GB/T 4937.24-2025 in English

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Standard No:	GB/T 4937.24-2025
Document status:	VALID
Title in English:	Semiconductor devices—Mechanical and climatic test methods—Part 24: Accelerated moisture resistance—Unbiased HAST
Title in Chinese:	半导体器件机械和气候试验方法第24部分：加速耐湿无偏置强加速应力试验
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2025-12-02
Implemented on:	2026-07-01
ICS Classification:	31.080.01-Semiconductor devices in general
Chinese Classification:	L40-Semiconductor discrete devices in general
Professional Classification:	GB-National Standard
Related Keywords:	semiconductor devices mechanical climatic test methods accelerated moisture resistance test methods

《GB/T 4937.24-2025半导体器件机械和气候试验方法第24部分：加速耐湿无偏置强加速应力试验》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。

More samples: DL/T 5154-2012 JJG 21-2008 NB/T 47013.2-2015

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