GB/T 1555-1997 in English

SUPERSEDED

Test methods for determining the orientation of a semiconductor single crystal

Issued on:1997-01-02
Implemented on:1998-08-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $300.00
$291.00

Standard No:	GB/T 1555-1997
Document status:	SUPERSEDED
Superseded by:	GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
Superseded on:	2010-06-01
Title in English:	Test methods for determining the orientation of a semiconductor single crystal
Title in Chinese:	半导体单晶晶向测定方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1997-01-02
Implemented on:	1998-08-01
ICS Classification:	29.045-Semiconducting materials
Chinese Classification:	H21-Metal physical property test method
Professional Classification:	GB-National Standard
Related Keywords:	x-ray diffraction orientation method method b light map orientation method single crystal scopethis standard single crystal materials x-ray diffraction orientation
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《GB/T 1555-1997半导体单晶晶向测定方法》由TC203（全国半导体设备和材料标准化技术委员会）归口，主管部门为国家标准化管理委员会。
本标准规定了半导体单晶晶向X射线衍射定向和光图定向的方法。本标准适用于测定半导体单晶材料大致平行于低指数原子面的晶体的表面取向。

Scope

This standard specifies the methods for X-ray diffraction orientation and optical pattern orientation of semiconductor single crystals. This standard is applicable to the determination of the surface orientation of crystals of semiconductor single crystal materials approximately parallel to the low-index atomic planes. This standard includes two test methods: Method A X-ray diffraction orientation method. This method can be used for the orientation of all semiconductor single crystals. Method B Light Map Orientation Method. This method is currently used for the orientation of single-element semiconductor single crystals.

More samples: GB 18306-2015 QC/T 942-2021 NB/T 47013.2-2015

Sample only — not a preview of GB/T 1555-1997