Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)
discrete devices semiconductor devices microwave devices scopethis standard devices fast switching schottky diodes low-carbon steel wires ferrovanadium-the potentiometric method decorative trim
GB/T 20516-2006 in English

GB/T 20516-2006 in English

VALID

Semiconductor devices - Discrete devices - Part 4: Microwave devices

  • Issued on:2006-10-10
  • Implemented on:2007-02-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $90.00
$88.00

《GB/T 20516-2006半导体器件 分立器件 第4部分:微波器件》由TC78(全国半导体器件标准化技术委员会)归口,主管部门为工业和信息化部(电子)。
本标准等同采用国际标准IEC60747-4:2001《半导体器件 分立器件 第4部分:微波器件》,内容包括:总则,变容二极管、阶跃二极管和快速开关肖特基二极管,混频二极管和检波二极管,雪崩二极管,体效应二极管,双极型晶体管,场效应晶体管,评价和可靠性-特殊要求等内容。


Scope

This standard gives standards for the following categories of discrete devices: - varactor diodes, step diodes and fast switching Schottky diodes (used for tuning, up-converter or harmonic doubler, switches, limiters, Phaser, parametric amplifier, etc.) - Mixer and detector diodes - Avalanche diodes (for harmonic generators, amplifiers, etc.) - Body effect diodes (for oscillators, amplifiers, etc.) - Bipolar transistors (for amplifiers, oscillators, etc.) - field effect transistors (for amplifiers, oscillators, etc.)

Sample only — not a preview of GB/T 20516-2006
Page: 1 / 0
100%

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend

  • GB/T 45716-2025 in English

    GB/T 45716-2025 in English

    Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)

    2025-05-30
  • GB/T 4589.1-2006 in English

    GB/T 4589.1-2006 in English

    Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

    2006-10-10
  • GB/T 17573-1998 in English

    GB/T 17573-1998 in English

    Semiconductor devices Discrete devices and integrated circuits Part 1:General

    1998-01-01
  • GB/T 4937.37-2025 in English

    GB/T 4937.37-2025 in English

    Semiconductor devices—Mechanical and climatic test methods—Part 37: Board level drop test method using an accelerometer

    2025-12-31
  • GB/T 20521-2006 in English

    GB/T 20521-2006 in English

    Semconductor devices Part 14-1: Semiconductor sensors - General and classification

    2006-08-23
  • GB/T 12560-1999 in English

    GB/T 12560-1999 in English

    Semiconductor devices --Sectional specification for discrete devices

    1999-08-02