GB/T 34831-2017 in English
VALIDNanotechnologies-Electron microscopy imaging of noble metal nanoparticles- High angle annular dark field imaging method
- Issued on:2017-11-01
- Implemented on:2018-05-01
- File Format:PDF
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《GB/T 34831-2017纳米技术 贵金属纳米颗粒电子显微镜成像 高角环形暗场法》由TC279(全国纳米技术标准化技术委员会)归口,主管部门为中国科学院。
Introduction
1. Background and significance of standard formulation
Due to their unique physical and chemical properties, precious metal nanoparticles have important application value in catalysis, energy, optics and other fields. However, their characterization technology has always been a research difficulty. As an advanced microscopy technology, high-angle annular dark field imaging can effectively distinguish precious metal particles from their carriers, providing strong support for the characterization of nanomaterials.
2. Principle of high-angle annular dark field imaging
High-angle annular dark field imaging (HAADF) uses an annular detector to collect high-angle scattered electrons, and the image contrast is approximately proportional to the square of the atomic number. This technology is particularly suitable for the characterization of precious metal nanoparticles, with atomic-level resolution and high sensitivity.
3. Comparison of standard frameworks
| Standard dimensions | Requirements of this standard | Reference requirements | Industry universality |
|---|---|---|---|
| Instruments and equipment | Field emission electron microscope + scanning transmission accessory + high-angle annular dark field detector | GB/T 19619 | Widely applicable |
| Imaging technology | High-angle annular dark field imaging (HAADF) | Nanoprobe mode + 0.2nm beam spot size | High resolution requirements |
| Sample preparation | Ultrasonic dispersion + carbon support film sample preparation | Dispersants such as water and ethanol | Standardized process |
4. Implementation suggestions
Case study: In palladium/zinc oxide (Pd/ZnO) composite materials, high-angle annular dark field imaging clearly distinguishes the precious metal particles from the carrier. This method is suitable for the characterization of micron-sized particles and nanoparticles.
Operational suggestions: Before the experiment, the instrument status needs to be checked to ensure that the condenser axis and astigmatism are accurately adjusted. Contamination should be avoided during sample preparation, and the purity requirements of the dispersant should be guaranteed.

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