Crack Jingjing

Crack Jingjing, Total:167 items.

The international standard classification for "Crack Jingjing" includes: Semiconducting materials , Other non-ferrous metals and their alloys , Glass products , Other iron and steel products , Steels with special magnetic properties , Testing of metals , Materials for aluminium production , Non-metalliferous minerals , Thyristors , Insulating gases , Non-destructive testing of metals , Optics and optical measurements , Ophthalmic equipment , Electric furnaces , Aluminium products , Waxes, bituminous materials and other petroleum products , Essential oils , Pesticides and other agrochemicals .

The Chinese standard classification for "Crack Jingjing" includes: Compound semiconductor material , Rare scattered metals and their alloys , Industrial technical glass , Metal physical property test method , Precision alloy , Semimetal and semiconductor material in general , Semimetal , Elemental semiconductor material , Other non-metal ore , Power semiconductor device and parts , Building material raw material ore , Graphite material , Metal nondestructive testing method , Artificial lens , Medical optical instrument and endoscope , Raw pharmaceutical material processing machinery and equipment , Industrial electric heating equipment , Material and component for instrument and meter , Light metals and their alloys , Petroleum wax , Fragrances and flavors , Pesticide .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 12963-1996 Polycrystalline silicon
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 12962-2015 Monocrystalline silicon
GB/T 3519-2023 Cryptocrystalline graphite
GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display device
GB/T 15292-1994 Measuring methods for thyristor Reverse conducting triode thyristor
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 5238-1995 Monocrystalline germanium
GB/T 3519-1995 Amorphous graphite
GB/T 11072-1989 Indium antimonide polycrystal, single crystals and as-cut slices
GB/T 12963-2009 Specification for Polycrystalline Silicon
GB/T 29504-2013 300 mm monocrystalline silicon
GB/T 15713-1995 Monocrystalline germanium slices
GB/T 31958-2015 Substrate glass for thin film transistor liquid crystal display device
GB 9558-2001 Crystallo-dimethoate
GB/T 5238-2009e Monocrystalline germanium and monocrystalline germanium slices
GB/T 19345-2003 Amorphous and nanocrystalline soft magnetic alloy strips
GB/T 4291-1999 Synthetic cryolite
GB/T 31092-2014 Monocrystalline sapphire ingot
GB/T 19345.2-2017 Amorphous and nanocrystalline alloy - Part 2: Fe-based nanocrystalline soft magnetic alloy strips
GB/T 12962-1996 Monocrystalline silicon
GB/T 12962-2005 Monoccrystalline silicon
GB/T 3519-2008 Amorphous graphite
GB/T 5238-2009(英文版) Monocrystalline germanium and monocrystalline germanium slices
GB/T 31092-2022 Monocrystalline sapphire bar
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 3519-2008(英文版) Amorphous graphite
GB/T 19345.1-2017 Amorphous and nanocrystalline alloys―Part 1:Fe-based amorphous soft magnetic alloy strips
GB/T 4291-2007 Synthetic cryolite
GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices

Group Standards of the People's Republic of China

T/ZZB 1587-2020 Annealing and crystallizing furnace for glass-ceramics
T/QGCML 4513-2024 Technical requirements for high-performance wafer (ingot) production
T/ZSJSJJ 0004-2020 Crystal coffin
T/GZHG 008-2022 Microcrystalline Fertilizer
T/QGCML 1655-2023 Thin film transistor LCD
T/QGCML 803-2023 crystal bowl
T/CECA 48-2021 Quartz Crystal Microbalance Element
T/CBCSA 36-2021 Corundum polycrystalline slab
T/CAB 0180-2022 Measurement method for characteristic parameters of GAGG crystal and crystal array
T/ZZB 1908-2020 Crystal putty
T/ZZB 0514-2018 Optical Reflector Film for TFT-LCD Panel Display
T/ZZB 0497-2018 Single crystal wafers for surface acoustic wave device applications
T/YLNX 0003-2021 Purple Chinese jujubes
T/YWWJXH 0001-2021 Crystal Putty
T/QGCML 3210-2024 Specifications for the Education and Rehabilitation Assessment of Children with Special Needs

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals

National Metrological Verification Regulations of the People's Republic of China

JJG 28-2019 Verification Regulation of Optical Flats

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 4291-2017 Synthetic cryolite
GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal

未注明发布机构

SEMI M55-0308-2008 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON CARBIDE WAFERS
JIS R 7651:2024 Measurement of lattice parameters and crystallite sizes of carbon materials

Professional Standard - Medicine

YY 0290.10-2009 Intraocular lenses—Part 10:Phakic intraocular lenses
YY/T 0138-1993 Crystallizing machine
YY/T 0295.11-1997 Capsulotomy forceps

Professional Standard - Machinery

JB/T 7402-1994 Optical parallel
JB/T 9495.1-1999 Optical Crystals
JB/T 20068-2005 Crystallizing machine
JB/T 10439-2004 Crystal growing furnaces TDR-series crystal growing furnaces by Czochralski method
JB/T 20068-2015 Crystallizing machine
JB/T 7401-1994 Optical flat

Professional Standard - Non-ferrous Metal

YS/T 489-2005 Grain-refining aluminium ingots
YS/T 1648-2023 Crystal hafnium

Professional Standard - Electron

SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide

Shaanxi Provincial Standard of the People's Republic of China

DB61/T 383.1-2006 Crystal pear

Professional Standard - Petrochemical Industry

SH/T 0013-1999 Microcrystalline wax
SH/T 0013-2008 Microcrystalline wax

国家能源局

NB/SH/T 0013-2019 Microcrystalline wax

Professional Standard - Agriculture

ZB X 11014-1989 Soy Milk Crystal

Hebei Provincial Standard of the People's Republic of China

DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer

Professional Standard - Grain

LS/T 3216-1989 Soy Milk Crystal

Professional Standard - Light Industry

QB/T 1790-1993 crystal rose
QB/T 1790-2011 Rose crystals

Taiwan Provincial Standard of the People's Republic of China

CNS 1996-1978 Stannic Chloride, Crystal (Tin Tetraclrloride Crystals)

中华人民共和国国家质量监督检验检疫总局

GB/T 9558-2001 Crystallo-dimethoate

轻工业部

QB 1790-1993 crystal rose

Zhejiang Provincial Standard of the People's Republic of China

DB3309/T 42-2018 Crystal prawn balls

Professional Standard - Chemical Industry

HG/T 4357-2012 Polarizer for the Thin Film Transistor -Liquid Crystal Display (TFT-LCD)

未注明发布机构

SEMI M55-0308-2008 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON CARBIDE WAFERS
JIS R 7651:2024 Measurement of lattice parameters and crystallite sizes of carbon materials

British Standards Institution (BSI)

BS EN ISO 3378:2002 Leather. Physical and mechanical tests. Determination of resistance to grain cracking and grain crack index
BS EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
BS EN ISO 11979-7:2018 Ophthalmic implants. Intraocular lenses. Clinical investigations of intraocular lenses for the correction of aphakia
BS EN ISO 11979-7:2024 Ophthalmic implants. Intraocular lenses - Clinical investigations of intraocular lenses for the correction of aphakia

International Organization for Standardization (ISO)

ISO 3378:1975 Leather; Determination of resistance to grain cracking, and of crack index
IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods
PRF IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods

CZ-CSN

CSN 05 1141-1975 Te.sting of weld metal resistance to crystallization cracking
CSN 42 0463-1984 Steel. Method for estimating the grain size of austenite on fractures
CSN 42 4991-1970 Polycristallinic germanium
CSN 34 5911-1986 Polycrystalline silicion
CSN ON 70 4072-1966 crystal bowl
CSN 67 1322-1968 Blanc-?ixe powder
CSN 67 1322-1983 Blanc fixe in powder

Association Francaise de Normalisation

NF B30-004:1974 GLASS.CRYSTAL,CRYSTAL GLASS,CRYSTALLIN.
NF B30-004:2023 Cristal, cristallin et verre sonore
NF EN 120003:1992 Special framework specification: phototransistors, photodarlington transistors, phototransistor networks
NF C93-120-003*NF EN 120003:1992 Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays

American Welding Society (AWS)

WRC 122:1967(1976) A Review of Some Microstructural Aspects of Fracture in Crystalline Materials

American National Standards Institute （ANSI)

ANSI Z80.13-2007 Phakic Intraocular Lenses
ANSI/EIA 417-A:1991 Crystal Outlines

Korean Agency for Technology and Standards (KATS)

KS B 5241-1985 Optical flats
KS B 5241-2001 Optical flats
KS E 3801-1969 Crystalline Graphite
KS E 3801-1966 Crystalline Graphite
KS D 0069-2002 Method of determining the crystallization temperatures of amorphous metals
KS D 0069-2002(2022) Method of determining the crystallization temperatures of amorphous metals
KS E 3802-1974(2016) Amorphous graphite
KS D 0069-2022 Method of determining the crystallization temperatures of amorphous metals
KS B 5242-2001 Optical parallels
KS L 2403-2010 Crystal glass
KS E 3802-1975 Amorphous graphite
KS L 2403-1990 Crystal glass
KS E 3801-1969(2016) Crystalline Graphite
KS L 2403-2015(2020) Crystal glass
KS L 2403-2020 Crystal glass
KS E 3801-2021 Crystalline Graphite
KS L 2403-2015 Crystal glass
KS B 5242-1985 Optical parallels
KS E 3802-1974 Amorphous graphite
KS D 0069-2002(2017) Method of determining the crystallization temperatures of amorphous metals

WRC - Welding Research Council

BULLETIN 122-1967 A REVIEW OF SOME MICROSTRUCTURAL ASPECTS OF FRACTURE IN CRYSTALLINE MATERIALS

SCC

BS EN ISO 11979-10:2006+A1:2014 Ophthalmic implants. Intraocular lenses-Phakic intraocular lenses
ISO/IWA 43:2023 Glass types - Crystal glass, crystal and lead crystal - Specifications and test methods
ANSI Z80.13-2007(R2017) Ophthalmics - Phakic Intraocular Lenses
DANSK DS/EN ISO 11979-10/A1:2006 Ophthalmic implants – Intraocular lenses – Part 10: Phakic intraocular lenses
DANSK DS/EN 120003:2016 Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
AENOR UNE-EN ISO 11979-10:2007 Ophthalmic implants. Intraocular lenses. Part 10: Phakic intraocular lenses. (ISO 11979-10:2006)
NS-EN ISO 11979-10:2006 Ophthalmic implants — Intraocular lenses — Part 10: Phakic intraocular lenses (ISO 11979-10:2006)

AENOR

UNE 43603:1979 GLASS, NOMENCLATURE AND TERMINOLOGY. CRYSTAL. CRYSTAL GLASS

ES-UNE

UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)

UNKNOWN

YB 1602-83 Silicon single crystal
YB 1601-83 Silicon polycrystalline
YB 1601-1983 Silicon polycrystalline
YB 1602-1983 Silicon single crystal

RO-ASRO

STAS 9675-1974 CRYSTALLINE SILICON

U.S. Military Regulations and Norms

ARMY C-M-50 A INT AMD 1-1971 MALTED MILK
ARMY C-M-50 A-1966 MALTED MILK
ARMY MIL-PRF-55310/8 J-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 Hz THROUGH 50 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-PRF-55310/28 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, TTL

Japanese Industrial Standards Committee (JISC)

JIS K 8294:1995 Crystal violet
JIS H 7151:1991 Method of determining the crystallization temperatures of amorphous metals
JIS B 7431:1977 Optical parallels
JIS R 7651:2007 Measurement of lattice parameters and crystallite sizes of carbon materials

SE-SIS

SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays

GSO

GSO ISO 11979-10:2014 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses
BH GSO ISO 11979-10:2016 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses

PL-PKN

PN BN 6011-08-1965 Barite

Danish Standards Foundation

DS/EN ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses

International Electrotechnical Commission (IEC)

IEC PAS 62084:1998 Implementation of Flip Chip and Chip Scale technology

German Institute for Standardization

DIN EN 61747-3:2007-03 Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification (IEC 61747-3:2006); German version EN 61747-3:2006 / Note: DIN EN 61747-3 (2000-07) remains valid alongside this standard until 2009-09-01.*To be repl...
DIN EN 120003:1996 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
DIN EN 120003:1996-11 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992