GB/T 29504-2013 in English

VALID

300 mm monocrystalline silicon

Issued on:2013-05-09
Implemented on:2014-02-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $120.00
$117.00

Standard No:	GB/T 29504-2013
Document status:	VALID
Title in English:	300 mm monocrystalline silicon
Title in Chinese:	300mm 硅单晶
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2013-05-09
Implemented on:	2014-02-01
ICS Classification:	29.045-Semiconducting materials
Chinese Classification:	H82-Elemental semiconductor material
Professional Classification:	GB-National Standard
Related Keywords:	mm monocrystalline silicon scopethis standard mm silicon silicon technical requirements single crystal
Related Topics:	single crystal crystal Single crystal silicon inspection Detection of single crystal silicon crystallinity crystal Single crystal silicon inspection Single Crystal Foil Niobium tantalum single crystal silicon Crystal English Single crystal silicon peak How to detect single crystal silicon Polycrystalline vs Single Crystal Single crystal standard single crystal target single crystal iron Silicon crystallization peak polycrystalline and monocrystalline Single crystal angle head How to measure single crystal silicon single crystal + phase How about single crystal and polycrystalline single crystal iron Single Crystal Meter Liquid target single crystal molecular single crystal Measuring single crystal Crystal faces Crack Jingjing Crystalline silicon Crystal single crystal Liquid target single crystal Silicon Single Wafer Orienter Single Crystal Bit Silicon single crystal orientation Silicon single crystal single chain single crystal single crystal secondary crystallization Silicon crystal Crystalline silicon material Single Crystal+ Single Crystal Requirements Single crystal silicon target GBT29504 GB/T 29504-2013 National production of monocrystalline silicon Electronic silicon single crystal Monocrystalline silicon seed technology Monocrystalline silicon seed crystal Silicon single crystal seed crystal Monocrystalline Silicon International Single crystal silicon seed crystal standard project establishment Monocrystalline silicon quality Monocrystalline silicon product quality Monocrystalline silicon Japan Monocrystalline silicon crystal growth furnace Single crystal electrical properties Standard single crystal for single crystal instrument Silicon wafer

《GB/T 29504-2013300mm 硅单晶》由TC203（全国半导体设备和材料标准化技术委员会）归口，主管部门为国家标准化管理委员会。

Scope

This standard specifies the technical requirements, test methods, inspection rules, marking, packaging, transportation, storage, etc. This standard applies to silicon single crystals prepared by the Czochralski method, and is mainly used to produce 300 mm silicon single crystal polished wafers that meet the technical requirements of integrated circuit ICs with a line width of 0.13 µm or less.

More samples: GB 18306-2015 NB/T 47013.2-2015 JJG 21-2008

Sample only — not a preview of GB/T 29504-2013

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend

GB/T 26071-2026 in English

Monocrystalline silicon and wafers for solar cells
2026-01-28
GB/T 44334-2024 in English

Silicon epitaxial wafers with buried layers
2024-08-23
GB/T 26069-2022 in English

Annealed monocrystalline silicon wafers
2022-03-09
GB/T 6620-2009 in English

Test method for measuring warp on silicon slices by noncontact scanning
2009-10-30
GB/T 41325-2022 in English

Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit
2022-03-09