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  1. HOME
  2. Standards for crystal

crystal

crystal, Total:341 items.

The international standard classification for "crystal" includes: Semiconducting materials , Other non-ferrous metals and their alloys , Other iron and steel products , Glass products , Testing of metals , Steels with special magnetic properties , Optoelectronics. Laser equipment , Non-destructive testing of metals , Thyristors , Optics and optical measurements , Materials for aluminium production , Non-metalliferous minerals , Measurement of electrical and magnetic quantities , Refractories , Testing of metals in general , Items of art and handicrafts , Piezoelectric and dielectric devices , Braking systems , Other methods of testing of metals , Chemical analysis of metals , Equipment for the metallurgical industry , Generalities. Terminology. Standardization. Documentation (Vocabularies) , Magnetic materials , Waxes, bituminous materials and other petroleum products , Aromatic hydrocarbons , Cadmium, cobalt and their alloys , Powder metallurgy , Salts , Watches , Mechanical testing of metals , Starch and derived products , Other products of non-ferrous metals , Clocks , Aluminium and aluminium alloys , Nuclear energy engineering , Phenols , Waterproofing , Aluminium products , Physicochemical methods of analysis , Rectifiers. Convertors. Stabilized power supply , Other organic chemicals , Other equipment related to power transmission and distribution networks , Electric furnaces , Abrasives , Ophthalmic equipment , Components and accessories for telecommunications equipment , Cryogenic vessels , Lead, zinc and tin products , Nuclear energy in general , Glass , Advanced ceramics , Road construction materials , Fiber and cables , Corrosion of metals , Materials for aerospace construction , Sugar. Sugar products. Starch , Flat steel products and semi-products , Aerospace electric equipment and systems .

The Chinese standard classification for "crystal" includes: Compound semiconductor material , Rare scattered metals and their alloys , Precision alloy , Industrial technical glass , Metal physical property test method , Elemental semiconductor material , Special electronic technology material , Semimetal and semiconductor material in general , Semimetal , Metal nondestructive testing method , Power semiconductor device and parts , Artificial lens , Other non-metal ore , Graphite material , Basic refractory , Artistic handicrafts , Quartz crystal and piezoelectric element , Other non-metal mine product , Metallographic testing method , Building material raw material ore , Ingot and blank casting equipment , Electrician alloy parts , High temperature alloy , Petroleum wax , Coal tar processed products , Rare refractory metals and their compounds , Powder metallurgy material and product , Quartz glass , Basic standards and general methods for chemical additive , Horology , Metal mechanical property test method , Other fermented goods , Metal chemical property test method , Rare metals and their alloys , Cutting tools , Light metals and their alloys , Material and component for instrument and meter , Optical Measurement , Roof and pavement waterproof and barrier material , Chemical additive , Semimetal and semiconductor material analysis method , General organic chemicals , Industrial electric heating equipment , Raw pharmaceutical material processing machinery and equipment , Grinding material and apparatus , Medical optical instrument and endoscope , Technical Management , Technical management , Technical management , Technical management , Technical management , Technical management , Petrochemical and chemical industry engineering , Other petroleum products , Heavy metals and their alloys , Nuclear detector , Special glass , Optical communication equipment , Special ceramics , Basic standards for aviation and aerospace materials , Metal casting and forging materials used for aviation and aerospace , Processed sugar , Other light industry machinery , Inorganic salt , Time and Frequency Measurement , Other power equipment , Steel sheet and strip , Electronic components , Catalyst .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Group Standards of the People's Republic of China

Professional Standard - Machinery

Professional Standard - Medicine

Professional Standard - Electron

  • SJ/T 10698-1996 Amorphous silicon reference solar cell
  • SJ 3245-1989 Methods for measuring dislocation of Indium phosphide single-crystal
  • SJ 3241-1989 Gallium arsenide single-crystal bar and wafer
  • SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
  • SJ 1852-1981 Terms for quartz crystal controlled oscillators
  • SJ/Z 9158-1987 Temperature control unit for quartz crystal elements
  • SJ 2592-1985 Quartz crystal monolithic filters for Type LSP10.7MA(～E)
  • SJ 3243-1989 Indium phosphide single-crystal bar and wafers
  • SJ 2816.4-1987 Detail specification for (resistance-welded) crystal holders (enclosures) for Type J3A
  • SJ 20607-1996 Specification for molybdenate crystal
  • SJ/T 11199-1999 Piezoelectric quartz crystal blank
  • SJ 20444-1994 Specification for Lithium Niobate singlecrystal
  • SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
  • SJ/Z 2655-1986 Collection of single crystal Germaninm defects
  • SJ 20640-1997 Specification indium antimonide single crystal slices for use in infrared detector
  • SJ 52138.1-1995 Crystal unit,quartz,type JA 538,detail specification for
  • SJ/Z 9155.2-1987 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • SJ/T 9570.3-1995 Quality grading standard for quartz crystal oscillators
  • SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
  • SJ/T 10173-1991 TDA75 single crystalline silicon solar cell
  • SJ/T 11199-2016 Piezoelectric quartz crystal sheet
  • SJ 20520-1995 Specification for Cadmium-Zine Telluride Slice for Mercury-Cadmium Telluride film
  • SJ 20606-1996 Specification for tellurium dioxide single crystal
  • SJ 3118-1988 Wafer holder
  • SJ/T 11505-2015 Sapphire single crystal polished wafers specification
  • SJ 20638-1997 Specification for liquid crystal materials for TFT-LCD
  • SJ/T 10639-1995 Quartz crystal unit terms
  • SJ/T 11509-2015 ITO etching solution for liquid crystal display
  • SJ 2154-1982 Miorocrystal glass substrates for use in thick film integrated circuits
  • SJ/T 11203-1999 Terms for liquid crystal materials
  • SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide

Professional Standard - Petrochemical Industry

Professional Standard - Grain

Professional Standard - Non-ferrous Metal

Hebei Provincial Standard of the People's Republic of China

Professional Standard - Building Materials

Professional Standard - Aviation

  • HB 5255-1983 Determination of Aluminum Alloy Intercrystalline Corrosion and Intergranular Corrosion Tendency
  • HB 20057-2011 Test methods for estimating grain size of superalloy investment castings
  • HB 7762-2005 Specification for master alloys directionally solidfied and single crystal superalloys for aeroengines
  • HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method

Professional Standard - Light Industry

Taiwan Provincial Standard of the People's Republic of China

Professional Standard - Chemical Industry

National Metrological Verification Regulations of the People's Republic of China

Shaanxi Provincial Standard of the People's Republic of China

Professional Standard - Ferrous Metallurgy

未注明发布机构

  • HB 7762-2016 Aerospace Engine Directional Solidification Column Crystal and Monocrystalline High-Temperature Alloy Ingots Specification

Fujian Provincial Standard of the People's Republic of China

  • DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)

Professional Standard - Geology

Hubei Provincial Standard of the People's Republic of China

Military Standard of the People's Republic of China-General Armament Department

Guangxi Provincial Standard of the People's Republic of China

Professional Standard - Education

  • JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer

Jiangsu Provincial Standard of the People's Republic of China

Professional Standard - Aerospace

  • QJ 3046-1998 Detailed Specifications of Z601 Voltage Controlled Crystal Oscillator
  • QJ 3047-1998 Detailed Specifications of Z602 Voltage Controlled Crystal Oscillator

Professional Standard-Ships

Professional Standard - Coal

  • MT 37-1980 Crystallization Aluminum Chloride Used for Investment Casting

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

Japanese Industrial Standards Committee (JISC)

  • JIS R 7651:2007 Measurement of lattice parameters and crystallite sizes of carbon materials
  • JIS C 6704:2009 Synthetic quartz crystal
  • JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods
  • JIS H 7004:1990 Glossary of terms used in amorphous metals

Association Francaise de Normalisation

German Institute for Standardization

  • DIN V VDE V 0126-18-3:2007-06 Solar wafers - Part 3: Alkaline corrosion damage of crystalline silicon wafers - Method of determining the corrosion rate of mono and multi crystalline silicon wafers (as cut)
  • DIN EN ISO 11979-10 A1 E:2013-06 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses

American Society for Testing and Materials (ASTM)

  • ASTM F47-94 Crystalline Silicon Crystal Defect Detection Method
  • ASTM F1726-02 Silicon Wafer Crystal Defect Analysis Guide

Ente Nazionale Italiano di Unificazione

Korean Agency for Technology and Standards (KATS)

American National Standards Institute （ANSI)

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