Crystal Form Methodology

Crystal Form Methodology, Total:158 items.

The international standard classification for "Crystal Form Methodology" includes: Optics and optical measurements , Abrasives , Electronic display devices , Non-destructive testing of metals , Piezoelectric and dielectric devices , Optical measuring instruments , Non-metalliferous minerals , Chemical reagents , Plastics , Transistors , Chemical analysis of metals , Semiconducting materials , Testing of metals , Nickel, chromium and their alloys , Thyristors , Extraction and processing of petroleum and natural gas , Pigments and extenders , Cadmium, cobalt and their alloys , Materials for aluminium production , Chemical analysis , Medical equipment , Ophthalmic equipment , Optoelectronics. Laser equipment .

The Chinese standard classification for "Crystal Form Methodology" includes: Elemental semiconductor material , Material and component for instrument and meter , Grinding material and apparatus , Artificial lens , Others , Metal nondestructive testing method , Quartz crystal and piezoelectric element , Chemical reagent in general , Basic standards and general methods for synthetic resin and plastic , Power semiconductor device and parts , Metal chemical property test method , Semimetal and semiconductor material in general , Metal physical property test method , Optical Measurement , Steel and iron alloy analysis method , Petroleum drilling , Heavy metals and their alloys analysis method , Talcum material , Medical optical instrument and endoscope , Extracorporeal circulation, artificial organ and prosthesis device , Laser device .

Professional Standard - Electron

SJ/T 10439-1993 Test methods for bipolar transister DC parameter testers
SJ/T 31108-1994 Requirements of readiness and methods of inspection and assessment for CG3000 mono-crystal furnaces
SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
SJ 20858-2002 Measuring methods for electrical parameters of silicon carbide single crystal material
SJ/T 11499-2015 Test method for measuring electrical properties of monocrystalline silicon carbide

Professional Standard - Machinery

JB/T 5203-1991 Monocrystalline Fused Alumina - Method for Chemical Analysis
JB/T 9495.3-1999 Measuring method for transmittance of optical crystal
JB/T 9495.4-1999 Measuring method for stress-birefringence of optical crystal
JB/T 9495.5-1999 Measuring method for scatter graininess of optical crystal
JB/T 9395.3-1999 Measuring method for transmittance of optical crystal
JB/T 9395.5-1999 Measuring method for scatter graininess of optical crystal
JB/T 5203-2023 Chemical analysis methods for monocrystalline fused alumina
JB/T 9495.6-1999 Measuring method for coefficient of optical absorption of optical crystal
JB/T 9495.7-1999 Measuring method for optical homogeneity of optical crystal
JB/T 9495.2-1999 Measuring method for refractive index of optical crystals
JB/T 5203-2012 Chemical analysis methods for monocrystalline fused alumina
JB/T 9495.1-1999 Optical Crystals

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
GB/T 18910.62-2019 Liquid crystal display devices—Part 6-2:Measuring methods for liquid crystal display modules—Reflective type
GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals

机械电子工业部

JB 5203-1991 Single crystal corundum chemical analysis method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 6430-1986 The rule of type designation for crystal holders (enclosures)
GB/T 3951-1983 The rule of type designation of liquid crystal display devices
GB/T 1554-1995 Test method for crystallographic perfection of silicon by preferential etch techniques
GB 6627-1986 Designation for lumbered synthetic quartz crystal
GB 4702.9-1985 Chromium Metal Chemical Analysis Method Crystal Violet Spectrophotometric Determination of Antimony Content
GB/T 4061-1983 Polycrystalline silicon--Examination method--Assessment of sandwiches on cross-section by chemical corrosion
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 43724-2024 Test method for liquid crystal monomers
GB/T 4702.9-1985 Methods for chemical analysis of chromium metal; The crystal violet spectrophotometric method for the determination of antimony content
GB/T 6430-1986 The rule of type designation for crystal holders (enclosures)
GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques
GB/T 9532-2012 Designations for piezoelectric crystals
GB/T 4608-1984 Test for melting point of semicrystalline polymers;Optical method
GB/T 11297.12-2012 Test method for extinction ratio of optical crystal
GB/T 15292-1994 Measuring methods for thyristor Reverse conducting triode thyristor
GB/T 618-1988 Chemical reagent-General method for the determination of crystallizing point
GB/T 17007-1997 Measuring methods for insulated-gate bipolar transistor
GB/T 22453-2008 Non-linear optical borate crystal devices measuring method
GB 12275-1990 Quartz Crystal Oscillator Model Nomenclature
GB 4608-1984 Test for melting point of semicrystalline polymers－Optical method
GB/T 7896-1987 Testing method for optical; Grade synthetic quartz crystal
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 618-2006 Chemicalreagent - General method for the determination of crystallizing point
GB/T 7896-2008 Test method for optical grade synthetic quartz crystal
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
GB/T 4061-2009 Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion
GB　6627-1986 Artificial Quartz Crystal Rod Model Nomenclature
GB/T 6627-1986 Designation for lumbered synthetic quartz crystal
GB/T 12275-1990 The rule of type designation for quarz crystal oscillators
GB 618-1988 General method for determination of crystallization point of chemical reagents
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB 6627-1986 Designation for lumbered synthetic quartz crystal
GB/T 11295-1989 The rule of designation for laser crystal rods

Professional Standard - Petroleum

SY/T 6240-2016 Recommended practice for chemical analysis of barite
SY/T 6240-2008 Chemical analysis method of barite
SY 6240-2016 Recommended Practice for Chemical Analysis of Barite
SY/T 6240-1996 Chemical analysis method of barite

National Metrological Technical Specifications of the People's Republic of China

JJF(电子) 20-1982 Verification method of CR1A transistor digital ohmmeter
JJF(电子) 21-1982 Verification Method of JT-l Transistor Characteristic Graphic Instrument

Group Standards of the People's Republic of China

T/HNNMIA 62-2023 Chemical analysis methods for aluminum hydroxide seeds - Determination of oxalate - Ion chromatography
T/SDZBZZ 001-2022 Mold copper pipe of arc billet caster
T/ZSA 18-2020 Measuring method of viewing field optical characteristic for liquid crystal display devices
T/CAB 0180-2022 Measurement method for characteristic parameters of GAGG crystal and crystal array

Professional Standard - Non-ferrous Metal

YS/T 273.2-2006 Chemical analysis methods and physical properties of cryolite—Part 2:Determination of ignition loss
YS/T 785-2012 Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
YS/T 273.3-2012 Chemical analysis methods and physical properties of cryolitePart 3: Determination of fluoride content
YS/T 74.8-2010 Methods for chemical analysis of cadmium - Part 8: Determination of thallium content - Crystal violet spectrophotometry
YS/T 74.8-1994 Method for chemical analysis of cadmium Crystal violet spectrophotometric method for determination of thallium

Professional Standard - Building Materials

JC/T 1021.7-2007 Methods for chemical analysis of nonmetal mineral and rock Part 7:Methods for chemical analysis of barite

Professional Standard - Civil Aviation

MH/T 6102-2014 Standard practice for measuring intergranular attack or end grain pitting on metals caused by aircraft chemical processes

国家药监局

YY 0290.2-2021 Ophthalmic optics-Intraocular lenses- Part 2:Optical properties and test methods

Professional Standard - Medicine

YY 0290.2-2009 Ophthalmic implants—Intraocular lenses—Part 2:Optical properties and test methods
YY 0290.2-1997 Intraocular lenses―Part 2:Optical properties and their test methods

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 35118-2017 Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal
GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal

工业和信息化部

YS/T 273.3-2020 Chemical analysis methods and physical properties of cryolite一Part 3:Determination of fluoride content by distillation-thorium nitrate titration

Korean Agency for Technology and Standards (KATS)

KS L 2404-2010 Method for chemical analysis of crystal glass
KS L 2404-2020 Method for chemical analysis of crystal glass
KS L 2404-2010(2020) Method for chemical analysis of crystal glass
KS C IEC 61747-6:2005 Liquid crystal display devices－Part 6：Measuring methods for liquid crystal modules－Transmissive type
KS D 0258-2012 Test methods of crystalline defects in silicon by preferential etch techniques
KS C IEC 61747-6-2020 Liquid crystal display devices－Part 6：Measuring methods for liquid crystal modules－Transmissive type
KS C IEC 61747-6-2-2021 Liquid crystal display devices－Part 6－2：Measuring methods for liquid crystal modules－Reflective type
KS D 2505-1993 Methods for Chemical Analysis of Type Metal
KS B 5242-2001 Optical parallels
KS B 5242-1985 Optical parallels
KS D 0069-2002 Method of determining the crystallization temperatures of amorphous metals
KS D 0069-2002(2022) Method of determining the crystallization temperatures of amorphous metals
KS D 0069-2022 Method of determining the crystallization temperatures of amorphous metals
KS C 6024-2002 MEASURING METHODS FOR TRANSISTORS
KS C IEC 61747-6-2:2006 Liquid crystal display devices-Part 6-2:Measuring methods for liquid crystal modules-Reflective type
KS D 0069-2002(2017) Method of determining the crystallization temperatures of amorphous metals
KS D 2505-2003 METHODS FOR CHEMICAL ANALYSIS FOF TYPE METAL

SCC

ISO/IWA 43:2023 Glass types - Crystal glass, crystal and lead crystal - Specifications and test methods
CEI EN 61747-6-2:2012 Liquid crystal display devices Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
CEI EN 61747-30-1:2013 Liquid crystal display devices Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
DANSK DS/EN 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
DANSK DS/EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
DIN EN 61747-6:2004 Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type (IEC 61747-6:2004); German version EN 61747-6:2004

International Organization for Standardization (ISO)

PRF IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods
IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods
ISO/IEC 24744:2007 Software Engineering - Metamodel for Development Methodologies

British Standards Institution (BSI)

BS EN 61747-30-1:2012 Liquid crystal display devices. Measuring methods for liquid crystal display modules. Transmissive type
BS EN 61747-6:2004 Liquid crystal and solid-state display devices - Measuring methods for liquid crystal modules - Transmissive type
BS IEC 61747-30-5:2019 Liquid crystal display devices - Optical measuring methods of transmissive transparent LCD modules
BS EN 61747-6-2:2011(2012) Liquid crystal display devices Part 6 - 2 : Measuring methods for liquid crystal display modules — Reflective type
BS EN ISO 11979-2:2000 Ophthalmic implants - Intraocular lenses - Optical properties and test methods
BS EN ISO 11979-2:2014 Ophthalmic implants. Intraocular lenses. Optical properties and test methods
BS EN ISO 3262-5:1998 Extenders for paints - Specifications and methods of test - Natural crystalline calcium carbonate
BS 5050:1974 Methods of test for cryolite
BS 5050:1974(2011) Methods of test for Cryolite

RU-GOST R

GOST 27264-1987 Power bipolar transistors. Measurement methods
GOST 19014.0-1973 Crystal silicon. General requirements for methods of chemical analysis
GOST 18604.10-1976 Transistors bipolar. Input resistance measurement technique
GOST 18604.26-1985 Bipolar transistors. Methods of time parameters measurement
GOST 18604.23-1980 Bipolar transistors. Method for measuring combination frequencies
GOST 18604.20-1978 Transistors bipolar. Methods for measuring noise figure at low frequencies
GOST 18604.22-1978 Transistors bipolar. Methods for measuring collector-emitter and base-emitter saturation voltage
GOST 18604.15-1977 Bipolar microwave oscillator transistors. Techniques for measuring critical current
GOST 18604.2-1980 Transistors bipolar. Methods for measuring of static coefficient of current transmission
GOST 18995.5-1973 Organic chemical products. Methods for determination of freezing point

GOST

GOST 25734-1983 Alumina. Method for the crystallooptic determination of monocrystals in non metallurgical alumina

American Society for Testing and Materials (ASTM)

ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques

CENELEC - European Committee for Electrotechnical Standardization

EN 61747-6:2004 Liquid crystal and solid-state display devices Part 6: Measuring methods for liquid crystal modules Transmissive type
EN 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type

GSO

BH GSO IEC 61747-30-1:2022 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
BH GSO IEC 61747-6-2:2016 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
GSO IEC 61747-30-1:2021 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
GSO IEC 61747-6-2:2013 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type

Danish Standards Foundation

DS/EN 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
DS/EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type

Association Francaise de Normalisation

NF C93-547-6-2*NF EN 61747-6-2:2012 Liquid crystal display devices - Part 6-2 : measuring methods for liquid crystal display modules - Reflective type
NF EN 61747-30-1:2013 Liquid crystal display devices - Part 30-1: measurement methods for liquid crystal display modules - Transmissive type
NF EN 61747-6-2:2012 Liquid crystal display devices - Part 6-2: measurement methods for liquid crystal display modules - Reflex type
NF C93-547-30-1*NF EN 61747-30-1:2013 Liquid crystal display devices - Part 30-1 : measuring methods for liquid crystal display modules - Transmissive type
NF C93-547-6:2004 Liquid crystal and solid-state display devices - Part 6 : measuring methods for liquid crystal modules - Transmissive type.

German Institute for Standardization

DIN EN 61747-6-2:2012-02 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type (IEC 61747-6-2:2011); German version EN 61747-6-2:2011
DIN EN 61747-30-1:2013-03 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type (IEC 61747-30-1:2012); German version EN 61747-30-1:2012 / Note: DIN EN 61747-6 (2004-12) remains valid alongside this standard until 2...

European Committee for Electrotechnical Standardization（CENELEC）

EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type

International Electrotechnical Commission (IEC)

IEC 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
IEC 61747-6:2004 Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type
IEC 61747-6-2:2011/COR1:2012 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type; Corrigendum 1
IEC 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type

ES-UNE

UNE-EN 61747-30-1:2012 Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type (Endorsed by AENOR in October of 2012.)
UNE-EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type (Endorsed by AENOR in November of 2011.)

GM Daewoo

GMKOREA EDS-T-7112-2012 Eutectic measurement method

Japanese Industrial Standards Committee (JISC)

JIS C 7051:1974 Testing methods for reverse blocking triode thyristors
JIS B 7431:1977 Optical parallels
JIS H 7151:1991 Method of determining the crystallization temperatures of amorphous metals
JIS C 7030:1993 Measuring methods for transistors

TR-TSE

TS 2249-1976 PLASTICS r DETERMINATION OF MELTING TEMPERATURE OF SEMI - CRYSTALLINE POLYMERS , OPTICAL METHOD

IN-BIS

IS 4156-1967 Barite sampling method
IS 5813-1970 How to determine the crystallization point

Lithuanian Standards Office

LST EN 61747-6-2004 Liquid crystal and solid-state display devices. Part 6: Measuring methods for liquid crystal modules. Transmissive type (IEC 61747-6:2004)

Others: