Secondary Diffraction Transmission

Secondary Diffraction Transmission, Total:126 items.

The international standard classification for "Secondary Diffraction Transmission" includes: Physicochemical methods of analysis , Pigments and extenders , Radiation protection , Motion picture equipment , Salts , Particle size analysis. sieving , Other standards related to optics and optical measurements , Optical measuring instruments , Refractories , Protection against crime , Cosmetics. Toiletries , Other products of the chemical industry , Springs .

The Chinese standard classification for "Secondary Diffraction Transmission" includes: Basic standards and general methods , Basic standard and general method for pigment , Radiological sanitation protection , Projection equipment and its accessory , Inorganic salt , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Electron optics and other physical optics instrument , Siliceous refractory , Crime judging technology , Cosmetics , Other chemical products in general , Spring .

Professional Standard - Agriculture

77药典四部-2015 0451 X-ray diffraction method
57药典四部-2020 0451 X-ray diffraction method
784兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
SN/T 5579-2023 Determination of the graphitization degree of carbon materials - X-ray diffraction method
2355药典二部-2010 Appendix IX FX-Ray Powder Diffraction Method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
GB/T 13982-2011(XG1-2015) Reflective and transmissive projection screens
GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 13982-2005 The reflective and transmitting projection screens
GB/T 13982-2022 Reflective and transmitting projection screens
GB/T 13982-2011/XG1-2015 Reflective and transmissive projection screens
GB/T 19077-2016 Particle size analysis―Laser diffraction methods
GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate―Qualitative analysis of delta-crystalline layered sodium disilicate―Method of X-ray diffractometer
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 13982-2011 The reflective and transmitting projection screens

Professional Standard - Machinery

JB/T 9400-2010 Specification of X-ray diffractometer
JB/T 8239.2-1999 Specification for diffraction grating
JB/T 11144-2011 X-ray diffractometer
JB/T 8239.1-1999 Basic parameters for diffraction grating
JB/T 9400-1999 Specification for X-ray diffractometer

工业和信息化部

YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
YS/T 1160-2016 Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
HG/T 5705-2020 Determination of titanium dioxide phase concent in hydrogenation catalysts- X-ray diffractometry
YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber
YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy

National Metrological Verification Regulations of the People's Republic of China

JJG 629-1989 Polycrystalline X-ray Diffractometer
JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer

Professional Standard - Education

JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry

Professional Standard - Ferrous Metallurgy

YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method

国家质量监督检验检疫总局

SN/T 4760-2017 Identification of import zinc concentrates-X-ray diffraction method

National Metrological Technical Specifications of the People's Republic of China

JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction

Professional Standard - Public Safety Standards

GA/T 2079-2023 Forensic sciences-Examination methods for minerals-X-ray diffractometry

Professional Standard - Commodity Inspection

SN/T 3975-2014 Identification method of bauxite - X ray diffractometry

Professional Standard - Chemical Industry

HG/T 6149-2023 Determination of Silica Crystal Phase Content in Hydrogenation Catalyst and Its Support X-ray Diffraction Method

Professional Standard - Nuclear Industry

EJ/T 1092-1999 Determination of gaps between uranium dioxide pellets in fuel rod by γ-ray transmission method

水利部

SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis
GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
GB/T 37054-2018 Nanotechnology—Testing ratio of anatase to rutile in nano-titanium dioxide—X-ray diffraction

Taiwan Provincial Standard of the People's Republic of China

CNS 12663-1990 Method of Test for Radiographic and Classification of Radiographs for Titanium Welds
CNS 12672-1990 Method of Test for Radiographic and Classification of Radiographs of Aluminum

未注明发布机构

DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods

PT-IPQ

E E 14-1971 X-ray diffraction analysis

SCC

ITU-R P.526-15-2019 Propagation by diffraction
VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

ITU-R P.526-2-1992 Propagation by Diffraction
ITU-R P.526-7-2001 Propagation by Diffraction
ITU-R P.526-12-2012 Propagation by diffraction
ITU-R P.526-4-1995 Propagation by Diffraction
ITU-R P.526-3-1994 Propagation by Diffraction
ITU-R P.526-14-2018 Propagation by diffraction
ITU-R P.526-5-1997 Propagation by Diffraction
ITU-R P.526-9-2005 Propagation by diffraction
ITU-R P.526-6-1999 Propagation by Diffraction

Korean Agency for Technology and Standards (KATS)

KS M 0043-2009 General rules for X-ray diffractometric analysis
KS M 0043-2019 General rules for X-ray diffractometric analysis
KS B ISO 12714-2023 Non-destructive testing — Acoustic emission inspection — Secondary calibration of acoustic emission sensors
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods

International Telecommunication Union (ITU)

ITU-R P.526-2013 Propagation by diffraction
ITU-R P.526-11-2009 Propagation by diffraction
ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction
ITU-R P.526-10-2007 Propagation by diffraction

Association of German Mechanical Engineers

VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
VDI/VDE 5575 BLATT 7-2018 Roentgenoptische Systeme - Refraktive Roentgenlinsen

American Society for Testing and Materials (ASTM)

ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
ASTM D3720-90(2005) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
ASTM E1781-98(2003)e1 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
ASTM E1781-98 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
ASTM E1781/E1781M-20 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
ASTM E1781/E1781M-19 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
ASTM D3720-90(1999) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction

Universal Oil Products Company (UOP)

UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction

IET - Institution of Engineering and Technology

GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
APRT ANT DIFF THEO-1981 Aperture Antennas and Diffraction Theory

GSO

BH GSO ISO 12714:2016 Non-destructive testing -- Acoustic emission inspection -- Secondary calibration of acoustic emission sensors
GSO ISO 12714:2013 Non-destructive testing -- Acoustic emission inspection -- Secondary calibration of acoustic emission sensors
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 9050:2007 Glass in building – Determination of light Transmittance , Solar direct transmittance , Total Solar Energy transmittance , Ultraviolet transmittance and related glazing factors
BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods

American National Standards Institute （ANSI)

ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress

SAE - SAE International

SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction

Society of Automotive Engineers (SAE)

SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition

KR-KS

KS B ISO 12714-2018(2023) Non-destructive testing — Acoustic emission inspection — Secondary calibration of acoustic emission sensors
KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods

International Organization for Standardization (ISO)

ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

IX-IX-IEC

IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy

Association Francaise de Normalisation

NF T31-207:1995 Pigments and extenders. Titanium dioxide. Ratio of anatase to rutile by X-ray diffraction.

Japanese Industrial Standards Committee (JISC)

JIS K 0131:1996 General rules for X-ray diffractometric analysis
JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
JIS Z 8825:2013 Particle size analysis.Laser diffraction methods

GOSTR

GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium

GOST

GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium

German Institute for Standardization

DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN 1349-1:1972 Transmisson of optical radiation; optical clear (nonscattering) media, quantities, symbols and units

European Committee for Standardization (CEN)

prEN 410-1990 Glass in building; determination of light transmittance, solar direct transmittance, total solar energy transmittance, ultraviolet transmittance and related glazing characteristics

United States Navy

NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION

Danish Standards Foundation

DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods

CZ-CSN

CSN 64 0716-1959 vapor transmission