JJG 48-2004 in English

Name: JJG 48-2004 English Version
Brand: China Standards Store
SKU: JJG48-2004-EN
Availability: InStock
Rating: 4.9 (128 reviews)

SUPERSEDED

Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity

Issued on:2004-09-21
Implemented on:2005-03-21
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $270.00
$262.00

Standard No:	JJG 48-2004
Document status:	SUPERSEDED
Superseded by:	JJF 1760-2019 Calibration Specification for Standard Slices of Single Crystal Silicon Resistivity
Superseded on:	2020-03-05
Title in English:	Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity
Title in Chinese:	硅单晶电阻率标准样片检定规程
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2004-09-21
Implemented on:	2005-03-21
Superseding:	JJG 48-1990 Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity
ICS Classification:	17.220-Electricity. Magnetism. Electrical and magnetic measurements
Chinese Classification:	A56-Radio Measurement
Related Keywords:	single crystal silicon resistivity verification regulation standard slice slice resistivity
Related Topics:	Resistivity Transmittance standard sheet Resistivity test standard and Crystallization rate standard silicon wafer sample crystal Crystallization rate, Resistivity standard sheet Detection of single crystal silicon Resistivity standard sheet Silicon steel sheet standard sample Silicon Wafer Resistivity Measurement bet standard Resistance standard iec Resistivity standard sample Single crystal silicon inspection Standard transmittance sheet Electrode resistivity Wafer Diversity Single crystal silicon peak Standard fluorescent sample sheet Electrode Powder Resistivity Three-chip board machine How to detect single crystal silicon three chips Sample rate unit Crystal core 48 samples Standard cards are different xrd crystal sample preparation Sampling resistor Resistivity sample Mill-like twins Sampling resistor Resistance mark Crystallinity+standard sample+ Standard sample volume resistance standard Electrode Body Resistivity Standard cell Standard silicon capacitor Silicon Single Wafer Orienter Silicon single crystal single chain single crystal Wafer sample box electricity rate Standard fluorescent sample sheet platelet cluster Single crystal silicon target Resistivity and resistance of silicon wafers Twin pattern calibration HRTEM standard lattice Standard sample spectrum picture Electronic silicon single crystal National standard resistivity test Sheet standard sample cutter National standard monocrystalline silicon Shelf life of conductivity standard samples GaAs resistivity standard sample calibration Standard writing method for conductivity unit Silicon single crystal resistivity standard Conductive silicon carbide single wafer resistivity test Monocrystalline Silicon International Single crystal silicon seed crystal standard project establishment Monocrystalline silicon quality Monocrystalline silicon Japan Standard silicon cell efficiency parameters Single wafer preparation method Chip resistor military standard Single crystal electrical properties Search for crystal standard cards Standard single crystal for single crystal instrument Resistivity curve normalization Standard Resistivity Solutions

本规程适用于硅单晶电阻率标准样片的首次检定、后续检定和使用中的检验。

More samples: QC/T 942-2021 GB 18306-2015 JJG 21-2008

Sample only — not a preview of JJG 48-2004

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