What about single crystal and polycrystalline

What about single crystal and polycrystalline, Total:54 items.

The international standard classification for "What about single crystal and polycrystalline" includes: Semiconducting materials , Other non-ferrous metals and their alloys , Energy and heat transfer engineering in general , Testing of metals .

The Chinese standard classification for "What about single crystal and polycrystalline" includes: Compound semiconductor material , Semimetal , Rare scattered metals and their alloys , Technical management , Semimetal and semiconductor material in general , Metal physical property test method , Elemental semiconductor material .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 29447-2012 The norm of energy consumption per unit products of polysilicon enterprise
GB/T 5238-2009e Monocrystalline germanium and monocrystalline germanium slices
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
GB 29447-2022 The norm of energy consumption per unit products of polysilicon and germanium
GB/T 11072-1989 Indium antimonide polycrystal, single crystals and as-cut slices
GB/T 29057-2023 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices

Professional Standard - Electron

SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide

Korean Agency for Technology and Standards (KATS)

KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
KS D 2715-2006(2011) Tensile specimen of single- and poly-crystal nano/micro thin film materials
KS C IEC 60122-4:2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors

German Institute for Standardization

DIN V VDE V 0126-18-3:2007 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003

British Standards Institution (BSI)

BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles

Defense Logistics Agency

DLA SMD-5962-87711 REV A-2001 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, DUAL MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-85508 REV C-2005 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY, TTL, MULTIPLEXER, MONOLITHIC SILICON

CN-DB 1

DB1502/T 027-2024 Energy consumption limit per unit product in polysilicon production

Danish Standards Foundation

DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
DS/EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Association Francaise de Normalisation

NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials
NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures

SCC

DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures
NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

IEC - International Electrotechnical Commission

PAS 62276-2001 Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method (Edition 1.0)

Lithuanian Standards Office

LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
LST EN 1330-11-2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Spanish Association for Standardization (UNE)

UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

European Committee for Standardization (CEN)

EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

Japanese Industrial Standards Committee (JISC)

JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

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