single crystal
single crystal, Total:73 items.
The international standard classification for "single crystal" includes: Other non-ferrous metals and their alloys , Semiconducting materials , Cadmium, cobalt and their alloys , Insulating gases , Optics and optical measurements , Powder metallurgy , Testing of metals , Testing of metals in general , Copper products , Chemical analysis of metals , Electric furnaces , Abrasives , Non-destructive testing of metals , Other products of non-ferrous metals , Piezoelectric and dielectric devices , Advanced ceramics , Fiber and cables .
The Chinese standard classification for "single crystal" includes: Rare scattered metals and their alloys , Semimetal , Elemental semiconductor material , Compound semiconductor material , Rare refractory metals and their compounds , Semimetal and semiconductor material in general , Special electronic technology material , Optical Measurement , Quartz crystal and piezoelectric element , Metal physical property test method , Metallographic testing method , Heavy metals and their alloys , Rare metals and their alloys analysis method , Industrial electric heating equipment , Grinding material and apparatus , Metal nondestructive testing method , Technical management , Technical Management , Technical management , Special ceramics , Optical communication equipment .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 25075-2010 Gallium arsenide single crystal for solar cell
- GB/T 25076-2010 Monocrystalline silicon of solar cell
- GB/T 20229-2006 Gallium phosphide single crystal
- GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon
- GB/T 9532-2012 Designations for piezoelectric crystals
- GB/T 41751-2022 Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
- GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
- GB/T 5238-1995 Monocrystalline germanium
- GB/T 14843-1993 Lithium niobate single crystals
- GB/T 31092-2014 Monocrystalline sapphire ingot
- GB/T 29421-2012 Vanadate birefringent crystal devices
- GB/T 18032-2000 The inspecting method of AB microscopic defect in gallium arsenide single crystal
- GB/T 15713-1995 Monocrystalline germanium slices
- GB/T 31092-2022 Monocrystalline sapphire bar
- GB/T 11072-1989 Indium antimonide polycrystal, single crystals and as-cut slices
- GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices
- GB/T 29504-2013 300 mm monocrystalline silicon
- GB/T 30656-2014 Polished monocrystalline silicon carbide wafers
- GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices
- GB/T 20230-2006 Indium phosphide single crystal
- GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer
- GB/T 11094-1989 Boat-grown gallium arsenide single crystals and As-cut slices
- GB/T 26072-2010 Germanium single crystal for solar cell
- GB/T 13843-1992 monocrystalline sapphire substrates
- GB/T 12962-2005 Monoccrystalline silicon
- GB/T 20228-2006 Gallium arsenide single crystal
- GB/T 11093-2007 Liquid encapsulated czochralski-grown gallium arsenide single crystals and as-cut slices
- GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
- GB/T 5252-1985 Germanium monocrystal; Inspection of dislocation etch pit density
- GB/T 8760-1988 Gallium arsenide single crystal; Determination of dislocation density
- GB/T 26044-2010 Single crystal round copper wire and drawing stock for signal transmission
- GB/T 30858-2014 Polished mono-crystalline sapphire substrate product
- GB/T 29420-2012 Nd-doped vanadate laser crystal devices
- GB/T 11093-1989 Liquid encapaulated czochralski-grouwn gallium arsenide single crystals and As-cut slices
- GB/T 12632-1990 General specification of single silicon solar cells
- GB/T 5252-2006 Germanium monocrystal - inspection of dislocation etch pit density
Professional Standard - Machinery
- JB/T 5203-1991 Monocrystalline Fused Alumina - Method for Chemical Analysis
- JB/T 7996-1999 Common abrasive Single alundum
- JB/T 12068-2014 TDR-Z Germanium Mono-crystal Growing Furnace by Czochralski Method
- JB/T 5633-1991 Single-crystal furnace. Grading of energy consumption
- JB/T 10439-2004 Crystal growing furnaces TDR-series crystal growing furnaces by Czochralski method
- JB/T 7996-2012 Conventional abrasive - Monocrystalline fuesd alumina
Hebei Provincial Standard of the People's Republic of China
- DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer
- DB13/T 1828-2013 Solar grade monocrystalline silicon wafer
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 11094-2020 Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
- GB/T 5252-2020 Test method for dislocation density of monocrystal germanium
- GB/T 20229-2022 Gallium phosphide single crystal
- GB/T 20230-2022 Indium phosphide single crystal
- GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
- GB/T 20228-2021 Gallium arsenide single crystal
Professional Standard - Non-ferrous Metal
- YS 783-2012 The norm of energy consumption per unit productof infrared germanium single crystal
- YS/T 42-2010 Lithium tantalate single crystals
Professional Standard - Electron
- SJ/Z 2655-1986 Collection of single crystal Germaninm defects
- SJ/T 11505-2015 Sapphire single crystal polished wafers specification
- SJ 3245-1989 Methods for measuring dislocation of Indium phosphide single-crystal
- SJ 3241-1989 Gallium arsenide single-crystal bar and wafer
- SJ 20607-1996 Specification for molybdenate crystal
- SJ 20641-1997 Specification for indium antimonide single crystals for used in infrared detector
- SJ 20605-1996 Specification for lithium tantalate single crystal used in SAW devices
- SJ 20606-1996 Specification for tellurium dioxide single crystal
- SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
- SJ 20444-1994 Specification for Lithium Niobate singlecrystal
- SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
Group Standards of the People's Republic of China
- T/CSTM 00033-2020 Terms of optical inorganic single crystals for nuclear radiation detection
- T/ZZB 0497-2018 Single crystal wafers for surface acoustic wave device applications
- T/IAWBS 001-2021 Silicon carbide single crystal
Professional Standard - Light Industry
- QB/T 1173-1991 Monocrystal rock sugar
Inner Mongolia Provincial Standard of the People's Republic of China
- DB15/T 2234-2021 Energy consumption quota per unit product of Czochralski monocrystalline silicon
Professional Standard - Building Materials
- JC/T 2139-2012 High purity paratellurite single crystal for nuclear physics
- JC/T 1048-2007 Fused quartz crucibles for single crystal silicon growth
- JC/T 2025-2010 Lead magnesium niobate titanate (PMNT) piezoelectric single crystals
Shaanxi Provincial Standard of the People's Republic of China
- DB61/T 512-2011 Inspection rules for monocrystalline silicon wafers for solar cells
- DB61/T 511-2011 Inspection rules for monocrystalline silicon rods for solar cells
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