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Database: 365,228(8 Aug 2026)
semiconductor devices discrete devices discrete devices discrete device standards integrated circuits general standards brown planthopper metals- cupping testing method zirconium-copper-nickel-aluminum-silver-yttrium amorphous alloy
GB/T 17573-1998 in English

GB/T 17573-1998 in English

VALID

Semiconductor devices Discrete devices and integrated circuits Part 1:General

  • Issued on:1998-01-01
  • Implemented on:1999-06-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $670.00
$650.00
Standard No: GB/T 17573-1998
Document status: VALID
Superseded by: GB/T 17573-2026 Semiconductor devices—General
Superseded on: 2026-10-01
Title in English: Semiconductor devices Discrete devices and integrated circuits Part 1:General
Title in Chinese: 半导体器件 分立器件和集成电路 第1部分:总则
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 1998-01-01
Implemented on: 1999-06-01
ICS Classification: 31.080.01-Semiconductor devices in general
Chinese Classification: L40-Semiconductor discrete devices in general
Professional Classification: GB-National Standard
Related Keywords: semiconductor devices discrete devices
discrete devices
discrete device standards
integrated circuits
general standards
Related Topics: Semiconductor Device Usage Rules
discrete device
discrete device
cubic conduction
GBT17573
GBT17573-1998
Semiconductor device
Rigid body current collector
Semiconductor Discrete Devices International

《GB/T 17573-1998半导体器件 分立器件和集成电路 第1部分:总则》由TC78(全国半导体器件标准化技术委员会)归口,主管部门为工业和信息化部(电子)。
内容详见本标准。


Scope

The IEC747 standard includes the following contents: --General standards for discrete devices and integrated circuits; --Supplementary standards for perfecting discrete device standards.

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