GB/T 40071-2021 in English
VALIDNanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Optical contrast method
- Issued on:2021-05-21
- Implemented on:2021-12-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
Price(USD)：
$250.00
$243.00
$243.00
《GB/T 40071-2021纳米技术 石墨烯相关二维材料的层数测量 光学对比度法》由TC279（全国纳米技术标准化技术委员会）归口，TC279SC1（全国纳米技术标准化技术委员会纳米材料分会）执行，主管部门为中国科学院。
Introduction
Analysis of the core content of the standard
This standard specifies two methods for measuring the number of layers of graphene flakes and graphene films using a microspectrometer and a optical microscope:
| Method type | Applicable scenarios | Resolution | Measurement efficiency |
|---|---|---|---|
| Reflection spectroscopy method | Laboratory precise measurement | 0.01 layer | Lower (spectral scanning required) |
| Optical image method | Industrial Rapid Detection | 0.1 layer | High (single imaging) |
Key Technical Principles
Based on the multilayer film interference effect, when the number of graphene layers increases:
- The difference in reflected light intensity changes nonlinearly
- The peak wavelength of optical contrast shifts (typical value: 570nm for single layer)
- The contrast of G channel (520-590nm) is positively correlated with the number of layers
Key Points for Standard Implementation
Sample Preparation Requirements
- The substrate must use 300±5nm SiO2/Si
- CVD sample transfer needs to refer to the PMMA auxiliary process in Appendix A
- Lateral size ≥ 2μm, number of layers ≤ 5
Instrument calibration specifications
- Spectrometer needs to meet the scanning range of 400-800nm
- Numerical aperture of objective lens ≥ 0.8
- Gamma value must be fixed during image acquisition
Measurement error control
The standard clearly requires:
- The deviation between a single measurement value and the average value is ≤ 10%
- Data is invalid when the peak wavelength λp＞600nm
- 5-point sampling is required to obtain the average value
Sample only — not a preview of GB/T 40071-2021
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