GB/T 11072-2009 in English
VALIDIndium antimonide polycrystal,single crystals and as-cut slices
- Issued on:2009-10-30
- Implemented on:2010-06-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$136.00
《GB/T 11072-2009锑化铟多晶、单晶及切割片》由TC203(全国半导体设备和材料标准化技术委员会)归口,主管部门为国家标准化管理委员会。
本标准规定了锑化铟多晶、单晶及单晶切割片的产品分类、技术要求和试验方法等。
本标准适用于区熔法制备的锑化铟多晶及直拉法制备的供制作红外探测器和磁敏元件等用的锑化铟多晶、单晶及切割片。
Scope
This standard specifies the product classification, technical requirements, test methods, etc. It is suitable for indium antimonide polycrystals prepared by zone melting method and indium antimonide polycrystals, single crystals and cut sheets prepared by Czochralski method for making infrared detectors and magnetic sensitive elements.

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