GB/T 4061-1983 in English
SUPERSEDEDPolycrystalline silicon--Examination method--Assessment of sandwiches on cross-section by chemical corrosion
- Issued on:1983-01-02
- Implemented on:1984-01-02
- File Format:PDF
- Delivery:Via email within 1~3 business days
Price(USD):
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《GB/T 4061-1983硅多晶断面夹层化学腐蚀检验方法》由TC203(全国半导体设备和材料标准化技术委员会)归口,主管部门为国家标准化管理委员会。
本标准适用于三氯氢硅及四氯化硅氢还原在细硅芯上沉积硅多晶所生长出来的硅多晶棒。
Scope
This standard is applicable to silicon polycrystalline rods grown by hydrogen reduction of trichlorosilane and silicon tetrachloride to deposit polycrystalline silicon on thin silicon cores.
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