GB/T 36474-2018 in English
VALIDSemiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
- Issued on:2018-06-07
- Implemented on:2019-01-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$243.00
《GB/T 36474-2018半导体集成电路 第三代双倍数据速率同步动态随机存储器 (DDR3 SDRAM)测试方法》由TC599(全国集成电路标准化技术委员会)归口,主管部门为工业和信息化部(电子)。
Scope
This standard specifies the method for the third generation double data rate synchronous dynamic random access memory (CDDR3 SDRAMD) of semiconductor integrated circuits (CDDR3 SDRAMD function verification and electrical parameter testing methods. This standard is applicable to the third generation double data rate synchronous dynamic random access memory in the field of semiconductor integrated circuits (DDR3 SDRAMD) functional verification and electrical parameter testing.

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