Semiconductors have an isotropic

Semiconductors have an isotropic, Total:77 items.

The international standard classification for "Semiconductors have an isotropic" includes: Semiconducting materials , Testing of metals .

The Chinese standard classification for "Semiconductors have an isotropic" includes: Metal physical property test method , Semimetal and semiconductor material in general , Technical management , Technical management , Technical management , Electrical insulating material and its products .

工业和信息化部

QB/T 5369-2019 Semiconductor refrigeration appliance

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal

Professional Standard - Electron

SJ 2214.2-1982 Method of measurement for forward voltage of semiconductor photodiodes
SJ 20180-1992 Semiconductor discrete device-Detail specification for reverse-blocking thyristor for Type 3CT105
SJ 1487-1979 Detail specification for reverse blocking high-frequency thyristors

Group Standards of the People's Republic of China

T/HNQA 019-2023 Technical Specification for Semiconductor Lighting Lamps Used in Deep Sea
T/CASME 798-2023 Specialized processing tools for semiconductor materials

Military Standard of the People's Republic of China-General Armament Department

GJB 33/18-2011 Semiconductor optoelectronic device.Detail specification for type GO417 bidirectional analog switch semiconductor photocoupler

Professional Standard - Machinery

JB/T 7622-1994 Organosilicone Lacquer Intended to Be Used in Power Semiconductor Device Production Process

机械电子工业部

JB/T 5369.8-1991 8mm groove system combined clamp guide guide support

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5914-2006 Methodsof destructive physical analysis for military semiconductor devices of all kinds of quality class

SCC

AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors
FM Approvals 7701:2022 Tools Used in the Semiconductor Industry
CEI EN 60146-2:2001 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
DANSK DS/EN 60146-2:2000 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
BS PD ES 59008-4-3:2000 Data requirements for semiconductor die. Specific requirements and recommendations-Thermal
NS 5039:1973 Press tools - Pilot pins

PL-PKN

PN M66633-1990 Forging taols Trimming die mounting with symmetric guides Semi-products
PN M66630-1988 Forging tools Trimming die mounting with pear guides Semi-products

JP-JEC

JEC 2440-2005 SEMICONDUCTOR SELF-COMMUTATED CONVERTERS

IEC - International Electrotechnical Commission

IEC 60146-2:1974 Semiconductor Convertors Part 2: Semiconductor Self-Commutated Convertors (Edition 1.0)
IEC 62951-7:2019 Semiconductor devices – Flexible and stretchable semiconductor devices – Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor (Edition 1.0)

CZ-CSN

CSN 35 8732-1964 Semiconductor diodes. Measurement of forward current
CSN 35 8734-1975 Semieonductor devices. Diodcs. Measurement of reverse current.
CSN 35 8773-1977 Meaaurement of semiconductor devices. Thyristors. Meaaurement of blocking current and reverse blocking current.
CSN 35 8749-1973 Semiconductor devices. Transistors. Measurement of absolute value of short-circuit forward transfer admittance
CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
CSN 35 8763-1973 Semiconductor devices. Diodes. Measurement o? reverse breakdown voltage
CSN 35 8731-1975 Semiconductor devices. Diodes Measurement of d. c. forward voltage
CSN 35 8766-1976 Semieonductor devices. Switching diodes. Measurement cf forward volíage.

Standard Association of Australia （SAA）

AS 60146.2:2001/Amdt 1:2001 Semiconductor converters Self-commutated semiconductor converters include direct-to-dc converters
AS 60146.2:2001(R2013) Semiconductor converters Self-commutated semiconductor converters include direct-to-dc converters

SE-SIS

SIS SEN 43 32 00-1973 Semiconductor devices. Survey of standards. International recommendations' validity as Swedish standard

Korean Agency for Technology and Standards (KATS)

KS C IEC 60146-2:2002 Semiconductor converters－Part 2：Self-commutated converters including direct d.c. converters

PH-BPS

PNS IEC 62258-5:2021 Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

GSO

GSO IEC 60747-14-3:2014 Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
GSO IEC 60747-7:2014 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
OS GSO IEC 60146-2:2014 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
BH GSO IEC 60146-2:2016 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
GSO IEC 60146-2:2014 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
GSO IEC 60747-8:2014 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
GSO IEC 60747-11:2014 Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
GSO IEC 60747-9:2014 Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
GSO IEC 60748-1:2014 Semiconductor devices - Integrated circuits - Part 1: General
GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

Danish Standards Foundation

DS/EN 60146-2:2000 Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters

British Standards Institution (BSI)

BS IEC 60747-18-3:2019 Semiconductor devices. Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
BS EN 60146-2:2000 Semiconductor convertors. General requirements and line commutated convertors. Self-commutated semiconductor converters including direct d.c. converters
BS IEC 62951-7:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements

Association Francaise de Normalisation

NF EN 60146-2:2002 Convertisseurs à semiconducteurs - Partie 2 : convertisseurs autocommutés à semiconducteurs y compris les convertisseurs à courant continu directs
NF E63-075:2010 Tools for pressing - Guide pillar mountings with fitted-in rings for gliding guiding.
NF E63-073:1998 Press tools. Guide pillar mountings with self-oiling rings of pillar for smooth guiding.
NF ISO 16525-6:2014 Adhesives - Test methods for isotropic electrical conductivity adhesives - Part 6: determination of pendulum impact resistance
NF E63-073:2010 Tools for pressing - Guide pillar mountings with self-oiling rings for gliding guiding.

ES-UNE

UNE-EN 60146-2:2000 Semiconductor converters -- Part 2: Self-commutated semiconductor converters including direct d.c. converters (Endorsed by AENOR in December of 2001.)

HU-MSZT

MSZ 7200/5-1985 Measurement methods for high power semiconductor tools
MSZ 7200/3-1984 High power semiconductor tools. Contour and connection dimensions

RU-GOST R

GOST 18986.1-1973 Semiconductor diodes. Method for measuring direct reverse current
GOST 18812-1981 Sheet stamping dies. Holders for guide posts with flute and guide bushes. Design and dimensions
GOST 18986.8-1973 Semiconductor diodes. Method for measuring reverse recovery time
GOST 18986.9-1973 Semiconductor diodes. Method for measuring pulse direct voltage and forword recovery time

Lithuanian Standards Office

LST EN 60146-2-2002 Semiconductor converters. Part 2: Self-commutated semiconductor converters including direct d.c. converters (IEC 60146-2:1999)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD286-B-2000 Standard for Measuring Forward Switching Characteristics of Semiconductor Diodes
JEDEC EIA-318-B-1996 Measurement of Reverse Recovery Time for Semiconductor Signal Diodes [Replaced: JEDEC 318-1]

IPC - Association Connecting Electronics Industries

IPC 3408 CD-1996 General Requirements for Anisotropically Conductive Adhesive Films

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC 3408-1996 General Requirements for Anisotropically Conductive Adhesive Films

IX-SA

AS 408:1972 Anisotropy of rocks and rock masses

Defense Logistics Agency

DLA SMD-5962-90590 REV B-2002 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, HEX INVERTER WITH OPEN DRAIN OUTPUTS, MONOLITHIC SILICON
DLA MIL-S-19500/438 VALID NOTICE 4-2011 Semiconductor Device, Triode Thyristor (Bi-Directional), Silicon, Types 2N5806 Through 2N5809

BE-NBN

NBN A 23-114-1983 Magnetic cold-rolled non-grain-oriented alloy steel strip, delivered as semi-finished product

Others: Isotropic characteristics of semiconductors,Semiconductors have an isotropic,Semiconductor materials are isotropic