nanogram microbeam electron microscopy

nanogram microbeam electron microscopy, Total:59 items.

The international standard classification for "nanogram microbeam electron microscopy" includes: Physicochemical methods of analysis , Chemical analysis , Optical equipment .

The Chinese standard classification for "nanogram microbeam electron microscopy" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Magnifier and microscope .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18735-2014 Microbeam analysis-General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope(AEM/EDS)
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34831-2017 Nanotechnologies-Electron microscopy imaging of noble metal nanoparticles- High angle annular dark field imaging method
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
DANSK DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
DANSK DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

GSO

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

International Organization for Standardization (ISO)

ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

Danish Standards Foundation

DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy

International Electrotechnical Commission (IEC)

ISO TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Indonesia Standards

SNI 13-4710-1998 Identification of ore minerals by reflective beam polarization microscope

American Society for Testing and Materials (ASTM)

ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization

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