Scanning transmission electron microscope focusing
Scanning transmission electron microscope focusing, Total:33 items.
The international standard classification for "Scanning transmission electron microscope focusing" includes: Protection against crime , Diagnostic equipment , Other standards related to analytical chemistry , Optical equipment .
The Chinese standard classification for "Scanning transmission electron microscope focusing" includes: Crime judging technology , Medical apparatus and devices in general , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument .
Professional Standard - Education
- JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
Professional Standard - Medicine
- YY/T 1154-2009 Laser confocal scanner
工业和信息化部
- SJ/T 11759-2020 Test method for determining the aspect ratio of solar cell's grid line electrode-confocal laser scanning microscope
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
- GJB/J 3362-1998 Calibration procedures for self-focusing lens focal spot diameter and focal length testers
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33805-2017 Technical requirement of laser confocal biochip scanner
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
Group Standards of the People's Republic of China
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
Professional Standard - Public Safety Standards
- GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
- GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GSO
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
German Institute for Standardization
- DIN EN ISO 11979-9:2006 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006); English version of DIN EN ISO 11979-9:2006-12
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
American Society for Testing and Materials (ASTM)
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
European Committee for Standardization (CEN)
- EN ISO 11979-9:2006 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006)
- EN ISO 11979-9:2006/A1:2014 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006/Amd 1:2014)
SCC
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- BS 9061:1971 Rules for the preparation of detail specifications for vidicon tubes of assessed quality electromagnetic focusing and scanning
Korean Agency for Technology and Standards (KATS)
- KS I 0051-2019 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
