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Database: 365,228(8 Aug 2026)

Three-chip board machine

Three-chip board machine, Total:322 items.

The international standard classification for "Three-chip board machine" includes: Semiconducting materials , Measurement of electrical and magnetic quantities , Other non-ferrous metals and their alloys , Insulating gases , Braking systems , Thyristors , Woodworking machines , Glass products , Flat steel products and semi-products , Cans. Tins. Tubes , Barrels. Drums. Canisters , Testing of metals , Piezoelectric and dielectric devices , Powder metallurgy , Components and accessories for telecommunications equipment , Automatic controls for household use , Other iron and steel products , Lead, zinc and tin products , Chipless working equipment in general , Forging equipment. Presses. Shears , Abrasives , Materials for aerospace construction , Other organic chemicals , Glass , Advanced ceramics , Electricity. Magnetism. Electrical and magnetic measurements , Cooking ranges, working tables, ovens and similar appliances , Other methods of testing of metals .

The Chinese standard classification for "Three-chip board machine" includes: Elemental semiconductor material , Semimetal and semiconductor material in general , Compound semiconductor material , Metal physical property test method , Rare scattered metals and their alloys , Semimetal , Other non-metal mine product , Dedicated processing equipment , Power semiconductor device and parts , Woodworking machine and machine tool , Industrial technical glass , Steel sheet and strip , Packaging material and container , Special electronic technology material , Quartz crystal and piezoelectric element , Cutting tools , Technical Management , Saw timber, artificial board machinery and tools , Powder metallurgy material and product , Other power equipment , Heavy metals and their alloys , Metal forming machinery , Grinding material and apparatus , Basic standards for aviation and aerospace materials , Organic chemicals in general , Special glass , Special ceramics , Radio Measurement , Cooking appliances, basic standards and general methods , Office supplies and office implements .


国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 11094-2020 Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
  • GB/T 12964-2018 Monocrystalline silicon polished wafers
  • GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers
  • GB/T 41325-2022 Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit
  • GB/T 26069-2022 Annealed monocrystalline silicon wafers
  • GB/T 16595-2019 Specification for a universal wafer grid
  • GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
  • GB/T 26071-2018 Monocrystalline silicon wafers for solar cells
  • GB/T 19346.3-2021 Methods of measurement of amorphous and nanocrystalline alloys-Part 3:AC magnetic properties of Fe-based amorphous strip using a single sheet specimen
  • GB/T 16596-2019 Specification for establishing a wafer coordinate system
  • GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer
  • GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Group Standards of the People's Republic of China

Professional Standard - Electron

  • SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
  • SJ/T 31092-1994 Requirements of Readiness and Methods of Inspection and Assessment for NC Wafer Cutting (Scribing) Machines
  • SJ/T 11199-1999 Piezoelectric quartz crystal blank
  • SJ 3118-1988 Wafer holder
  • SJ 2592-1985 Quartz crystal monolithic filters for Type LSP10.7MA(~E)
  • SJ/T 31065-1994 Requirements of readiness and methods of inspection and assessment for Type 24 NC wafer buffing machines
  • SJ 3241-1989 Gallium arsenide single-crystal bar and wafer
  • SJ/T 11505-2015 Sapphire single crystal polished wafers specification
  • SJ/T 31091-1994 Requirements of Readiness and Methods of Inspection and Assessment for Wafer Slicers
  • SJ 3243-1989 Indium phosphide single-crystal bar and wafers
  • SJ 2572-1985 Single crystal silicon rods and wafers for solar cells

Professional Standard - Forestry

未注明发布机构

Professional Standard - Ferrous Metallurgy

  • YB 1603-1983 Monocrystalline silicon as cut slices and lapped slices
  • YB/T 4070.1-1992 Specifications for Metal Shearing Blades Shears and Shearing Machine Blades
  • YB/T 078-2024 Slab casting mold
  • YB/T 078-1995 Technical conditions of slab crystallizer
  • YB/T 078-2011 Slab continuous casting moulds
  • YB/T 4070.1-2006 Technical specifications of blade for metal shearing blades for plate shearing machine and clipping machine

Professional Standard - Non-ferrous Metal

Professional Standard - Agriculture

Professional Standard - Machinery

Hebei Provincial Standard of the People's Republic of China

Yunnan Provincial Standard of the People's Republic of China

林业部

  • LY 1015-1991 Saw blade reciprocating cutting machine precision
  • LY 1014-1991 Saw blade reciprocating panel cutting machine parameters

工业和信息化部

Military Standard of the People's Republic of China-General Armament Department

  • GJB 8359-2015 Specification for medium-thick film S0I wafers for microelectromechanical systems and power devices
  • GJB 10308-2021 Specification for precision castings of equiaxed superalloy turbine guide blades for aeroengines
  • GJB 2917A-2018 Indium Phosphide Single Wafer Specification
  • GJB 3076-1997 Gallium Phosphide Single Chip Specification
  • GJB 3076A-2021 Gallium Phosphide Single Chip Specification
  • GJB 10342-2021 Specification for polished indium antimonide single crystal wafers
  • GJB 2917A-2004 Indium Phosphide Single Wafer Specification
  • GJB 2917-1997 Indium Phosphide Single Wafer Specification
  • GJB 10343-2021 Specification for polished gallium antimonide single crystal wafers

Professional Standard - Aviation

  • HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method
  • HB 3639-1985 Spring Clip Plate
  • HB 3629-1985 Three-layer Three-row Slip Board
  • HB 3630-1985 Three-layer Three-row Slip Board

Professional Standard - Chemical Industry

  • HG/T 4183-2011 Polarizing film for Liquid Crystal Display (LCD)
  • HG/T 4357-2012 Polarizer for the Thin Film Transistor -Liquid Crystal Display (TFT-LCD)

Professional Standard - Building Materials

  • JC/T 2343-2015 Single crystal alumina tube prepared by edge-defined film-fed crystal growth
  • JC/T 2097-2011 Glass-ceramics plate for industrial application

Professional Standard - Railway

Taiwan Provincial Standard of the People's Republic of China

National Metrological Verification Regulations of the People's Republic of China

  • JJG 48-2004 Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity

Professional Standard - Aerospace

  • QJ 1000.128-1986 Machine tool fixture parts and components process card support plate
  • QJ/Z 131.46-1984 Machine Tool Fixture Parts Process Card Atlas Guide Plate Process Card
  • QJ/Z 131.45-1984 Machine Tool Fixture Parts Process Card Atlas Guide Plate Process Card
  • QJ/Z 131.77-1984 Machine Tool Fixture Parts Process Card Atlas Press Plate Process Card
  • QJ/Z 131.75-1984 Machine Tool Fixture Parts Process Card Atlas Press Plate Process Card

Professional Standard - Light Industry

Sichuan Provincial Standard of the People's Republic of China

Professional Standard - Coal

  • MT 478-1996 Flameproof three-phase asynchronous motor for YBS series scraper conveyor
  • MT/T 478-1996 Flameproof……in YBS series scraper conveyor Three-phase asynchronous motors

Professional Standard - Education

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 19346.2-2017 Methods of measurement for amorphous and nanocrystalline alloys--Part 2: Lamination factor of amorphous alloy strips

Society of Automotive Engineers (SAE)

  • SAE AMS7851B-1995 FOIL, SHEET, STRIP, AND PLATE, COLUMBIUM ALLOY 10W - 2.5Zr Recrystallized
  • SAE AMS7851D-2013 Columbium (Niobium) Alloy Foil, Sheet, Strip and Plate, 10W 2.5Zr Recrystallized
  • SAE AMS4375L-2011 Sheet and Plate, Magnesium Alloy 3.0Al - 1.0Zn - 0.20Mn (AZ31B-0) Annealed and Recrystallized (UNS M11311)

International Electrotechnical Commission (IEC)

UNKNOWN

  • YB 1603-83 Silicon single crystal cutting discs and grinding discs
  • YB 4070.1-92 Metal Shearing Blades Technical Conditions Shearing and Shearing Machine Blades
  • YB 4070.1-1992 Metal Shearing Blades Technical Conditions Shearing and Shearing Machine Blades

British Standards Institution (BSI)

  • BS EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
  • BS 4361-33:1990 Woodworking machines. Nomenclature for veneer slicing machines

German Institute for Standardization

  • DIN V VDE V 0126-18-3:2007 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
  • DIN 41619:1983 Sectional specification for rotary wafer switches for telecommunication

Defense Logistics Agency

International Organization for Standardization (ISO)

  • ISO 1780:1984 Cinematography; Motion-picture camera cartridge, 8 mm Type S Model I; Aperture, camera aperture profile, film position, pressure pad and pressure pad flatness; Dimensions and specifications
  • ISO 9558:1989 Woodworking machines; veneer slicing machines; nomenclature
  • ISO 7918:1995 Forestry machinery - Portable brush-cutters and grass-trimmers - Cutting attachment guard dimensions

GSO

Danish Standards Foundation

  • DS/EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing

Lithuanian Standards Office

  • LST EN 50513-2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing

RO-ASRO

Korean Agency for Technology and Standards (KATS)

VDE - VDE Verlag GmbH@ Berlin@ Germany

  • VDE 0126-18-2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing; German version EN 50513:2009

SE-SIS

RU-GOST R

  • GOST 17728-1980 Thre- and four-roller sheet bending machines. Normes of accuracy
  • GOST 10664-1982 Three-and four-roller sheet bending machines. Parameters
  • GOST 19138.3-1985 Triode thyristors. Method for measuring turn-off time
  • GOST 158-1974 Knife sections ledger plates and knife backs for cutter bars of agricultural machines. Specifications

SCC

  • 08/30176109 DC BS EN 50513. Solar wafers. Data sheet and product information for crystalline silicon wafers for solar cell manufactruring
  • BS 3490:1962 Specification for sizes of industrial X-ray film (including film for crystallography)

AENOR

  • UNE-EN 50513:2011 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
  • UNE 27113:1974 CARGO TRIANGULAR PLATES.

AIA/NAS - Aerospace Industries Association of America Inc.

CZ-CSN

ZA-SANS

Aerospace Industries Association/ANSI Aerospace Standards

VN-TCVN

  • TCVN 4751-1989 Three-and four-roller sheet bending machines.Normes of accuracy

JP-JEITA

GOSTR

  • GOST 9347-1974 Board for gaskets and gaskets cut of it. Specifications

Japanese Industrial Standards Committee (JISC)

  • JIS C 7071:1988 General rule of liquid crystal display panel
  • JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods
  • JIS H 7152:1996 Methods of measurement of the magnetic properties of amorphous metals by means of a single sheet tester
  • JIS C 7072:1988 Measuring methods for liquid crystal display panels

Association Francaise de Normalisation

  • NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
  • NF C57-203*NF EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing.
  • NF B54-161-3:1997 Plywood. Specifications. Part 3 : requirements for plywood for use in exterior conditions.

GM North America

IN-BIS

  • IS 3191-1968 Sampling methods for cryolite and aluminum trifluoride
  • IS 12099-1987 Specification for triangular polishing blocks for floor polishing machines

BR-ABNT

API - American Petroleum Institute

IEC - International Electrotechnical Commission

  • PAS 62276-2001 Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method (Edition 1.0)

European Committee for Standardization (CEN)