SH/T 1827-2019 in English

VALID

Plastics - Determination of crystallinity - X-ray diffractometry

Issued on:2019-12-24
Implemented on:2020-07-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $260.00
$253.00

Standard No:	SH/T 1827-2019
Document status:	VALID
Title in English:	Plastics - Determination of crystallinity - X-ray diffractometry
Title in Chinese:	塑料结晶度的测定 X射线衍射法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2019-12-24
Implemented on:	2020-07-01
Professional Classification:	SH-Petrochemical
Related Keywords:	x-ray diffraction intensity peak x-ray diffraction x-ray diffractometry introduction technical background x-ray equipment x-ray diffractometer
Related Topics:	x-ray diffraction x-ray diffraction group Crystallinity X-ray Diffraction Standards x-diffraction crystallization Ray standard Electron Diffraction Secondary Diffraction crystal diffraction Crystalline Diffraction Peak x-ray diffraction Crystalline Diffraction Peak Ray Diffraction crystal diffraction Diffraction peak intensity diffraction X-ray Diffraction+ Standard Diffraction peaks x-diffraction X-ray single crystal diffractometer Diffraction pattern crystal plane X-ray single crystal diffractometer Diffraction pattern Is X-ray Diffraction Safe? x-ray copper Ray Copper crystal X-ray diffraction intensity X-ray hardness tester Four-circle single crystal X-ray diffractometer Transmission Diffraction X-ray Diffraction Quantitative Analysis x-ray diffraction Diffraction peak intensity x-ray standard Diffraction crystallinity Four-circle single crystal diffractometer Diffraction method X-ray Diffraction Quantitative Analysis Electron diffraction brightness x-ray single crystal diffraction X-ray Diffraction of Crystals X-ray directional diffractometer xrd ray diffraction peaks Crystallinity? x-ray polycrystal diffraction Diffraction peaks Standard Diffraction of Silicon X-ray diffraction sample preparation Electron Diffraction Secondary Diffraction peak facet Crystallinity by X-ray Diffraction Crystallinity d8 single crystal diffractometer x-ray diffraction reverse single crystal diffractometer sample zero diffraction Single crystal diffractometer rod x+ ray diffraction x-ray wavelength x-ray diffraction particle size x diffraction peak Principles of X-ray Polycrystal Diffraction Crystalline concentration X-ray diffraction peak intensity crystal peak Why X-ray Diffraction X-ray Diffraction Screening x-ray sample Diffraction peak crystallinity Diffraction peak crystal form Relative Crystallinity and Crystallinity Measurement of Diffraction Curves single crystal x-ray analysis X-ray diffraction abroad Diffraction intensity How to Quantitatively Analyze X-ray Diffraction crystal plane peak crystallinity peak standard crystallinity X-ray Diffraction and Polycrystalline X-ray Diffraction plastic crystallization dish Single crystal x-ray diffractometer tens of thousands x-ray diffraction radiation x-ray diffraction x-ray diffraction How to Quantitatively Analyze X-ray Diffraction diffractometer single crystal What about the diffraction peaks for transmission? how to determine x-ray energy Crystallinity measurement How to use x-ray diffraction Diffraction intensity peak shape fitting Calculation of x-ray photometry Mini X-ray Diffraction X-ray diffraction analysis of crystal form Measuring Crystallinity crystallinity target diffractometer single crystal x-ray analysis crystallinity peak Crystalline X-ray Diffraction Ray Diffraction x-ray copper Ray Diffraction plastic crystallization dish X-ray diffraction peak at 27 degrees X-ray diffraction parameters X-ray diffraction peak width Derived x-ray diffraction and x-rays single crystal x-ray diffractometer Diffraction intensity Diffraction peaks of molybdenum X-ray diffraction area twin electron diffraction Electron Diffraction of Twins crystal face Crystallinity X-ray diffractometer target X-ray diffractometer angle X-ray diffractometry Diffraction and Transmission x-crystal diffractometer total crystallinity Amorphous diffraction Crystalline Peak Plastic xrd x-ray diffraction x-ray polycrystal diffraction twin electron diffraction Quantification by x-ray diffraction analysis How to Quantify by X-ray Diffraction x-ray k x-ray diffractometer, target Diffraction 45 degree peak Amorphous diffraction X-ray Diffraction Structural Analysis x-ray depth X-ray diffraction, X-ray fluorescence multi-level diffractive x-ray diffraction 3 X-ray Diffraction and X-ray Fluorescence second order diffraction x-ray diffraction x+ ray diffraction high power diffraction direct diffraction method X-ray single crystal diffractometer remote High Energy X-ray Diffraction Technique Novel X-ray Diffraction Diffraction in English x-ray products X-ray diffractometer target X-ray Diffraction Intermediate x-ray diffraction x-ray crystallography Intensity x-ray Automated X-ray Diffraction Diffraction of amorphous x-ray diffraction ray fluorescence X-ray single crystal diffractometer X-ray Diffraction Method How much crystallinity kx ray ray single crystal diffractometer Diffraction peak broadening Methods of Measuring Crystallinity non-diffractive surface portable x-ray diffraction xrd High Energy X-ray Diffraction Alloy x-ray diffraction Scattering peak Diffraction of x-rays x-ray diffractometer crystal X-ray crystallography Amorphous + Diffraction twinning, double diffraction x-diffraction + crystals x-ray diffraction crystallinity Transmission and Diffraction x-ray table Crystal X-ray diffractometer X-ray diffraction area semi-quantitative x-ray diffractometer Diffraction semi-quantitative x-crystal ray diffractometer Multiple diffraction peak intensity Diffraction Peak Grains Broadening of x-diffraction peaks Secondary Diffraction, Electron Diffraction Electron diffraction brightness Secondary Diffraction Diffraction Spot Neutron Diffraction Peaks X-ray crystallography X-ray diffractometer test peak crystallinity plastic x machine x-ray crystallography x-diffraction d2 X-ray diffraction-3 Crystalline X-ray Diffractionx relative crystallinity X-ray crystallography broad diffraction peaks High Energy X-ray Diffraction high energy diffraction transmission diffraction X-ray crystal diffraction curve Diffraction X-ray crystallography method twinning + electron diffraction x-ray diffraction peaks twin crystal diffraction degree of crystallinity x diffraction + crystallinity Determination of Polycrystals by X-ray Diffraction x-ray wavelength x-ray copper target short degree of crystallinity Shooting X-ray diffractometers and single crystals Applications of Secondary Diffraction Polycrystal Diffraction X-ray diffractometer semi-quantitative analysis peaks and crystals No crystallization at minus 20 degrees x-diffraction peak intensity Two-phase crystallinity Polycrystalline X-ray Diffraction Principles amorphous, diffractive Neutron Diffraction Technique Diffraction Ray Diffraction X-ray crystallographic analysis: X-ray diffraction equipment X-ray Diffraction Amorphous diffractive amorphous Diffraction point crystallinity rays Amorphous Diffraction 6 x-ray precision X-ray multi-crystal diffraction method crystallization peak Secondary Diffraction Transmission First-Order Diffraction and Multi-Order Diffraction of Crystals how crystallinity crystal plane peak x-diffraction + peak Principles of x-ray measurement Transmission Second Diffraction X diffraction diffracted x-rays X-ray diffraction grains Diffraction method diffractive pigment X-diffraction rays space x-ray X-ray single crystal diffractometer x-ray degree X+ Diffraction X-ray Diffraction Method electron diffraction twins x-ray diffraction diffracted rays space x-ray X+ ray single crystal diffractometer cobalt diffraction peak Angular X-ray Diffractometer ray angle intercrystalline diffraction slightly incident x-rays What does an x-ray diffractometer measure? Principles of High Energy Ray Diffraction crystallinity Scattering peak twin crystal diffraction Single crystal x-ray diffractometer analysis Diffraction X-ray crystallography What does an x-ray diffractometer measure? Intensity+x-ray Ray Diffraction Pattern What an x-ray diffractometer tests Near Field High Energy X-ray Diffraction plastic crystallization spin electron diffraction X-ray diffraction parameters X-ray diffraction intensity X-ray Diffraction Structural Analysis xrd ray diffraction Diffraction data Second order diffraction and first order diffraction X-ray Diffraction and Crystals x-ray diffraction size X-ray diffractometer small angle X-ray diffractometer test method Determination method of relative crystallinity electron diffraction twins Diffraction Scattering x-ray diffraction crystals Single crystal x-ray analysis Crystallinity+standard sample+ matter diffraction Secondary Diffraction of Crystals Out-of-Plane Diffraction In-Plane Diffraction Scattering and Diffraction Crystals in X-ray Diffraction Measurement of crystallinity x-ray diffraction half width determination of crystallinity x-ray Molybdenum diffraction peak X-ray diffraction amorphous peak Diffraction peaks of water How X-ray Diffraction Analyzes Phase Structure x-ray diffraction scan X-ray diffraction technique sample preparation xrd diffraction peak at 30 degrees x-ray peak determination Diffraction peaks of x-diffraction silicon Alloy Diffraction Peaks gold diffraction peaks Diffraction Broadening x-ray single crystal X-ray diffraction peak width Plastic Diffraction First Order Diffraction Second Order Diffraction x-diffraction crystallinity What kind of rays are used in x-ray diffraction X-ray Diffraction Analysis Crystal Orientation What is x-ray diffraction used for? Diffraction plate Diffraction peak intensity ratio Diffraction peaks of cobalt cobalt diffraction peak X-ray Diffraction Analysis Structure X diffractometer single crystal x-ray angle in situ diffraction How to quantitatively analyze x-ray diffractometer In crystal diffraction, why use x-rays Single crystal diffractometer and x-ray diffractometer Diffraction concept x-ray data X-ray diffraction peaks+ X-ray single crystal diffractometer and x-ray source of x-rays Diffraction 32 degree peak X-ray Diffraction Microscopic Diffraction peak position of silicon X-ray diffraction equipment Measuring Crystallinity peak shape fitting Specific rotation of crystal water Determination method and basis of crystallinity X-ray diffraction sample preparation volume X-ray diffraction peak position x-ray crystallinity analysis X-ray diffraction equipment Diffraction point Method for Measuring Crystallinity x-ray height x-ray diffraction peaks twinned half point Intensity of x-ray diffraction peaks Grain Diffraction Peak plastic crystallization dish plastic rays X-ray diffraction technique sample preparation X-ray material inspection Crystallinity and Relative Crystallinity secondary crystallization of plastic x-ray data Diffraction of waves modern x-ray polycrystal diffraction Twin Secondary Diffraction three-point diffraction Single crystal diffractometer How is x-diffraction quantified? x-ray peak intensity x-diffraction peak intensity Detection of Diffraction Peaks X-ray diffraction peak broadening X-ray Diffraction and Spectroscopy X-ray single crystal diffractometer and x-ray diffractometer Test method for rotational orientation of crystal materials by x-ray diffractometer Diffraction efficiency measurement x-ray sample X-ray diffraction lines specific rotation crystallinity Crystal X-ray Diffraction Method X-ray Diffraction Analysis Structure diffractometer x-ray diffraction and X-ray diffractometer angle X-ray crystallography x-ray target material amorphous plastic Ray polymer Diffraction line double diffraction method plastic crystallization X-ray Diffraction Analysis Principles of X-ray Diffraction Derived X-ray measurement principle hand-held x-diffraction X-ray diffraction peak broadening Diffraction of x-ray single crystals X-ray diffraction crystal form What does x-diffraction measure? speed of x-rays intensity of x-rays What does x-ray diffraction measure? Pigment X-ray Diffraction X-ray diffraction structure analysis The nature of diffraction Whole Rock X-ray Diffraction Whole-rock X-ray diffraction Rays Single Crystal X-ray Diffraction Analysis Crystalline plastic X-ray single crystal diffractometer composition Laue method x-ray diffraction Why X-ray diffraction can analyze crystal structure Factors affecting x-ray diffraction peaks Comparison between X-ray diffractometer and medical X-ray Can x-ray diffraction measure functional groups? What is the diffraction peak of silicon? xrd diffraction peak height pbt reduces crystallinity high pressure x-ray diffraction technology Crystallinity testing Standard diffractogram method Electron diffraction method to determine crystal structure Crystallinity of API Dust-free crystallinity Crystallinity test Polyethylene crystallinity Single crystal diffraction calibration method Calibration method of single crystal electron diffraction pattern Determination method of moisture crystallinity Single crystal diffraction analysis method sh/t3018-2019 sh/t3205-2019 Lens diffraction angle test method

本标准规定了用X射线衍射法测定聚乙烯（PE）和聚丙烯（PP）结晶度的方法。
本标准适用于颗粒或粉末状聚乙烯和聚丙烯（α晶型、β+α晶型）压塑或注塑试样结晶度的测定，不适用于填充聚乙烯和聚丙烯结晶度的测定。

Introduction

Technical background and scope of application of the standard

This standard was first published in 2019 and specifies a standardized method for determining the crystallinity of polyethylene (PE) and polypropylene (PP) by X-ray diffraction. It is applicable to the determination of the crystallinity of granular or powdered PE and PP (α crystal, β+α crystal) compression/injection molded specimens, and explicitly excludes the testing of filled and modified materials.

Core Test Principles

Based on the contribution ratio of the crystalline area in the X-ray diffraction intensity peak of partially crystalline polymers, the crystallinity X_c is calculated by the formula:

Parameter	Definition	Calculation Formula
F_ci	Crystal plane diffraction peak correction factor	(f_j²×L_p×T)^-1
k	Diffraction intensity correction coefficient	∑I_ci,cal/∑I_ci,total
F_ai	Amorphous peak correction factor	Isocrystalline plane factor calculation method

Key instrument configuration requirements

X-ray diffractometer must meet the metrological requirements of JJG 629-2014:

Copper target Kα radiation (λ=0.1542nm)
8-hour intensity stability ≤1.5%
Configured with rotating sample stage and Pearson VII peak separation software

Typical working conditions: scanning range 5°-35° (2θ), step size 0.01°-0.02°, tube voltage 20-50kV, tube current 20-50mA

Sample Preparation Specifications

Material Type	Preparation Standard	Sample Thickness
PE	GB/T 1845.2	1.0±0.1mm
PP	GB/T 2546.2	1.0±0.1mm

Note: The test surface must be mirror flat, without bends and mechanical impurities. The state adjustment should be carried out at 23±2℃ according to GB/T 2918.

Precision Verification Data

The verification results of 8 laboratories show:

Repeatability limit r: 0.6%-1.7% (crystallinity range 37.8%-81.2%)
Reproducibility limit R: 2.1%-5.9%

Implementation suggestions

1. Instrument calibration: Before each test, the intensity stability must be verified with α-SiO₂ or Si standard material

2. Peak separation: The Pearson VII function must be used to fit the crystalline/amorphous region peak shape, and pay attention to the difference in diffraction peaks between PE and PP

3. Safety protection: The operation of X-ray equipment must comply with radiation protection regulations, and the laboratory should be equipped with a dose monitoring device

More samples: DL/T 368-2010 GB 50021-2001(2009) GB 18306-2015

Sample only — not a preview of SH/T 1827-2019

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