standard silicon wafer
standard silicon wafer, Total:44 items.
The international standard classification for "standard silicon wafer" includes: Electricity. Magnetism. Electrical and magnetic measurements , Semiconducting materials .
The Chinese standard classification for "standard silicon wafer" includes: Radio Measurement , Elemental semiconductor material , Compound semiconductor material , Semimetal and semiconductor material in general .
National Metrological Verification Regulations of the People's Republic of China
- JJG 48-1990 Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity
- JJG 48-2004 Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity
National Metrological Technical Specifications of the People's Republic of China
- JJF 1760-2019 Calibration Specification for Standard Slices of Single Crystal Silicon Resistivity
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers
- GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer
- GB/T 26071-2018 Monocrystalline silicon wafers for solar cells
- GB/T 29506-2013 300 mm polished monocrystalline silicon wafers
- GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
- GB/T 12964-2003 Monocrystalline silicon polished wafers
- GB/T 12965-1996 Monocrystalline silicon as cut slices and lapped slices
- GB/T 30656-2014 Polished monocrystalline silicon carbide wafers
- GB/T 29508-2013 300 mm monocrystalline silicon as cut slices and grinded slices
- GB/T 30656-2023 Polished monocrystalline silicon carbide wafers
- GB/T 26065-2010 Specification for polished test silicon wafers
- GB/T 12964-2018 Monocrystalline silicon polished wafers
- GB/T 29055-2012 Multi-crystalline silicon wafer for solar cell
- GB/T 26069-2022 Annealed monocrystalline silicon wafers
- GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices
Hebei Provincial Standard of the People's Republic of China
- DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer
- DB13/T 1633-2012 Solar Grade Polysilicon Wafer
- DB13/T 1828-2013 Solar grade monocrystalline silicon wafer
Professional Standard - Non-ferrous Metal
- YS/T 1167-2016 Monocrystalline silicon etched wafers
Professional Standard - Ferrous Metallurgy
- YB 1603-1983 Monocrystalline silicon as cut slices and lapped slices
Group Standards of the People's Republic of China
- T/ZZB 2675-2022 Monocrystalline silicon as lapped wafers for TVS
- T/CPIA 0037-2022 Specifications for Photovoltaic Crystalline Wafers
- T/SZBX 118-2023 Monocrystalline silicon wafers for solar cells
- T/JSAS 015-2021 Monocrystalline silicon solar cells
- T/CEC 290-2019 Technical Requirements for Back Contact Single Crystal Wafer
Professional Standard - Electron
- SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
- SJ/T 10698-1996 Amorphous silicon reference solar cell
未注明发布机构
- JIS H 0602:1990 Testing Method of Resistivity for Silicon Crystals and Silicon Wafers with Four-Point Probe
American Society for Testing and Materials (ASTM)
- ASTM F1726-97 Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers
- ASTM F951-01 Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
- ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
- ASTM F1239-94 Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
German Institute for Standardization
- DIN V VDE V 0126-18-3:2007 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
- DIN V VDE V 0126-18-3:2007-06 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
- DIN V VDE V 0126-18-5:2007-06 Solar wafers - Part 5: Process for measuring the electrical resistance of silicon wafers
UNKNOWN
- YB 1603-83 Silicon single crystal cutting discs and grinding discs
Semiconductor Equipment and Materials International (SEMI)
- SEMI M55-0308-2008 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON CARBIDE WAFERS
Korean Agency for Technology and Standards (KATS)
- KS D 0261-2012(2017) Visual inspection for silicon wafers with specular surfaces
Association Francaise de Normalisation
- NF C57-203*NF EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing.
Military Standards (MIL-STD)
- MIL MIL-M-38510/108-1976 MICROCIRCUITS, LINEAR, TRANSISTOR ARRAYS, MONOLITHIC SILICON (S/S BY MIL-M-38510/108A)
British Standards Institution (BSI)
- BS EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
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