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  2. Standards for How about single crystal and polycrystalline

How about single crystal and polycrystalline

How about single crystal and polycrystalline, Total:116 items.

The international standard classification for "How about single crystal and polycrystalline" includes: Semiconducting materials , Other non-ferrous metals and their alloys , Energy and heat transfer engineering in general , Testing of metals , Insulating gases , Non-destructive testing of metals , Cadmium, cobalt and their alloys , Optics and optical measurements , Electric furnaces , Sugar. Sugar products. Starch , Other products of non-ferrous metals .

The Chinese standard classification for "How about single crystal and polycrystalline" includes: Compound semiconductor material , Semimetal , Rare scattered metals and their alloys , Elemental semiconductor material , Technical management , Metal physical property test method , Semimetal and semiconductor material in general , Metal nondestructive testing method , Rare refractory metals and their compounds , Artificial lens , Industrial electric heating equipment , Processed sugar , Sugar refining , Quartz crystal and piezoelectric element , Technical management , Technical management .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Group Standards of the People's Republic of China

Professional Standard - Ferrous Metallurgy

Professional Standard - Machinery

  • JB/T 5633-1991 Single-crystal furnace. Grading of energy consumption
  • JB/T 10439-2004 Crystal growing furnaces TDR-series crystal growing furnaces by Czochralski method

Hebei Provincial Standard of the People's Republic of China

  • DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer

Professional Standard - Light Industry

Professional Standard - Non-ferrous Metal

Professional Standard - Electron

  • SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
  • SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
  • SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
  • SJ 20444-1994 Specification for Lithium Niobate singlecrystal
  • SJ 20607-1996 Specification for molybdenate crystal

Inner Mongolia Provincial Standard of the People's Republic of China

  • DB1502/T 027-2024 Energy consumption limit per unit product in polysilicon production

Jiangxi Provincial Standard of the People's Republic of China

  • DB36/ 652-2012 The norm of energy consumption per unit product of polysilicon

Professional Standard - Building Materials

  • JC/T 2849-2024 Cerium-doped lutetium oxyorthosilicate single crystals

Danish Standards Foundation

  • DS-hæfte 23:2005 WEEE – What to do – Standards, legislation and recycling schemes

Korean Agency for Technology and Standards (KATS)

  • KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS D 2715-2006(2011) Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS C IEC 61747-3-2002(2017) Liquid crystal and solid state display devices － Part 3: Sectional specification of liquid crystal display (LCD) cells

German Institute for Standardization

  • DIN V VDE V 0126-18-3:2007-06 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
  • DIN V VDE V 0126-18-3:2007 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)

American Society for Testing and Materials (ASTM)

  • ASTM F41-90 Method for growing silicon single crystal by floating zone method and evaluating polycrystalline silicon ingot
  • ASTM F1723-02 Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
  • ASTM F574-88 Evaluating polysilicon

Czech Standards Institute (UNMZ)

Semiconductor Equipment and Materials International (SEMI)

Defense Logistics Agency

American Society of Heating, Refrigerating and Air-Conditioning Engineers (ASHRAE)

Association Francaise de Normalisation

  • NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

British Standards Institution (BSI)

  • BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
  • BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
  • BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
  • BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles

Spanish Association for Standardization (UNE)

Japanese Industrial Standards Committee (JISC)

  • JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

Bureau of Indian Standards

  • IS 4570-10-1999 Crystal Unit Holders - Part 10 : Metal, Welded, Two-pin Crystal Unit Holders Types DP And EH

American Water Works Association (AWWA)

  • AWWA JTMGT57487 Electric Restructuring and Customer Choice: Dead or Alive? And, if It's Still Alive, What Do I Do About It?

Gosstandart of Russia

GCC Standardization Organization

  • GSO IEC 61747-20-1:2016 Liquid crystal display devices - Part 20-1: Visual inspection - Monochrome liquid crystal display cells (excluding all active matrix liquid crystal display cells)

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