Electrode Body Resistivity
Electrode Body Resistivity, Total:81 items.
The international standard classification for "Electrode Body Resistivity" includes: Semiconducting materials , Testing of metals , Copper products , Other insulating materials , Insulating gases , Optoelectronics. Laser equipment , Testing of metals in general , Powder metallurgy , Insulating materials in general , Electricity. Magnetism. Electrical and magnetic measurements .
The Chinese standard classification for "Electrode Body Resistivity" includes: Semimetal and semiconductor material in general , Metal physical property test method , Heavy metals and their alloys , Electrical insulating material and its products , Electrotechnical material and universal parts in general , Semiconductor emitting device , Semimetal and semiconductor material analysis method , Special electronic technology material , Radio Measurement , Microwave and millimeter wave diode and triode .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1410-1989 Methods of test for volume resistivity and surface resistivity of solid insulating materials
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
- GB/T 11073-1989 Standard method for measuring radial resistivity variation on silicon slices
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 31838.2-2019 Solid insulating materials—Dielectric and resistive properties—Part 2: Resistive properties (DC methods)—Volume resistance and volume resistivity
- GB/T 11073-2007 Standard method for measuring radial resistivity variation on silicon slices
- GB/T 33970-2017 AI2O3dispersion strengthened copper sheet for resistance welding electrode
- GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge
- GB/T 6616-1995 Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
- GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
- GB/T 1410-2006 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
- GB/T 36356-2018 Technical specification for power light-emitting diode chips
- GB/T 45324-2025 Determination of powder resistivity for cathode materials of lithium ion battery
Group Standards of the People's Republic of China
- T/CPIA 0051-2023 Crystalline silicon photovoltaic cell metal electrode contact resistivity test method Transmission Line Model Method (TLM)
- T/CEMIA 028-2022 Specification for surface electrode paste for use in chip resistors
- T/CEMIA 027-2022 Specification for back electrode paste for use in chip resistors
National Metrological Verification Regulations of the People's Republic of China
- JJG 48-2004 Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity
- JJG 48-1990 Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity
Professional Standard - Electron
- SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
- SJ/T 11398-2009 Technical specification for power light-emitting diode chips
National Metrological Technical Specifications of the People's Republic of China
- JJF 1760-2019 Calibration Specification for Standard Slices of Single Crystal Silicon Resistivity
Guizhou Provincial Standard of the People's Republic of China
- DB52/T 843-2013 RR6363 High Power Chip Thick Film Fixed Resistor
未注明发布机构
- JIS H 0602:1990 Testing Method of Resistivity for Silicon Crystals and Silicon Wafers with Four-Point Probe
Taiwan Provincial Standard of the People's Republic of China
- CNS 14811-2004 Method of test for field measurement of soil resistivity using the Wenner four-electrode method
IPC - Association Connecting Electronics Industries
- IPC TM-650 5.5.4.11-1998 Test Coupon J and K - Conductor Resistivity
- IPC TM-650 5.5.4.12-1998 Test Coupon L - Line Resistivity
- IPC TM-650 5.5.4.9-1998 Test Coupon G - Via Resistivity
- IPC TM-650 2.5.17E-1998 Volume Resistivity and Surface Resistance of Printed Wiring Materials
Defense Logistics Agency
- DLA A-A-59742-2002 INDUCTOR, CHIP, POWER, LOW RESISTANCE, SURFACE MOUNT
- DLA A-A-59742 VALID NOTICE 1-2011 Inductor, Chip, Power, Low Resistance, Surface Mount
- DLA QPL-49465-16-2006 RESISTORS, FIXED, METAL ELEMENT (POWER TYPE), VERY LOW RESISTANCE VALUES, GENERAL SPECIFICATION FOR
- DLA DSCC-DWG-04032 REV A-2006 RESISTOR, CHIP, FIXED, FILM, LOW VALUES, HIGH POWER, 1.5 WATTS, STYLE 2512
Society of Automotive Engineers (SAE)
- SAE AIR1404 DC Resistivity Vs RF Impedance of EMI Gaskets
PL-PKN
- PN T01504 ArkusZ26-1974 Transislors rbb' measuremen?s
Korean Agency for Technology and Standards (KATS)
- KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS C IEC 60093-2017 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
- KS C IEC 60093:2014 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
- KS C IEC 60093-2014 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
- KS C 2603-1980 Testing Method for Conductor-Resistance and Resistivity of Metallic Resistance materials
- KS C 2603-2020 Testing Method for Conductor-Resistance and Resistivity of Metallic Resistance materials
- KS C 2603-1980(2020) Testing Method for Conductor-Resistance and Resistivity of Metallic Resistance materials
- KS C 0256-2002(2017) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
International Electrotechnical Commission (IEC)
- IEC 60093:1980 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
- IECQ CS 033200-TW0007-2021 High Power Current Sensing Chip Resistors (RLP Series)
- IEC 60093:1958 Recommended methods of test for volume and surface resistivities of electrical insulating materials
SE-SIS
- SIS SS IEC 93:1983 Methods of test for volume résistivity and surface resistivityof solid electrical insulating materials
German Institute for Standardization
- DIN 51919:1999 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method; solid materials
- DIN 51919:2013 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method - Solid materials
- DIN 51919 E:2012-06 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method - Solid materials
- DIN 51919:1999-12 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method; solid materials
- DIN 51919:2013-05 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method - Solid materials
- DIN 51919 E:2012 Draft Document - Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method - Solid materials
British Standards Institution (BSI)
- BS 6233:1982 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
Comitato Elettrotecnico Italiano
- CEI 15-23:1997 Methods for measuring the volume and surface resistivity of solid electrical insulating materials
Association Francaise de Normalisation
- NF C26-915:1967 TEST METHODS FOR INSULATING VARNISHES. VOLUME RESISTIVITY AND SURFACE RESISTIVITY.
- NF EN ISO 20168:2021 Resistance welding - Clamping cones for electrode holders and electrode tips
Japanese Industrial Standards Committee (JISC)
- JIS B 9915:1989 Measuring methods for dust resistivity (with parallel electrodes)
- JIS C 2525:1994 Testing method for conductor-resistance and resistivity of metallic resistance materials
- JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
- JIS C 2525:1999 Testing method for conductor-resistance and resistivity of metallic resistance materials
Ente Nazionale Italiano di Unificazione
- UNI 4288:1972 Tests on plastics. Determination of surface and volume resistivity.
American Society for Testing and Materials (ASTM)
- ASTM F397-02 Silicon rod two-electrode probe resistivity test method
- ASTM C1952-25 Standard Test Method for Determination of Bulk Resistivity Index of Mortar Cubes using Bulk Electrical Resistivity Measurements
- ASTM F525-00a Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe
- ASTM RR-D02-1414 1997 D6120-Test Method for Electrical Resistivity of Anode and Cathode Carbon Material at Room Temperature
- ASTM D6120-24 Standard Test Method for Electrical Resistivity of Anode and Cathode Carbon Material at Room Temperature
- ASTM F673-02 Non-contact eddy current probe measurement method for resistivity of semiconductor slices or films
CZ-CSN
- CSN IEC 93:1993 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
Spanish Association for Standardization (UNE)
- UNE 21303:1983 METHODS OF TEST FOR VOLUME RESISTIVITY AND SURFACE RESISTIVITY OF SOLID ELECTRICAL INSULATING MATERIALS.
IT-UNI
- UNI 4288-1972 Plastic material testing. Determination of surface resistivity and volume resistivity
UY-UNIT
- UNIT 119-1957 Measurement of circuit conductor resistivity
Military Standards (MIL-STD)
- MIL MIL-PRF-49465C-2007 Resistor, Fixed, Metal Element, Power Type, Very Low Resistance Values, General Specification for
Lithuanian Standards Office
- LST HD 429 S1-2002 Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials (IEC 60093:1980)
IN-BIS
- IS 6103-1971 Test method for specific resistance (resistivity) of electrical insulating liquids
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TM-650 5.5.2.3-1998 Test Method 2.5.17 Volume Resistivity and Surface Resistance
Malaysia Standards
- MS 1465 Pt.2-1999 Method of test for determination of plastics resistivity: Part 2: volume resistivity
European Committee for Electrotechnical Standardization(CENELEC)
- HD 429 S1-1983 Methods of Test for Volume Resistivity and Surface Resistivity of Solid Electrical Insulating Materials
Gosstandart of Russia
- GOST R 50499-1993 Solid electrical insulating materials. Methods of test for volume resistivity and surface resistivity
- GOST 20398.13-1980 Field-effect transistors. Drain source resistance measurement technique
International Organization for Standardization (ISO)
- ISO 5821:2025 Resistance welding. Spot welding electrodes. Female electrode caps