GB/T 1555-2009 in English

SUPERSEDED

Testing methods for determining the orientation of a semiconductor single crystal

Issued on:2009-10-30
Implemented on:2010-06-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $150.00
$146.00

Standard No:	GB/T 1555-2009
Document status:	SUPERSEDED
Superseded by:	GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
Superseded on:	2024-03-01
Title in English:	Testing methods for determining the orientation of a semiconductor single crystal
Title in Chinese:	半导体单晶晶向测定方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2009-10-30
Implemented on:	2010-06-01
Superseding:	GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
ICS Classification:	29.045-Semiconducting materials
Chinese Classification:	H80-Semimetal and semiconductor material in general
Professional Classification:	GB-National Standard
Related Keywords:	single crystal scopethis standard x-ray diffraction orientation single crystal materials surface orientation optical pattern orientation
Related Topics:	single crystal Ingot Orienter Semiconductor gap measurement Cubic crystal Crystal orientation detection crystal semi-quantitative detection method Crystal Form and Crystal Plane half height crystal Crystal grain Variant Retargeting Crystal form detection method crystallization, degree crystal half height Organic semiconductor single crystal crystal monitor crystal structure method Crystallization detection method semi-qualitative semi-quantitative unit test methods and Die Half Height Crystal faces and orientations crystallinity crystal semi-crystalline dsc facet method Grain and half-grain Crystal orientation detection FWHM of single crystal Single Crystal Foil Crystallization detection method Crystal English Jingjing method aluminum crystal method of producing crystals Primary crystal Crystal orientation analysis Crystal orientation half peak grain Polycrystalline vs Single Crystal Single crystal standard crystal orientation How to determine the single crystal crystal crystal crystal orientation How to determine single crystal single crystal target thermal eutectic method of making crystals polycrystalline and monocrystalline Single Crystal Orienter Single crystal angle head Diode Laser Orientation crystal direction Crystals and grains eutectic properties single crystal + phase Semiconductor single crystal molecular crystal Crystals and grains How about single crystal and polycrystalline Multi-directional semi-crystalline and amorphous Liquid target single crystal molecular single crystal crystal direction crystal orientation xrd Crystal orientation index Crystal faces Crystalline family gb/t1555 Directional xrd test method Twin detection method How to detect single crystal single crystal surface crystal plane orientation Crack Jingjing Single crystal detection basis Crystals and grains grains and crystals Isotropic characteristics of semiconductors Crystal single crystal Semiconductors have an isotropic Semiconductor materials are isotropic Crystal direction concentration mesolattice Crystalline method Liquid target single crystal grains and crystals Silicon Single Wafer Orienter crystal growth crystal orientation method Single Crystal Bit Silicon single crystal orientation single chain single crystal Crystal grain xrd oriented crystal Crystallization Seed single crystal secondary crystallization organic single crystal semiconductor Organic semiconductor single crystal Single Crystal+ crystal plane single crystal quantification crystal plane principal direction of crystal Crystal orientation measuring machine semiconductor Crystal direction 2 GBT1555 GBT1555-2009 Formazan crystal How to determine single crystal and polycrystalline Orientation test Amorphous preparation method Semiconductor wafer basket USA One-way valve test method Preparation method of compound semiconductor Determination method of crystalline and amorphous Single crystal diffraction calibration method Lens curvature detection method Amorphous preparation method A common way to distinguish crystals from amorphous is Unit cell integral measurement method Antibody targeting methods How to obtain single crystal Crystal bulk density detection method Single wafer preparation method Crystal analysis hydrogenation method Crystal form analysis method of powder Crystal Form Methodology Three crystallization methods Semiconductor chemical purification methods gb/t 1555-2009 Methods for directional induction of mutations Crystal water detection method Standard single crystal for single crystal instrument Single crystal and polycrystalline analysis methods How to distinguish single crystals from polycrystalline gb/t1555 2009

《GB/T 1555-2009半导体单晶晶向测定方法》由TC203（全国半导体设备和材料标准化技术委员会）归口，TC203SC2（全国半导体设备和材料标准化技术委员会材料分会）执行，主管部门为国家标准化管理委员会。
本标准规定了半导体单晶晶向X 射线衍射定向和光图定向的方法。
本标准适用于测定半导体单晶材料大致平行于低指数原子面的表面取向。

Scope

This standard specifies the methods for X-ray diffraction orientation and optical pattern orientation of semiconductor single crystals. This standard applies to the determination of the surface orientation of semiconductor single crystal materials approximately parallel to the low-index atomic plane.

More samples: DL/T 368-2010 QC/T 942-2021 DL/T 5154-2012

Sample only — not a preview of GB/T 1555-2009

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