SN/T 4760-2017 in English

VALID

Identification of import zinc concentrates-X-ray diffraction method

Issued on:2017-05-12
Implemented on:2017-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $130.00
$127.00

Standard No:	SN/T 4760-2017
Document status:	VALID
Title in English:	Identification of import zinc concentrates-X-ray diffraction method
Title in Chinese:	进口锌精矿鉴别 X射线衍射法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2017-05-12
Implemented on:	2017-12-01
Professional Classification:	SN-Import&Export Inspection
Related Keywords:	concentrates-x-ray diffraction method introduction analysis diffraction peak intensity ratio 10°-90° 5°-90° characteristic peak identification comparison diffraction angle range hanawalt method special attention
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Diffraction plate Diffraction peaks of cobalt cobalt diffraction peak in situ diffraction Diffraction concept X-ray single crystal diffractometer and x-ray Diffraction 32 degree peak X-ray Diffraction Microscopic in situ x-ray X-ray diffraction equipment X-ray Diffraction Mineral Identification Pearl Powder Identification Method X-ray Diffraction Analysis X-ray diffraction sample preparation volume reflective diffraction X-ray diffraction peak position X-ray diffraction equipment Diffraction point standard diffraction peak What does x-ray diffraction identify? how x diffracted Intensity of x-ray diffraction peaks atomic x-ray Accessory Mineral X-ray Diffraction X-ray diffraction technique sample preparation Perform mass spec identification Diffraction of waves three-point diffraction x ray and water Mine x X-ray diffraction peak broadening X-ray Diffraction and Spectroscopy New type of x-ray window material X-ray diffraction lines x-ray sample preparation method x-ray diffraction and X-ray Diffraction of Minerals double diffraction method X-ray Diffraction Analysis Principles of X-ray Diffraction hand-held x-diffraction X-ray diffraction peak broadening X-ray diffraction crystal form What does x-ray diffraction measure? Pigment X-ray Diffraction Whole Rock X-ray Diffraction Whole-rock X-ray diffraction Laue method x-ray diffraction The difference between continuous X-rays and characteristic X-rays Factors affecting x-ray diffraction peaks Comparison between X-ray diffractometer and medical X-ray Can x-ray diffraction measure functional groups? Forensic Science Mineral Testing X-Ray Diffraction high pressure x-ray diffraction technology Radioactivity testing of imported cobalt concentrate Identification method of niacin for injection Standard diffractogram method Zinc concentrate industry Silver concentrate import Arginine identification method How to identify zinc oxide my country's zinc concentrate Phosphate rock import as4760 sn/t 4953-2017 sn/t 4972-2017 sn/t 4921-2017

Introduction

Analysis of the Standard Technical Framework

Special attention should be paid to the following aspects: ... The case shows that when the sample contains zinc oxide impurities, it is necessary to focus on checking the secondary peak at 47.516° (d=0.1912nm).

Technical Evolution Analysis

Main improvements of this standard compared with the 2009 version:
1. Added JCPDS card comparison requirements
2. Specified the use of Ni filter to eliminate Kβ radiation
3. Refined the judgment threshold of diffraction peak intensity ratio

More samples: JGJ 94-2008 GB 50021-2001(2009) DL/T 368-2010

Sample only — not a preview of SN/T 4760-2017

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Technical Elements	Requirements of this Standard	Comparison with GB/T 14261
Instrument Calibration	Must comply with the JJG 629 procedure	Specific procedures are not specified
Diffraction Angle Range	10°-90°	5°-90°
Characteristic Peak Identification	Comparison using the Hanawalt method

SN/T 4760-2017 in English

Identification of import zinc concentrates-X-ray diffraction method

Analysis of the Standard Technical Framework

Technical Evolution Analysis

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