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Database: 365,228(8 Aug 2026)

defective sp3 carbon atom

defective sp3 carbon atom, Total:41 items.

The international standard classification for "defective sp3 carbon atom" includes: Wood, sawlogs and sawn timber , Semiconducting materials , Powder metallurgy .

The Chinese standard classification for "defective sp3 carbon atom" includes: Stem wood and raw wood , Semimetal and semiconductor material in general , Metallographic testing method .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Military Standard of the People's Republic of China-General Armament Department

  • GJB 2082-1994 Classification of visual and mechanical defects in electronic equipment
  • GJB 2082A-2012 Classification of technologic and mechanical defects for electronic equipment

Professional Standard - Non-ferrous Metal

未注明发布机构

Group Standards of the People's Republic of China

  • T/CASAS 004.1-2018 The Terminology for Defects in both 4H-SiC Substrates and Epilayers
  • T/IAWBS 002-2017 Test method for surface defect of silicon carbide epitaxial wafer
  • T/CASAS 004.2-2018 The Metallographs Collection for Defects in both 4H-SiC Substrates and Epilayers

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

  • GJB 5376-2005 Defects classification for projectile of gun launched aimable cluster

Professional Standard - Machinery

  • JB/T 6890-1993 Specifications for defect repair welding of carbon steel castings for fans

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 40067-2021 Microstructure and defect determination of tungsten carbide powder

CZ-CSN

PL-PKN

RO-ASRO

GSO

  • GSO ISO 11398:2015 Raw ostrich skins -- Description of defects, guidelines for presentation and grading on basis of defects

TR-TSE

AR-IRAM

  • IRAM 125-1959 Magnetic detection method for defects in iron-containing raw materials

Korean Agency for Technology and Standards (KATS)

International Organization for Standardization (ISO)

British Standards Institution (BSI)

  • BS IEC 63068-1:2019 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Classification of defects