China Standards English version of Semiconductor discrete devices in general,page 4

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Database: 365,228(8 Aug 2026)

Safety of machinery GB 50016 PV IMT-2020 maximum residue limits water quality

GB/T 20521.4-2025 in English

Semiconductor devices—Part 14-4:Semiconductor sensors—Semiconductor accelerometers

VALID

Issued on:2025-12-31 | Implemented on:2026-07-01

$1,200.00 $1,164.00
GB/T 4937.40-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge

VALID

Issued on:2025-12-31 | Implemented on:2026-07-01

$375.00 $364.00
GB/T 4937.37-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 37: Board level drop test method using an accelerometer

VALID

Issued on:2025-12-31 | Implemented on:2026-07-01

$375.00 $364.00
GB/T 4937.8-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 8：Sealing

VALID

Issued on:2025-12-31 | Implemented on:2026-07-01

$135.00 $131.00
GB/T 4937.39-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

VALID

Issued on:2025-12-31 | Implemented on:2026-07-01

$315.00 $306.00
GB/T 4937.10-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 10: Mechanical shock—Device and subassembly

VALID

Issued on:2025-12-31 | Implemented on:2026-07-01

$315.00 $306.00
GB/Z 107-2025 in English

Semiconductor devices—Scan based ageing level estimation for semiconductor devices

VALID

Issued on:2025-12-03 | Implemented on:2025-12-03

$270.00 $262.00
GB/T 4937.29-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 29: Latch-up test

VALID

Issued on:2025-12-02 | Implemented on:2026-07-01

$435.00 $422.00
GB/T 4937.24-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 24: Accelerated moisture resistance—Unbiased HAST

VALID

Issued on:2025-12-02 | Implemented on:2026-07-01

$270.00 $262.00
GB/T 4937.25-2025 in English

Semiconductor devices—Mechanical and climatic test methods—Part 25: Temperature cycling

VALID

Issued on:2025-12-02 | Implemented on:2026-07-01

$270.00 $262.00

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