second order diffraction

second order diffraction, Total:250 items.

The international standard classification for "second order diffraction" includes: Other standards related to optics and optical measurements , Optical measuring instruments , Welded joints , Other products of the chemical industry , Cosmetics. Toiletries , Springs , Other standards related to analytical chemistry , Cement. Gypsum. Lime. Mortar , Pigments and extenders , Salts , Particle size analysis. sieving , Rubber compounding ingredients , Non-destructive testing , Radiation protection , Chemical analysis of metals , Physicochemical methods of analysis , Testing of metals , Non-destructive testing of metals , Inorganic chemicals in general , Other methods of testing of metals , Materials for aluminium production , Starch and derived products , Organic acids , Refractories , Protection against crime , Occupational safety. Industrial hygiene , Other standards related to protection against fire .

The Chinese standard classification for "second order diffraction" includes: Electron optics and other physical optics instrument , Welding and cutting , Other chemical products in general , Cosmetics , Spring , Material composition analysis instrument and environment detection instrument in general , Basic standard and general method for pigment , Inorganic salt , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Carbon black , Basic standards and general methods , Radiological sanitation protection , Metal physical property test method , Basic standards and general methods , Inorganic chemicals in general , Metallographic testing method , Light metals and their alloys analysis method , Grain processing and products , General organic chemicals , Office supplies and office implements , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Siliceous refractory , Crime judging technology , Fire-fighting in general .

Professional Standard - Machinery

JB/T 9400-2010 Specification of X-ray diffractometer
JB/T 8239.2-1999 Specification for diffraction grating
JB/T 8426-1996 Metal coating. X-ray diffraction test method for nickel-phosphorus alloy coating
JB/T 8239.1-1999 Basic parameters for diffraction grating
JB/T 9400-1999 Specification for X-ray diffractometer
JB/T 11144-2011 X-ray diffractometer

工业和信息化部

HG/T 5705-2020 Determination of titanium dioxide phase concent in hydrogenation catalysts- X-ray diffractometry
YB/T 5360-2020 Metal Materials-Determination of quantitative pole figure- XRD method
YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber
YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
YS/T 1160-2016 Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction

Professional Standard - Agriculture

57药典四部-2020 0451 X-ray diffraction method
77药典四部-2015 0451 X-ray diffraction method
784兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
2355药典二部-2010 Appendix IX FX-Ray Powder Diffraction Method
SN/T 5579-2023 Determination of the graphitization degree of carbon materials - X-ray diffraction method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
GB/T 41116-2021 Non-destructive testing of welds—Time-of-flight diffraction technique (TOFD)—Acceptance levels
GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
GB/T 37054-2018 Nanotechnology—Testing ratio of anatase to rutile in nano-titanium dioxide—X-ray diffraction
GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 19077.1-2008 Particle size analysis - Laser diffraction methods - Part 1: General principles
GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
GB/T 19801-2005 Non-destructive testing--Acoustic emission inspection--Secondary calibration of acoustic emission sensors(ISO 12714:1999 IDT)
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
GB/T 19077-2016 Particle size analysis―Laser diffraction methods
GB/T 32698-2016 Rubber compounding ingredients一Determination of particle size distribution for silica,precipitated,hydrated—Laser diffraction
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction
GB/T 5225-1985 Metal materials－Quantitative phase analysis－Value Kmethod of X-ray diffraction
GB/T 6609.32-2009 Chemical analysis methods and determination of physical performance of alumina - Part 32: Determination of a-alumina content by X-ray diffraction
GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
GB/T 22427.13-2008 Starch and derived products - Determination of sulfur dioxide content
GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate―Qualitative analysis of delta-crystalline layered sodium disilicate―Method of X-ray diffractometer
GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer

Professional Standard - Petrochemical Industry

SH/T 1612.8-2005 Purified terephthalic acid for industrial use -- Determination of practical size distribution -- Laser diffraction method

Professional Standard - Chemical Industry

HG/T 6149-2023 Determination of Silica Crystal Phase Content in Hydrogenation Catalyst and Its Support X-ray Diffraction Method

National Metrological Verification Regulations of the People's Republic of China

JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
JJG 629-1989 Polycrystalline X-ray Diffractometer

Professional Standard - Education

JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light
JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry

Professional Standard - Ferrous Metallurgy

YB/T 5320-2006 Metal materials -- Quantitative phase analysis -- Value K method of X-ray diffraction
YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer

国家质量监督检验检疫总局

SN/T 4760-2017 Identification of import zinc concentrates-X-ray diffraction method

National Metrological Technical Specifications of the People's Republic of China

JJF 1447-2014 Calibration specification for ultrasonic flaw detector by time-of-flight diffraction
JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction

Professional Standard - Public Safety Standards

GA/T 1422-2017 Analysis of dynamite in forensics—X-ray diffraction(XRD)
GA/T 2079-2023 Forensic sciences-Examination methods for minerals-X-ray diffractometry

Professional Standard - Commodity Inspection

SN/T 3975-2014 Identification method of bauxite - X ray diffractometry
SN/T 4008-2013 Rapid qualitative screening of talc powder - Powder X-ray diffraction method

水利部

SL 547-2011 Residual stress analysis for hydraulic steel structure by X-ray diffraction method
SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement

Professional Standard - Nuclear Industry

EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

Occupational Health Standard of the People's Republic of China

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

海关总署

HS/T 49-2016 Talc powder particle size determination laser diffraction method

Group Standards of the People's Republic of China

T/CSTM 00166.2-2020 Characterization for graphene materials Part 2 X-ray diffraction

Shanghai Provincial Standard of the People's Republic of China

DB31/T 1156-2019 The identification of electrical fire melted mark—Electronic back scattering diffraction method

Professional Standard - Energy

NB/SH/T 0339-2021 Standard test method for determination of the unit cell dimension of faujasite-type zeolite by X-ray diffraction
NB/SH/T 6015-2020 Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction
NB/SH/T 6024-2021 Standard test method for determination of relative crystallinity of zeolite ZSM-5 X-ray diffraction
NB/SH/T 6033-2021 Standard test method for determination of the unit cell dimension of zeolite ZSM-22 X-ray Diffraction

Professional Standard - Non-ferrous Metal

YS/T 1652-2023 Texture testing of zirconium and zirconium alloy— Electron backscatter diffraction method

Professional Standard - Petroleum

SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks
SY/T 5983-1994 X-ray Diffraction Identification Method of Illite/Smectite Interlayer Minerals

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1078-2012 Laser Diffraction Method for Particle Size Analysis of Ceramic Raw Materials

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

ITU-R P.526-2-1992 Propagation by Diffraction
ITU-R P.526-7-2001 Propagation by Diffraction
ITU-R P.526-4-1995 Propagation by Diffraction
ITU-R P.526-12-2012 Propagation by diffraction
ITU-R P.526-3-1994 Propagation by Diffraction
ITU-R P.526-5-1997 Propagation by Diffraction
ITU-R P.526-9-2005 Propagation by diffraction
ITU-R P.526-14-2018 Propagation by diffraction
ITU-R P.526-6-1999 Propagation by Diffraction
ITU-R P.526-8-2003 Propagation by diffraction (Question ITU-R 202/3)

SCC

ITU-R P.526-15-2019 Propagation by diffraction
VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
DANSK DS/ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary
07/30168945 DC BS ISO 13320. Particle size analysis. Laser diffraction methods
BS ISO 15902:2004 Optics and photonics. Diffractive optics. Vocabulary
BS ISO 13320-1:1999 Particle size analysis. Laser diffraction methods-General principles
DANSK DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
AENOR UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
NS-EN 15305:2008 Non-destructive Testing — Test Method for Residual Stress analysis by X-ray Diffraction
DANSK DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DIN ISO 13320 E:2022 Draft Document - Particle size analysis - Laser diffraction methods (ISO 13320:2020); Text in German and English

International Telecommunication Union (ITU)

ITU-R P.526-2013 Propagation by diffraction
ITU-R P.526-11-2009 Propagation by diffraction
ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
ITU-R P.526-10-2007 Propagation by diffraction
ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction

European Committee for Standardization (CEN)

EN ISO 15626:2018 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels (ISO 15626:2018)
EN ISO 15626:2013 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)
EN ISO 8130-13:2010 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2001)

PT-IPQ

E E 14-1971 X-ray diffraction analysis

Korean Agency for Technology and Standards (KATS)

KS M 0043-2009 General rules for X-ray diffractometric analysis
KS M 0043-2019 General rules for X-ray diffractometric analysis
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
KS L ISO 24235-2008(2018) Fine ceramics (advanced ceramics, advanced technical ceramics)－Determination of particle size distribution of ceramic powders by laser diffraction method
KS L ISO 24235:2008 Fine ceramics (advanced ceramics, advanced technical ceramics)-Determination of particle size distribution of ceramic powders by laser diffraction method
KS B ISO 12714:2008 Non-destructive testing－Acoustic emission inspection－Secondary calibration of acoustic emission sensors
KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods
KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
KS B ISO 15902:2018 Optics and photonics — Diffractive optics — Vocabulary
KS A ISO 13320:2014 Particle size analysis — Laser diffraction methods
KS B ISO 15902:2013 Optics and optical instruments ― DiffrN optics ― Vocabulary

IET - Institution of Engineering and Technology

GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
APRT ANT DIFF THEO-1981 Aperture Antennas and Diffraction Theory
GEOMET THEO DIFF ELECTRO WAV-1979 Geometrical Theory of Diffraction for Electromagnetic Waves

German Institute for Standardization

DIN EN ISO 15626 E:2018-01 Non-destructive testing of welding by technology of acoustic diffraction (TOFD) acceptance levels (draft)
DIN EN ISO 15626 E:2013-02 Non-destructive testing of welding by technology of acoustic diffraction (TOFD) acceptance levels (draft)
DIN EN 15617 E:2007-01 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods
DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
DIN ISO 13320:2022 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004); German version EN ISO 15902:2005
DIN EN 15617:2009 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels; English version of DIN EN 15617:2009-07
DIN EN ISO 15626:2013 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels (ISO 15626:2011); German version EN ISO 15626:2013
DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN EN ISO 15902 E:2019-10 Optics and Photonics Diffractive Optics Glossary (Draft)
DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size

Association of German Mechanical Engineers

VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter

Association Francaise de Normalisation

NF T31-207:1995 Pigments and extenders. Titanium dioxide. Ratio of anatase to rutile by X-ray diffraction.
NF A89-516:2013 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
NF X43-600-1*NF ISO 16258-1:2015 Workplace Air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: direct-on-filter method
NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
NF EN ISO 15902:2020 Optique et photonique - Optique diffractive - Vocabulaire
NF S10-133*NF EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary
NF A09-282:2019 Non-destructive testing - Phase quantification by X-ray diffraction
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF ISO 16258-2:2015 Air in workplaces - Respirable fraction of crystalline silica by X-ray diffraction - Part 2: indirect method of analysis
NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.
NF ISO 16258-1:2015 Air in workplaces - Respirable fraction of crystalline silica by X-ray diffraction - Part 1: direct filter analysis method
NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
NF X11-666:1984 PARTICLE SIZE ANALYSIS OF POWDERS. DIFFRACTION METHOD.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

American Society for Testing and Materials (ASTM)

ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
ASTM D3720-90(2005) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
ASTM D3720-90(1999) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
ASTM D3720-90(2011) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
ASTM D3720-90(2019) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
ASTM E1781/E1781M-13 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
ASTM D7170-06a Standard Test Method for Determination of Derived Cetane Number (DCN) of Diesel Fuel Oils-Fixed Range Injection Period, Constant Volume Combustion Chamber Method
ASTM D7170-06 Standard Test Method for Determination of Derived Cetane Number (DCN) of Diesel Fuel Oils-Fixed Range Injection Period, Constant Volume Combustion Chamber Method

Universal Oil Products Company (UOP)

UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction

British Standards Institution (BSI)

BS EN 15617:2009 Non-destructive testing of welds - Time-of-flight diffraction technique (TOFD) - Acceptance levels
BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
BS EN ISO/IEC 15408-4:2023 Information security, cybersecurity and privacy protection. Evaluation criteria for IT security - Framework for the specification of evaluation methods and activities
BS EN 120002:1988 Specification for harmonized system of quality assessment for electronic components - Blank detail specification: infrared emitting diodes, infrared emitting diode arrays
19/30333249 DC BS ISO 13320. Particle size analysis. Laser diffraction methods
BS EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
BS EN ISO 15902:2020 Optics and photonics. Diffractive optics. Vocabulary
BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS ISO 13320-1:2000 Particle size analysis - Laser diffraction methods - General principles
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

PL-PKN

PN C97043-1967 Coal deriva?ives Lutidine fraction
PN C97040-1991 Coal derivatives. Xylenols for industrial use

Society of Automotive Engineers (SAE)

SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition

SAE - SAE International

SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction

Japanese Industrial Standards Committee (JISC)

JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
JIS Z 8825:2013 Particle size analysis.Laser diffraction methods
JIS K 0131:1996 General rules for X-ray diffractometric analysis
JIS K 8193:1995 N,N-Dimethyl-para-phenylenediammonium dichloride

KR-KS

KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods
KS L ISO 24235-2008(2023) Fine ceramics (advanced ceramics, advanced technical ceramics)－Determination of particle size distribution of ceramic powders by laser diffraction method
KS B ISO 15902-2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902-2023 Optics and photonics — Diffractive optics — Vocabulary

GSO

BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
ISO/TS 5973:2024 Laser diffraction measurements — Good practice
GSO ISO 16258-2:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
BH GSO ISO 16258-2:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
GSO ISO 16258-1:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 1: Direct-on-filter method
BH GSO ISO 16258-1:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 1: Direct-on-filter method
OS GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
BH GSO ISO 15902:2016 Optics and photonics -- Diffractive optics -- Vocabulary
GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method
OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size

American National Standards Institute （ANSI)

ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement

International Organization for Standardization (ISO)

ISO 24235:2007 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of particle size distribution of ceramic powders by laser diffraction method
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
ISO 12714:1999 Non-destructive testing - Acoustic emission inspection - Secondary calibration of acoustic emission sensors
ISO 13320:2020 Particle size analysis — Laser diffraction methods
ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO 13320:2009 Particle size analysis - Laser diffraction methods
ISO/CD TS 5973.2:2023 Good practice for laser diffraction measurements
ISO/CD TS 5973 Good practice for laser diffraction measurements
ISO 16258-1:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: Direct-on-filter method
ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
ISO 15902:2004 Optics and photonics - Diffractive optics - Vocabulary
ISO 15902:2019 Optics and photonics — Diffractive optics — Vocabulary
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size

Danish Standards Foundation

DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods
DS/EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary

United States Navy

NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION

BSI

BS PD ISO/TS 5973:2024 Laser diffraction measurements. Good practice
DANSK DS/ISO/TS 5973:2024 Laser diffraction measurements – Good practice

GOSTR

GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium

GOST

GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium

RU-GOST R

GOST R ISO 16258-1-2017 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Part 1. Direct-on-filter method

Standard Association of Australia （SAA）

AS 2879.3:1991 Alumina - Determination of alpha alumina content by X-ray diffraction
AS 2879.3:2010(R2013) Determination of alpha alumina content in alumina using X-ray diffraction method
AS 4863.1:2000 Particle size analysis - Laser diffraction methods - General Principles

Spanish Association for Standardization (UNE)

UNE-EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019) (Endorsed by Asociación Española de Normalización in February of 2020.)

CEN - European Committee for Standardization

EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary

HU-MSZT

MSZ 2493-1974 Level 2 accuracy

Others: diffraction,Diffraction convergence,Diffraction efficiency,Diffraction sound,Diffraction Powder Diffraction,second order diffraction,xrd second order diffraction,Neutron Diffraction Peaks,Diffraction Grating, Second Order Diffraction,Neutron Diffraction Technique Diffraction,Second order diffraction and first order diffraction,Secondary Diffraction Microscopy,Diffraction Diffraction,First Order Diffraction Second Order Diffraction,xrd first order diffraction and second order diffraction,Spectral second order diffraction,electron diffraction diffraction,X-ray Diffraction Analysis,Fluorescence Secondary Diffraction