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  2. Standards for polycrystalline and monocrystalline

polycrystalline and monocrystalline

polycrystalline and monocrystalline, Total:89 items.

The international standard classification for "polycrystalline and monocrystalline" includes: Semiconducting materials , Other non-ferrous metals and their alloys , Energy and heat transfer engineering in general , Testing of metals , Insulating gases , Cadmium, cobalt and their alloys , Non-destructive testing of metals , Optics and optical measurements , Electric furnaces , Sugar. Sugar products. Starch , Other products of non-ferrous metals .

The Chinese standard classification for "polycrystalline and monocrystalline" includes: Compound semiconductor material , Semimetal , Rare scattered metals and their alloys , Elemental semiconductor material , Technical management , Metal physical property test method , Semimetal and semiconductor material in general , Rare refractory metals and their compounds , Metal nondestructive testing method , Artificial lens , Industrial electric heating equipment , Processed sugar , Sugar refining , Quartz crystal and piezoelectric element .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Group Standards of the People's Republic of China

国家市场监督管理总局、中国国家标准化管理委员会

Professional Standard - Machinery

  • JB/T 10439-2004 Crystal growing furnaces TDR-series crystal growing furnaces by Czochralski method

Hebei Provincial Standard of the People's Republic of China

  • DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer

Professional Standard - Light Industry

轻工业部

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

Professional Standard - Electron

  • SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
  • SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
  • SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide

Professional Standard - Non-ferrous Metal

工业和信息化部

Korean Agency for Technology and Standards (KATS)

  • KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS D 2715-2006(2011) Tensile specimen of single- and poly-crystal nano/micro thin film materials

CZ-CSN

UNKNOWN

Semiconductor Equipment and Materials International (SEMI)

Defense Logistics Agency

German Institute for Standardization

  • DIN V VDE V 0126-18-3:2007 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)

CN-DB 1

  • DB1502/T 027-2024 Energy consumption limit per unit product in polysilicon production

British Standards Institution (BSI)

  • BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
  • BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
  • BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles

Association Francaise de Normalisation

  • NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Japanese Industrial Standards Committee (JISC)

  • JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

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