements - General overview, terms and definitions, climatic zones and their parameters
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- BS EN 61290-10-4:2007 Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
- BS EN 61290-3-2:2003 Optical fibre amplifiers - Basic specification - Test methods for noise figure parameters - Electrical spectrum analyzer method
- BS EN 61290-10-1:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using an optical switch and optical spectrum analyzer
- BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
Korean Agency for Technology and Standards (KATS)
- KS B ISO 7944-2011(2016) Optics and optical instruments-Reference wavelengths
- KS B ISO 7944-2021 Optics and optical instruments-Reference wavelengths
- KS B ISO 7944-2011(2021) Optics and optical instruments-Reference wavelengths
- KS C IEC 61290-3-1-2005(2020) Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-3-1:2005 Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-3-1-2020 Optical amplifiers-Test methods-Part 3-1:Noise figure parameters-Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2022) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-5-1-2007(2017) Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS C IEC 61290-5-1-2022 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
- KS C IEC 61290-3-2-2020 Optical amplifiers-Part 3-2:Test methods for noise figure parameters-Electrical spectrum analyzer method
- KS C IEC 61290-3-2-2005(2020) Optical amplifiers-Part 3-2:Test methods for noise figure parameters-Electrical spectrum analyzer method
- KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS B ISO 8576:2006 Optics and optical instruments-Microscopes-Reference system of polarized light microscopy
- KS C IEC 61290-10-1-2005(2020) Optical amplifiers-Test methods-Part 10-1:Multichannel parameters-Pulse method using an optical switch and optical spectrum analyzer
- KS B ISO 10109-1-2022 Optics and optical instruments-Environmental requirements-Part 1:General information, definitions, climatic zones and their parameters
- KS B ISO 10109-1-2002(2022) Optics and optical instruments-Environmental requirements-Part 1:General information, definitions, climatic zones and their parameters
- KS B ISO 10109-1-2002(2017) Optics and optical instruments-Environmental requirements-Part 1:General information, definitions, climatic zones and their parameters
- KS C IEC 61290-10-2-2005(2020) Optical amplifiers-Test methods-Part 10-2:Multichannel parameters-Pulse method using a gated optical spectrum analyzer
- KS C IEC 61290-5-1:2007 Optical amplifiers-Test methods-Part 5-1:Reflectance parameters -Optical spectrum analyzer method
- KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
- KS B ISO 9334-2016(2021) Optics and optical instruments-Optical transfer function-Definitions and mathematical relationships
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS B ISO 10109-1:2002 Optics and optical instruments-Environmental requirements-Part 1:General information, definitions, climatic zones and their parameters
- KS B ISO 9334:2001 Optics and optical instruments-Optical transfer function-Definitions and mathematical relationships
- KS B ISO 9334:2016 Optics and optical instruments-Optical transfer function-Definitions and mathematical relationships
- KS D ISO 15471:2005 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
International Organization for Standardization (ISO)
- ISO/DIS 7944:2023 Optics and optical instruments — Reference wavelengths
- ISO/CD 7944 Optics and optical instruments — Reference wavelengths
- ISO 1878:1974 Title missing - Legacy paper document
- ISO 1878:1983 Classification of instruments and devices for measurement and evaluation of the geometrical parameters of surface finish
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 9334:1995 Optics and optical instruments - Optical transfer function - Definitions and mathematical relationships
- ISO 10109-1:1994 Optics and optical instruments - Environmental requirements - Part 1: General information, definitions, climatic zones and their parameters
- ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
Japanese Industrial Standards Committee (JISC)
- JIS B 7090:1999 Optics and optical instruments -- Reference wavelengths
- JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
- JIS C 6122-3-2:2006 Optical amplifiers -- Test methods -- Part 3-2: Noise figure parameters -- Electrical spectrum analyzer method
- JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
- JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
GSO
- GSO ISO 7944:2007 Optics and optical instruments - Reference wavelengths
- BH GSO IEC 61290-3-1:2016 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- GSO IEC 61290-5-1:2014 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- GSO IEC 61290-3-1:2014 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- GSO ISO 8429:2013 optics and optical instruments-Ophthalmology – Graduated dial scale
- BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
- GSO ISO 8576:2015 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
- GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- OS GSO IEC 61290-1-1:2013 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BH GSO IEC 61290-1-1:2016 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- GSO IEC 61290-3-2:2014 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- BH GSO IEC 61290-3-2:2016 Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer method
- GSO IEC 61290-5-2:2014 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyser method
Danish Standards Foundation
- DS/EN ISO 7944:1999 Optics and optical instruments - Reference wavelengths
- DS/EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DS/ISO 1878:1989 Classification of instruments and devices for measurement and evaluation of the geometrical parameters of surface finish
- DS/EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
Association Francaise de Normalisation
- NF EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
- NF C93-805-1-2*NF EN 61290-1-2:2006 Optical amplifiers - Test methods - Part 1-2 : power and gain parameters - Electrical spectrum analyzer method.
- NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: noise figure parameters - Optical spectrum analyzer method
- NF C93-805-3-1*NF EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1 : noise figure parameters - Optical spectrum analyzer method
- NF EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: reflectance parameters - Optical spectrum analyzer method
- NF EN 61290-3-2:2009 Optical amplifiers - Test methods - Part 3-2: noise figure parameters - Electrical spectral analyzer method
- NF EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1*NF EN 61290-1-1:2017 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method
- NF C93-805-1-1:2020 Optical amplifiers - Test methods - Part 1-1 : Power and gain parameters - Optical spectrum analyzer method
- NF C93-805-2-1:1998 Optical fibre amplifiers. Basic specification. Part 2-1 : test methods for optical power parameters. Optical spectrum analyzer.
- NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
- NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
- NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
- NF C93-805-5-2*NF EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2 : reflectance parameters - Electrical spectrum analyser method
- E11-016:1987 Length measuring instruments. Fringe counting, laser source interferometers.
SCC
- DANSK DS/EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
- BS DD IEC/PAS 61290-3-1:2002 Optical fibre amplifiers. Basic specification. Test methods for noise figure parameters-Optical spectrum analyzer
- BS EN 61290-2-1:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Optical spectrum analyzer
- DANSK DS/EN 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method
- BS 7017:1988 Specification for reference wavelengths for optics and optical instruments
- BS EN 61290-5-1:2000 Optical fibre amplifiers. Basic specification. Test methods for reflectance parameters-Optical spectrum analyser
- NS-EN ISO 7944:1998 Optics and optical instruments — Reference wavelengths (ISO 7944:1998)
- BS PD IEC/TR 61292-1:2022 Optical amplifiers-Parameters of optical fibre amplifier components
- BS EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification-Test methods for optical power parameters. Electrical spectrum analyzer
- CEI EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- DANSK DS/EN 61290-5-1:2006 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method
- IEC PAS 61290-3-1:2002 Optical fibre amplifiers - Basic specification - Part 3-1: Test methods for noise figure parameters - Optical spectrum analyzer
- CEI EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1: Power and gain parameters - Optical spectrum analyzer method
- DIN EN ISO 7944 E:2023 Draft Document - Optics and optical instruments - Reference wavelengths (ISO/DIS 7944:2023); German and English version prEN ISO 7944:2023
- BS IEC 61292-1:1998 Fibre optics-Parameters of amplifier components
- BS PD IEC/TR 61292-1:2009 Optical amplifiers-Parameters of amplifier components
- DANSK DS/EN 61290-1-1:2015 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- CEI EN IEC 61290-1-1:2021 Optical amplifiers - Test methods Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- DANSK DS/EN IEC 61290-1-1:2020 Optical amplifiers – Test methods – Part 1-1: Power and gain parameters – Optical spectrum analyzer method
- BS EN 61290-1-2:1998 Optical fibre amplifiers. Basic specification-Test methods for gain parameters. Electrical spectrum analyzer
- CEI EN 61290-3-2:2010 Optical amplifier test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DANSK DS/EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- DANSK DS/EN 61290-5-2:2004 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters - Electrical spectrum analyzer method
- BS ISO 9334:1995 Optics and optical instruments. Optical transfer function. Definitions and mathematical relationships
- CEI EN 61290-2-2:1999 Optical fibre amplifiers - Basic specification - Part 2-2: Test methods for optical power parameters - Electrical spectrum analyzer
- DANSK DS/IEC TR 61292-1 ED3:2022 Optical amplifiers – Part 1: Parameters of optical fiber amplifier components
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
RU-GOST R
- GOST 28953-1991 Photosensitive charge transfer device. Measuring methods for parameters
- GOST 25678-1983 Instruments for measurements of pulse laser energy. Types. Basic parameters. Methods for measurement of basic parameters
- GOST 9847-1979 Optical instruments for surface roughness parameters measuring. Basis parameters and types
- GOST 23547-1979 Optoelectron commutators. Basic parameters
- GOST 19300-1986 Instruments for measurement of surface roughness by the profile method. Contact profilographs and profilometers. Types and main parameters
- GOST 19319-1982 Solid-state lasers. Basic parameters
- GOST R 50784-1995 Optical isolators. Types. Main parameters
- GOST 18230-1972 Power supplies spectrometric semiconductor radiation detectors. Types and basic parameters
- GOST 21815.0-1986 Image intensifier and image converter tubes. Common rules of measuring electrical, viewing and optical parameters
- GOST R 50606-1993 Optics and optical instruments. Dioptrimeters
- GOST 25851-1983 Radiometric instruments. Methods of main parameters measurement
- GOST 25370-1982 Measuring photomultipliers. Basic parameters, measuring methods of basic parameters
- GOST 20186-1974 Vacuum luminescent display tubes. Basic parameters
- GOST R 50785-1995 Optical filtres. Types and main parameters
GOSTR
- GOST 24469-1980 Instruments for measurements laser radiation parameters. General technical requirements
International Electrotechnical Commission (IEC)
- IEC 61290-1-2:2005 Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method
- IEC 61290-3-1:2003 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters; Optical spectrum analyzer method
- IEC 61290-1-1:2020 RLV Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-3-2:2003 Optical amplifiers - Part 3-2: Test methods for noise figure parameters; Electrical spectrum analyzer method
- IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
- IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
- IEC 61290-5-2:2003 Optical amplifiers - Test methods - Part 5-2: Reflectance parameters; Electrical spectrum analyser method
- IEC TR 61292-1:2022 Optical amplifiers - Part 1: Parameters of optical fibre amplifier components
- IEC TR 61292-1:1998 Fibre optics - Parameters of amplifier components
Association of German Mechanical Engineers
- VDI/VDE 5570 Blatt 2-2006 Testing of connectorised and non-connectorised polymer optical fibres - Testing of optical parameters
- DVS 2205-1-1985 Mathematical calculation of containers and vessels of thermoplastic polymers; parameters
- VDI/VDE 5570 Blatt 3-2006 Testing of connectorised and non-connectorised polymer optical fibres - Testing of mechanical and environmental parameters
ES-UNE
- UNE-EN 61290-3-1:2003 Optical amplifiers - Test methods -- Part 3-1: Noise figure parameters - Optical spectrum analyzer method (Endorsed by AENOR in April of 2004.)
- UNE-EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by AENOR in August of 2015.)
- UNE-EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (Endorsed by Asociación Española de Normalización in December of 2020.)
- UNE-EN 61290-3-2:2008 Optical amplifier test methods -- Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (Endorsed by AENOR in February of 2009.)
- UNE-EN 61290-5-1:2006 Optical amplifiers - Test methods -- Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006). (Endorsed by AENOR in October of 2006.)
- UNE-EN 61290-5-2:2004 Optical amplifiers - Test methods -- Part 5-2: Reflectance parameters - Electrical spectrum analyser method (Endorsed by AENOR in September of 2004.)
German Institute for Standardization
- DIN EN 61290-3-1:2004-05 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN 61290-3-1:2004 Optical amplifiers - Test methods - Part 3-1: Noise figure parameters - Optical spectrum analyzer method (IEC 61290-3-1:2003); German version EN 61290-3-1:2003
- DIN EN ISO 7944:1998-07 Optics and optical instruments - Reference wavelengths (ISO 7944:1998); German version EN ISO 7944:1998
- DIN EN 61290-5-1:2007 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006
- DIN EN 61290-5-1:2007-03 Optical amplifiers - Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006); German version EN 61290-5-1:2006 / Note: DIN EN 61290-5-1 (2001-06) remains valid alongside this standard until 2009-06-01.
- DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
- DIN EN 61290-1-1:2007 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method (IEC 61290-1-1:2006); German version EN 61290-1-1:2006
- DIN EN 61290-3-2:2009-06 Optical amplifier - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method (IEC 61290-3-2:2008); German version EN 61290-3-2:2008 / Note: DIN EN 61290-3-2 (2003-08) remains valid alongside this standard until 2011-10-01....
- DIN EN 61291 Bb.1:1999 Fibre optics - Parameters of amplifier components (Technical Report IEC 61292-1:1998)
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
AENOR
- UNE-EN ISO 7944:1999 OPTICS AND OPTICAL INSTRUMENTS. REFERENCE WAVELENGTHS (ISO 7944:1998)
- UNE 82302:1992 CLASSIFICATION OF INSTRUMENTS AND DEVICES FOR MEASUREMENT AND EVALUATION OF THE GEOMETRICAL PARAMETERS OF SURFACE FINISH.
Lithuanian Standards Office
- LST EN ISO 7944:2000 Optics and optical instruments - Reference wavelengths (ISO 7944:1998)
- LST EN ISO 7944:2000/AC:2009 Optics and optical instruments - Reference wavelengths (ISO 7944:1998/Cor 1:2009)
- LST EN 61290-3-1-2004 Optical amplifiers. Test methods. Part 3-1: Noise figure parameters. Optical spectrum analyzer method (IEC 61290-3-1:2003)
- LST EN 61290-5-1-2006 Optical amplifiers -Test methods - Part 5-1: Reflectance parameters - Optical spectrum analyzer method (IEC 61290-5-1:2006)
European Committee for Standardization (CEN)
- prEN ISO 7944 Optics and optical instruments - Reference wavelengths (ISO/DIS 7944:2023)
ZA-SANS
- SANS 61290-5-1:2007 Optical amplifiers - Test methods Part 5-1: Reflectance parameters - Optical spectrum analyzer method
Standard Association of Australia (SAA)
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
GOST
- GOST R 70867-2023 Gas lasers. Parameters system
- GOST R 70754-2023 Acousto-optic modulators and deflectors. Parameter system
CENELEC - European Committee for Electrotechnical Standardization
- EN 61290-2-1:1998 Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters Optical Spectrum Analyzer
- EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
- EN 61290-3-2:2003 Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method
- EN 61290-1-1:1998 Optical Fibre Amplifiers - Basic Specification Part 1-1: Test Methods for Gain Parameters Optical Spectrum Analyzer
YU-JUS
- JUS M.A1.032-1980 Classification of imtruments and devices for measurement and evaluation of the geometrical parameters of surface finish
European Committee for Electrotechnical Standardization(CENELEC)
- EN IEC 61290-1-1:2020 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- EN 61290-3-2:2008 Optical amplifiers - Test methods - Part 3-2: Noise figure parameters - Electrical spectrum analyzer method
- EN 61290-3-1:2003 Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method
AT-ON
- ONORM M 6773-2001 Surface texture of tooth flanks - Roughness parameters, determination of roughness parameters using stylus instruments, measuring instruments and measuring conditions
American National Standards Institute (ANSI)
- ANSI/TIA/EIA 455-221-2001 Optical Fiber Amplifiers - Basic Specification - Part 5 -1: Test Method for Reflectance Parameters - Optical Spectrum Analyzer
IN-BIS
- IS 12874-1989 Optical and mathematical instruments—Telescopic sights—Specifications
KR-KS
- KS B ISO 9334-2016 Optics and optical instruments-Optical transfer function-Definitions and mathematical relationships
- KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5570 Blatt 3-2003 Testing of connectorised and non-connectorised polymer optical fibres - Testing of mechanical and environmental parameters