Crystal English

Crystal English, Total:256 items.

The international standard classification for "Crystal English" includes: Semiconducting materials , Other non-ferrous metals and their alloys , Steels with special magnetic properties , Thyristors , Non-metalliferous minerals , Materials for aluminium production , Refractories , Cadmium, cobalt and their alloys , Testing of metals in general , Glass products , Items of art and handicrafts , Testing of metals , Piezoelectric and dielectric devices , Equipment for the metallurgical industry , Chemical analysis of metals , Waxes, bituminous materials and other petroleum products , Other iron and steel products , Salts , Aromatic hydrocarbons , Watches , Starch and derived products , Clocks , Other products of non-ferrous metals , Other methods of testing of metals , Optics and optical measurements , Phenols , Physicochemical methods of analysis , Electric furnaces , Abrasives , Components and accessories for telecommunications equipment , Ophthalmic equipment , Cryogenic vessels , Non-destructive testing of metals , Measurement of electrical and magnetic quantities , Generalities. Terminology. Standardization. Documentation (Vocabularies) , Powder metallurgy , Aluminium products , Lead, zinc and tin products , Nuclear energy in general , Glass , Advanced ceramics , Road construction materials , Fiber and cables , Sugar. Sugar products. Starch , Corrosion of metals , Materials for aerospace construction , Flat steel products and semi-products , Aerospace electric equipment and systems .

The Chinese standard classification for "Crystal English" includes: Compound semiconductor material , Rare scattered metals and their alloys , Precision alloy , Elemental semiconductor material , Semimetal and semiconductor material in general , Semimetal , Power semiconductor device and parts , Graphite material , Other non-metal ore , Basic refractory , Rare refractory metals and their compounds , Industrial technical glass , Artistic handicrafts , Metal physical property test method , Quartz crystal and piezoelectric element , Ingot and blank casting equipment , Metallographic testing method , Building material raw material ore , Petroleum wax , High temperature alloy , Artificial lens , Basic standards and general methods for chemical additive , Coal tar processed products , Horology , Other fermented goods , Cutting tools , Rare metals and their alloys , Metal chemical property test method , Special electronic technology material , Optical Measurement , Chemical additive , Industrial electric heating equipment , Raw pharmaceutical material processing machinery and equipment , Material and component for instrument and meter , Grinding material and apparatus , Technical Management , Technical management , Technical management , Technical management , Technical management , Medical optical instrument and endoscope , Petrochemical and chemical industry engineering , Other petroleum products , Metal nondestructive testing method , Powder metallurgy material and product , Light metals and their alloys , Heavy metals and their alloys , Nuclear detector , Special glass , Optical communication equipment , Special ceramics , Inorganic salt , Processed sugar , Other light industry machinery , Basic standards for aviation and aerospace materials , Metal casting and forging materials used for aviation and aerospace , Time and Frequency Measurement , Other power equipment , Steel sheet and strip , Electronic components , Catalyst .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices
GB/T 12963-2022 Electronic-grade polycrystalline silicon
GB/T 4291-1999 Synthetic cryolite
GB/T 26762-2011 Crystalline fructose and solid fructose-glucose
GB/T 3069.2-2005 Method for the determination of the crystallization temperature of naphthalene
GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer
GB/T 25075-2010 Gallium arsenide single crystal for solar cell
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 31092-2022 Monocrystalline sapphire bar
GB/T 12633-1990 Terms for the measurements of the properties of the piezoelectric crystals
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 22779-2008 Liquid crystal displaying quartz clocks
GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells
GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon
GB/T 21952-2008 Polycrystalline diamond inserts tipped - Dimensions
GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display device
GB/T 20214-2006 Crystalline layered sodium disilicate
GB/T 20228-2006 Gallium arsenide single crystal
GB/T 8756-1988 Collection of metallographs on defects of crystalline germanium
GB/T 12963-1996 Polycrystalline silicon
GB/T 29506-2013 300 mm polished monocrystalline silicon wafers
GB/T 5238-2009e Monocrystalline germanium and monocrystalline germanium slices
GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
GB/T 29420-2012 Nd-doped vanadate laser crystal devices
GB/T 1663-2001 Plasticizers--Determination of crystallizing point
GB/T 41751-2022 Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
GB/T 31092-2014 Monocrystalline sapphire ingot
GB/T 3352-1994 Synthetic quartz crystal
GB/T 19345-2003 Amorphous and nanocrystalline soft magnetic alloy strips
GB/T 29757-2013 Reflective particles decorated glass
GB/T 19345.1-2017 Amorphous and nanocrystalline alloys―Part 1:Fe-based amorphous soft magnetic alloy strips
GB/T 42160-2022 Grain boundary diffusion neodymium iron boron permanent magnet materials
GB/T 6430-1986 The rule of type designation for crystal holders (enclosures)
GB/T 24177-2009 Standard test methods for characterizing duplex grain sizes
GB/T 3519-2008 Amorphous graphite
GB/T 30656-2014 Polished monocrystalline silicon carbide wafers
GB/T 11072-1989 Indium antimonide polycrystal, single crystals and as-cut slices
GB/T 4059-1983 Polycrystalline silicon; Examination method; Zone-melting on phosphorus under controlled atmosphere
GB/T 19346-2003 Measuring method of magnetic properties at alternative current for amorphousand nanocrystalline soft magnetic alloys
GB/T 25076-2010 Monocrystalline silicon of solar cell
GB/T 20229-2006 Gallium phosphide single crystal
GB/T 14999.7-2010 Test methods for grain sizes，primary dendrite spacing and microshrinkage of superalloy castings
GB/T 30858-2014 Polished mono-crystalline sapphire substrate product
GB/T 13843-1992 monocrystalline sapphire substrates
GB/T 28796-2012 Craft crystal decoration
GB/T 12964-2003 Monocrystalline silicon polished wafers
GB/T 11297.12-2012 Test method for extinction ratio of optical crystal
GB/T 15291-1994 Semiconductor devices Part 6 Thyristors
GB/T 12963-2009 Specification for Polycrystalline Silicon
GB/T 5238-2009(英文版) Monocrystalline germanium and monocrystalline germanium slices
GB/T 12962-2005 Monoccrystalline silicon
GB/T 4291-2007 Synthetic cryolite
GB/T 3710-2005 Method of determination for crystallizing point of technical phenol and phenic acid
GB/T 6394-2002 Metal - Methods for estimating the average grain size
GB/T 29421-2012 Vanadate birefringent crystal devices
GB/T 32188-2015 The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
GB/T 29055-2012 Multi-crystalline silicon wafer for solar cell
GB/T 6250-1986 Terms for liquid crystal displays
GB/T 22780-2008 Liquid crystal displaying quartz watches
GB/T 26072-2010 Germanium single crystal for solar cell
GB/T 16595-1996 Specification for a universal wafer grid
GB/T 7895-2008 Optical grade synthetic quartz crystal
GB/T 29054-2012 Solar-grade casting multi-crystalline silicon brick
GB/T 3519-1995 Amorphous graphite
GB/T 30118-2013 Single Crystal Wafers for Surface Acoustic Wave (SAW) Device Applications - Specifications and Measuring Methods
GB/T 5238-1995 Monocrystalline germanium
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
GB/T 24444-2009 Electroslag remelting mould
GB/T 29504-2013 300 mm monocrystalline silicon
GB/T 15292-1994 Measuring methods for thyristor Reverse conducting triode thyristor
GB 22160-2008 Food grade microcrystalline wax
GB/T 14843-1993 Lithium niobate single crystals
GB/T 12632-1990 General specification of single silicon solar cells
GB/T 7998-2005 Test method for intergranular corrosion of aluminium alloy
GB/T 20230-2006 Indium phosphide single crystal
GB/T 26564-2011 Magnesium aluminate spinel
GB/T 12962-2015 Monocrystalline silicon
GB/T 24206-2009 Determination of crystallized matter at 15 ℃ of washing oil

Group Standards of the People's Republic of China

T/ZZB 0328-2018 The glass-ceramic plate for induction cooker
T/IAWBS 016-2022 X-ray double crystal rocking curve FWHM test method for silicon carbide single wafer
T/ZZB 1927-2020 Automatic mono-silicon cutting machine
T/QGCML 1655-2023 Thin film transistor LCD
T/IAWBS 015-2021 Test method for full width at half maximum of double crystal X-ray rocking curve of Ga2O3 single crystal substrate
T/SZBSIA 007-2022 Semiconductor die bonder test specification
T/CPIA 0037-2022 Specifications for Photovoltaic Crystalline Wafers
T/CSTM 00190-2020 Composite lining plate used metal and glassceramic
T/ZZB 2534-2021 Microcrystallite inorganic thermal insulation mortar
T/WZSWSSH 004-2018 Synthesis spinel
T/SZBSIA 004-2022 LED Die bonder technical norm
T/SZBSIA 006-2022 Semiconductor di e bonder technical?norm
T/ZZB 0648-2018 200 mm heavily phosphorus-doped single crystalline Czochralski silicon polished wafers
T/CBCSA 36-2021 Corundum polycrystalline slab
T/CSTM 00316-2022 Optoelectric single crystals - Lithium tantalate single crystals for pyroelectric infrared detection
T/SZBSIA 005-2022 LED Die bonder test
T/ZZB 1587-2020 Annealing and crystallizing furnace for glass-ceramics
T/ZZB 2675-2022 Monocrystalline silicon as lapped wafers for TVS
T/CCIA 0007-2021 Wu Lan Cha Jing Mixed Feldspar for ceramics
T/CECA 48-2021 Quartz Crystal Microbalance Element
T/ZZB 0497-2018 Single crystal wafers for surface acoustic wave device applications
T/IAWBS 005-2018 6 inch polished monocrystalline silicon carbide wafers
T/NXCL 015-2022 Columnar polysilicon for silicon parts
T/GZBC 22-2019 Modeled crystal ornament
T/IAWBS 001-2021 Silicon carbide single crystal

Professional Standard - Machinery

JB/T 7619-1994 Test Method for Two-way Triple Pole Thyristors
JB/T 7401-1994 Optical flat
JB/T 7987-2012 Conventional abrasive — Microcrystalline fused alumina
JB/T 7996-2012 Conventional abrasive － Monocrystalline fuesd alumina
JB/T 4193-2013 Fast-switching Thyristors
JB/T 10789-2007 High pressure crystal growing funaces-TDR-GY-series high pressure crystal growing furnaces by liquid-encapsulated Czohralski method
JB/T 12068-2014 TDR-Z Germanium Mono-crystal Growing Furnace by Czochralski Method
JB/T 8950.2-1999 General thyristors with electric current higher than 100A
JB/T 9495.1-1999 Optical Crystals
JB/T 7402-1994 Optical parallel
JB/T 6084-2007 Triangle polycrystalline diamond for drilling tools
JB/T 11375-2013 Ultra-micro Crystal Projection Screen
JB/T 3235-2013 Testing Method for Abrasion Ratio of Polycrystalline Diamond
JB/T 10439-2004 Crystal growing furnaces TDR-series crystal growing furnaces by Czochralski method
JB/T 9495.2-1999 Measuring method for refractive index of optical crystals
JB/T 9495.3-1999 Measuring method for transmittance of optical crystal
JB/T 7987-1999 Common abrasive Microcrystalline alumina
JB/T 8758-1998 Criteria for Value Determination of Parameters of Thyristor
JB/T 9495.5-1999 Measuring method for scatter graininess of optical crystal
JB/T 20068-2005 Crystallizing machine
JB/T 11450-2013 Straight Shank Twist Drill with Brazed Polycrystalline Diamond
JB/T 7626-1994 Test method for reverse blocking triple pole thyristors
JB/T 5633-1991 Single-crystal furnace. Grading of energy consumption

Professional Standard - Electron

SJ 3243-1989 Indium phosphide single-crystal bar and wafers
SJ 2816.4-1987 Detail specification for (resistance-welded) crystal holders (enclosures) for Type J3A
SJ/Z 9158-1987 Temperature control unit for quartz crystal elements
SJ/T 9570.3-1995 Quality grading standard for quartz crystal oscillators
SJ/T 11203-1999 Terms for liquid crystal materials
SJ/T 11199-1999 Piezoelectric quartz crystal blank
SJ/Z 9155.2-1987 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
SJ/T 10639-1995 Quartz crystal unit terms
SJ 3241-1989 Gallium arsenide single-crystal bar and wafer
SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
SJ/T 10173-1991 TDA75 single crystalline silicon solar cell
SJ/T 10698-1996 Amorphous silicon reference solar cell
SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
SJ 20607-1996 Specification for molybdenate crystal
SJ 3245-1989 Methods for measuring dislocation of Indium phosphide single-crystal
SJ 1852-1981 Terms for quartz crystal controlled oscillators
SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
SJ/T 11505-2015 Sapphire single crystal polished wafers specification
SJ 20444-1994 Specification for Lithium Niobate singlecrystal
SJ 20638-1997 Specification for liquid crystal materials for TFT-LCD
SJ 52138.1-1995 Crystal unit,quartz,type JA 538,detail specification for
SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
SJ 20606-1996 Specification for tellurium dioxide single crystal
SJ/Z 2655-1986 Collection of single crystal Germaninm defects
SJ 3118-1988 Wafer holder

Professional Standard - Medicine

YY 0290.9-2010 Ophthalmic implants—Intraocular lenses—Part 9:Multifocal intraocular lenses
YY 0290.10-2009 Intraocular lenses—Part 10:Phakic intraocular lenses
YY/T 0295.11-1997 Capsulotomy forceps

Professional Standard - Petrochemical Industry

SH/T 0013-1999 Microcrystalline wax
SH/T 0013-2008 Microcrystalline wax
SH/T 0340-1992 Determination method for crystallinity of NaY molecular sieve
SH/T 1491-1992 Determination of crystallization point of high-purity hydrocarbons
SH/T 3416-2005 Double pipe crystallizers in petrochemical industry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 26069-2022 Annealed monocrystalline silicon wafers
GB/T 41325-2022 Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit
GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals
GB/T 19346.3-2021 Methods of measurement of amorphous and nanocrystalline alloys-Part 3:AC magnetic properties of Fe-based amorphous strip using a single sheet specimen
GB/T 28796-2021 Craft crystal decoration
GB/T 20230-2022 Indium phosphide single crystal
GB/T 38977-2020 Nanometer grain cemented carbide rod
GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
GB/T 40123-2021 Aluminium and aluminium alloy billet with high purity and fine grain
GB/T 20228-2021 Gallium arsenide single crystal
GB/T 39131-2020 Terms and definitions of synthetic crystal materials
GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
GB/T 20229-2022 Gallium phosphide single crystal

Hebei Provincial Standard of the People's Republic of China

DB13/T 1633-2012 Solar Grade Polysilicon Wafer
DB13/T 5092-2019 General Technical Requirements for Square Seed Crystals for Solar-Grade Monocrystalline Silicon Ingots
DB13/T 1631-2012 Solar Grade Polysilicon Ingot
DB13/T 1828-2013 Solar grade monocrystalline silicon wafer
DB13/T 1235-2010 Determination method of crystallization point of chemical products
DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer

Professional Standard - Non-ferrous Metal

YS/T 42-2010 Lithium tantalate single crystals
YS/T 225-2010 Microcrystalline zinc plate for zincography
YS/T 489-2005 Grain-refining aluminium ingots

Professional Standard - Building Materials

JC/T 2129-2012 Laminated electron - switchable visibility - control glass functioned by liquid crystal material
JC/T 872-2000 Glass - ceramics for building decoration
JC/T 2151-2012 Test method for ceramic whiskers morphology
JC/T 2025-2010 Lead magnesium niobate titanate (PMNT) piezoelectric single crystals
JC/T 994-2006 Glass - ceramics & Ceramics Combined Tile
JC/T 2157-2012 Low-expansion transparent glass-ceramics
JC/T 2150-2012 Potassium (sodium) titanate whiskers
JC/T 2017-2010 Lead fluoride crystal
JC/T 2097-2011 Glass-ceramics plate for industrial application
JC/T 2148-2012 Langasite piezoelectric crystal
JC/T 2283-2014 Slag glass-ceramics pipes
JC/T 1048-2007 Fused quartz crucibles for single crystal silicon growth

Professional Standard - Chemical Industry

HG/T 3251-2010 Crystal aluminum chloride for industrial use
HG/T 3251-2002 Crystal aluminum chloride for industrial use
HG/T 4703-2014 Zinc oxide whiskers
HG/T 3251-1989 aluminum chloride for industrial use

Professional Standard - Light Industry

QB/T 4350-2012 Radio-controlled Liquid Crystal Displaying Quartz Watches
QB/T 1173-1991 Monocrystal rock sugar
QB/T 1174-1991 Multicrystal rock sugar
QB/T 1173-2002 Monocrystal rock sugar
QB/T 1909-2012 Analogue and liquid crystal digital quartz watches
QB/T 1790-1993 crystal rose
QB/T 3678-1999 Techinical Conditions for Crystallizing Tank

Professional Standard - Aviation

HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method
HB 5255-1983 Determination of Aluminum Alloy Intercrystalline Corrosion and Intergranular Corrosion Tendency
HB 7762-2005 Specification for master alloys directionally solidfied and single crystal superalloys for aeroengines
HB 20057-2011 Test methods for estimating grain size of superalloy investment castings

Taiwan Provincial Standard of the People's Republic of China

CNS 13624-1995 Test Methods for Crystallographic Perfection of Gallium Arsenside by Molten Potassium Hydroxide(KOH)Etch Technique
CNS 12253-1988 Quartz Crystal Units For Oscillators (For 1 MHz -- 125 MHz)
CNS 12254-1988 Quartz Crystal Units for Oscillators (for 200-1000 kHz)
CNS 12506-1989 General Rule of Liquid Crystal Display Panel
CNS 12255-1988 Synthetic Quartz Crystal
CNS 916-1957 Method of Test for Crystallization of Creosote Oil
CNS 12257-1988 Crystal Filters
CNS 13726-1996 Grain fixation strength test method
CNS 5389-1980 Aluminium Potassium Sulphate Dodecahydrate (Photographic Grade)
CNS 9504-1982 Determination of crystal grain size of copper and copper alloys
CNS 5152-1980 Crystalline Sodium Thiosulphate (Photographic Grade)
CNS 11763-1986 Transistor Megaphones
CNS 12256-1988 Ovens for Quartz Crystal Units

Shaanxi Provincial Standard of the People's Republic of China

DB61/T 1713-2023 Geographical indication product Lintong Huojing Persimmon
DB61/T 1142.35-2018 Tomato Regency T2

National Metrological Verification Regulations of the People's Republic of China

JJG 28-2019 Verification Regulation of Optical Flats
JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG 28-2000 Verification Regulation of plane Optical Flat
JJG(电子) 01002-1989 QF16101GAJF 5MHz Voltage Controlled Crystal Oscillator Verification Regulations
JJG 181-2005 Verification Regulation of Quartz Crystal Frequency Standards

Professional Standard - Ferrous Metallurgy

YB/T 078-2011 Slab continuous casting moulds
YB/T 072-2011 Billet and bloom and round continuous casting moulds
YB/T 5224-1993 Grain oriented silicon steel strip
YB/T 072-1995 Billet crystallizer technical conditions
YB/T 5148-1993 Metal-methods for Estimating the Average Grain Size
YB/T 4290-2012 Test Methods for Estimating the Largest Grain Observed in a Metallographic Section (ALA Grain Size)
YB/T 078-1995 Technical conditions of slab crystallizer

Professional Standard - Geology

DZ 66-1988 Craft Crystal Technical Requirements
DZ 65-1988 Smelting Crystal Technical Requirements

Fujian Provincial Standard of the People's Republic of China

DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)

Hubei Provincial Standard of the People's Republic of China

DB42/T 883-2013 Cultivation technical regulation of Jinjing pear

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 6394-2017 Metal - Methods for estimating the average grain size

Guangxi Provincial Standard of the People's Republic of China

DB45/T 1699-2018 Geographical indication product Xilin Jiangjing

Military Standard of the People's Republic of China-General Armament Department

GJB 1648-2-2011 Genenral specification for crystal oscillators

Jiangsu Provincial Standard of the People's Republic of China

DB3208/T 116-2019 Greenhouse cultivation technical regulations for Huangjing watermelon
DB32/T 3922-2020 Crystal products e-commerce service specification

Professional Standard - Aerospace

QJ 3047-1998 Detailed Specifications of Z602 Voltage Controlled Crystal Oscillator
QJ 3046-1998 Detailed Specifications of Z601 Voltage Controlled Crystal Oscillator

Professional Standard - Coal

MT 37-1980 Crystallization Aluminum Chloride Used for Investment Casting

Japanese Industrial Standards Committee (JISC)

JIS R 7651:2007 Measurement of lattice parameters and crystallite sizes of carbon materials
JIS C 6704:2009 Synthetic quartz crystal
JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

Association Francaise de Normalisation

NF B30-004:1974 GLASS.CRYSTAL,CRYSTAL GLASS,CRYSTALLIN.
NF B30-004:2023 Cristal, cristallin et verre sonore

Korean Agency for Technology and Standards (KATS)

KS B 5241-1985 Optical flats
KS B 5241-2001 Optical flats

American National Standards Institute （ANSI)

ANSI Z80.13-2007 Phakic Intraocular Lenses