Single crystal diffraction calibration method
Single crystal diffraction calibration method, Total:69 items.
The international standard classification for "Single crystal diffraction calibration method" includes: Testing of metals , Other standards related to analytical chemistry , Other methods of testing of metals , Salts , Semiconducting materials , Inorganic chemicals in general , Optics and optical measurements , Non-destructive testing of metals , Pigments and extenders , Materials for aerospace construction .
The Chinese standard classification for "Single crystal diffraction calibration method" includes: Metal physical property test method , Electrochemical, thermochemistry and optical profile type analyzer , Metallographic testing method , Inorganic salt , Semimetal and semiconductor material in general , Inorganic chemicals in general , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Material composition analysis instrument and environment detection instrument in general , Artificial lens , Metal nondestructive testing method , Metal chemical property test method , Basic standards for aviation and aerospace materials .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
- GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate―Qualitative analysis of delta-crystalline layered sodium disilicate―Method of X-ray diffractometer
- GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
- GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method
- GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
- GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
- GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
Professional Standard - Education
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
- JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
- JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer
- JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
- GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
工业和信息化部
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
Professional Standard - Non-ferrous Metal
- YS/T 785-2012 Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
- GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Polycrystalline X-ray Diffractometer
Professional Standard - Commodity Inspection
- SN/T 3514-2013 Identification method of texture analysis for grain oriented and non-oriented electrical steels. X-ray diffraction(XRD)
Professional Standard - Nuclear Industry
- EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
未注明发布机构
- ASTM RR-D32-1036 1993 D5357-Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
- ASTM RR-D02-1690 2010 D5187-Test Method for Determination of Crystallite Size (Lc) of Calcined Petroleum Coke by X-Ray Diffraction
- ASTM RR-D02-1280 1991 D5187-Test Method for Determination of Crystallite Size (Lc) of Calcined Petroleum Coke by X-Ray Diffraction
Professional Standard - Energy
- NB/SH/T 6024-2021 Standard test method for determination of relative crystallinity of zeolite ZSM-5 X-ray diffraction
- NB/SH/T 6015-2020 Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction
- NB/SH/T 6033-2021 Standard test method for determination of the unit cell dimension of zeolite ZSM-22 X-ray Diffraction
- NB/SH/T 0339-2021 Standard test method for determination of the unit cell dimension of faujasite-type zeolite by X-ray diffraction
Fujian Provincial Standard of the People's Republic of China
- DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)
Professional Standard - Electron
- SJ 20714-1998 Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction
水利部
- SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement
Group Standards of the People's Republic of China
- T/CNIA 0177-2023 Determination of grain size and recrystallization area fraction of deformed aluminum and aluminum alloys - Electron backscattered diffraction method
Professional Standard - Aviation
- HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method
Japanese Industrial Standards Committee (JISC)
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
American Society for Testing and Materials (ASTM)
- ASTM D5357-03(2008)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
- ASTM D8352-20 Standard Test Method for Determination of Relative Crystallinity of Zeolite Beta by X-Ray Diffraction
- ASTM D5357-03(2013) Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
- ASTM D5357-98 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
- ASTM D5357-19 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
- ASTM D5357-03 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
- ASTM D5187-10(2015)e1 Standard Test Method for Determination of Crystallite Size (L
c ) of Calcined Petroleum Coke by X-Ray Diffraction - ASTM D5758-01(2011)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
- ASTM D5758-01(2015) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
- ASTM D5187-10 Standard Test Method for Determination of Crystallite Size (L
c of Calcined Petroleum Coke by X-Ray Diffraction - ASTM D5187-91(1997) Standard Test Method for Determination of Crystallite Size (L c ) of Calcined Petroleum Coke by X-Ray Diffraction
- ASTM D5758-01(2021) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
- ASTM D5187-91(2002) Standard Test Method for Determination of Crystallite Size (L c ) of Calcined Petroleum Coke by X-Ray Diffraction
- ASTM D5187-91(2007) Standard Test Method for Determination of Crystallite Size (L
c of Calcined Petroleum Coke by X-Ray Diffraction - ASTM D5187-21 Standard Test Method for Determination of Crystallite Size (L
c ) of Calcined Petroleum Coke by X-Ray Diffraction - ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D934-80(2003) Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
- ASTM D934-22 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
- ASTM D934-13 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
- ASTM E2627-13(2019) Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
- ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
- ASTM D934-08 Standard Practices for Identification of Crystalline Compounds in Water-Formed Deposits By X-Ray Diffraction
International Organization for Standardization (ISO)
- ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- ISO/TTA 3:2001 Polycrystalline materials - Determination of residual stresses by neutron diffraction
British Standards Institution (BSI)
- BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
- 20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
GSO
- NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method
- NB/SH/T 0972-2018 Determination of unit cell parameters of SAPO-11 molecular sieve by powder X-ray diffraction method
- NB/SH/T 0971-2018 Determination of relative crystallinity of SAPO-11 molecular sieve by powder X-ray diffraction method
American National Standards Institute (ANSI)
- ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress