NB/SH/T 6015-2020 in English

VALID

Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction

Issued on:2020-10-23
Implemented on:2021-02-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $130.00
$127.00

Standard No:	NB/SH/T 6015-2020
Document status:	VALID
Title in English:	Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction
Title in Chinese:	ZSM-23分子筛晶胞参数的测定 X-射线衍射法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2020-10-23
Implemented on:	2021-02-01
Professional Classification:	NB-Energy
Related Keywords:	x-ray diffraction introductionthis standard standard test method zsm-23 zeolite x-ray diffraction lattice parameters
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Principles of High Energy Ray Diffraction twin crystal diffraction Single crystal x-ray diffractometer analysis X-ray crystallography What does an x-ray diffractometer measure? Ray Diffraction Pattern Near Field High Energy X-ray Diffraction spin electron diffraction X-ray diffraction parameters nb/sh/t0916 Second order diffraction and first order diffraction X-ray Diffraction and Crystals x-ray diffraction size Domestic Neutron Diffraction Method electron diffraction twins x-ray diffraction crystals Single crystal x-ray analysis Out-of-Plane Diffraction In-Plane Diffraction Crystals in X-ray Diffraction x-ray diffraction half width determination of crystallinity x-ray Molybdenum diffraction peak X-ray diffraction amorphous peak Diffraction peaks of water x-ray diffraction scan electrons in x-ray atoms x-ray peak determination Diffraction peaks of x-diffraction silicon gold diffraction peaks x-ray single crystal X-ray diffraction peak width First Order Diffraction Second Order Diffraction Diffraction parameters x-diffraction crystallinity What kind of rays are used in x-ray diffraction X-ray Diffraction Analysis Crystal Orientation What is x-ray diffraction used for? nb/sh/t+0874 Diffraction plate Diffraction peaks of cobalt cobalt diffraction peak The main parameters of x-diffractometer Diffraction cell parameters In crystal diffraction, why use x-rays Diffraction concept X-ray single crystal diffractometer and x-ray nb/sh and sh X-ray Diffraction Microscopic X-ray diffraction equipment How is diffraction graded X-ray diffraction sample preparation volume x-ray parameters X-ray diffraction peak position hexagonal unit cell X-ray diffraction equipment twinned half point X diffractometer parameters Intensity of x-ray diffraction peaks Grain Diffraction Peak atomic x-ray Diffraction peak data Diffraction of waves Twin Secondary Diffraction three-point diffraction How is x-diffraction quantified? X-ray diffraction peak broadening Neutron Diffraction Sample Preparation Test method for rotational orientation of crystal materials by x-ray diffractometer X diffractometer parameters X-ray diffraction lines x-ray diffraction and Diffraction peak parameters Parameters of x-ray diffractometer X-ray crystallography double diffraction method electron diffraction together electron diffraction? hand-held x-diffraction X-ray diffraction peak broadening Diffraction of x-ray single crystals X-ray diffraction crystal form Electron Diffraction and Electron Diffraction What does x-diffraction measure? What does x-ray diffraction measure? Pigment X-ray Diffraction Main parameters of x-ray diffractometer polycrystalline electron diffraction Whole Rock X-ray Diffraction Whole-rock X-ray diffraction Single Crystal X-ray Diffraction Analysis NB/T 10429-2020 X-ray single crystal diffractometer composition Factors affecting x-ray diffraction peaks Can x-ray diffraction measure functional groups? X-ray diffraction analysis experimental parameter selection Electron diffraction method to determine crystal structure Single crystal diffraction calibration method Calibration method of single crystal electron diffraction pattern Unit cell integral measurement method Single crystal diffraction analysis method NB/SH/T09132015 nb/t 10471-2020 Preparation method of electron diffraction sample nb/sh/t 2408 nb/sh/t 6009-2020 nb/t 10433-2020 nb/t 10428-2020 nb/t10428-2020

Introduction

This standard specifies the method for determining the unit cell parameters of ZSM-23 zeolite using X-ray diffraction. It details the procedure and conditions necessary to accurately measure these parameters, providing guidelines for sample preparation, data acquisition, and analysis. The aim is to ensure consistency in measurement techniques across different laboratories and applications.

*** Please note: This description may not be accurate, please refer to the official documentation.

More samples: JC/T 2453-2018 GB 50021-2001(2009) DL/T 5154-2012

Sample only — not a preview of NB/SH/T 6015-2020

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