Monocrystalline silicon seed crystal
Monocrystalline silicon seed crystal, Total:22 items.
The international standard classification for "Monocrystalline silicon seed crystal" includes: Semiconducting materials .
The Chinese standard classification for "Monocrystalline silicon seed crystal" includes: Elemental semiconductor material .
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5092-2019 General Technical Requirements for Square Seed Crystals for Solar-Grade Monocrystalline Silicon Ingots
- DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer
Group Standards of the People's Republic of China
- T/ZSA 72-2019 Monocrystalline Silicon Carbide
- T/NXCL 31-2024 Conical seed crystals for Czochralski monocrystalline silicon growth
- T/ZZB 1389-2019 Monocrystalline silicon photovoltaic cells
- T/IAWBS 001-2021 Silicon carbide single crystal
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 12962-2015 Monocrystalline silicon
- GB/T 12964-2003 Monocrystalline silicon polished wafers
- GB/T 26069-2022 Annealed monocrystalline silicon wafers
- GB/T 29506-2013 300 mm polished monocrystalline silicon wafers
- GB/T 29504-2013 300 mm monocrystalline silicon
- GB/T 12964-2018 Monocrystalline silicon polished wafers
- GB/T 12962-1996 Monocrystalline silicon
- GB/T 12962-2005 Monoccrystalline silicon
Professional Standard - Non-ferrous Metal
- YS/T 1167-2016 Monocrystalline silicon etched wafers
Professional Standard - Electron
- SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
- SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
Professional Standard - Building Materials
- JC/T 2849-2024 Cerium-doped lutetium oxyorthosilicate single crystals
UNKNOWN
- YB 1602-83 Silicon single crystal
- YB 1602-1983 Silicon single crystal
Semiconductor Equipment and Materials International (SEMI)
- SEMI M55-0308-2008 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON CARBIDE WAFERS
Korean Agency for Technology and Standards (KATS)
- KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
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